Assessment of Nonlinearities for Precision DACs
One may identify two independent sources of nonlinearities in digital-to-analog converters: (i) deviations at input sources and switches and (ii) nonidealities in the posterior summation circuit. The first are described by specific figures of merit, mainly integral nonlinearity and differential nonl...
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| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 2017-11, Vol.66 (11), p.2852-2857 |
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| container_title | IEEE transactions on instrumentation and measurement |
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| creator | Blanco-Murillo, Jose Luis Yague-Jimenez, Virginia Casajus-Quiros, Francisco Javier |
| description | One may identify two independent sources of nonlinearities in digital-to-analog converters: (i) deviations at input sources and switches and (ii) nonidealities in the posterior summation circuit. The first are described by specific figures of merit, mainly integral nonlinearity and differential nonlinearity; the second, in terms of standard amplifier performance (e.g., total harmonic distortion, and so on). Performance is assessed without considering prior separation of the two, resulting in misleading characterization. We address the cross influence of (i) and (ii), and propose a novel figure of merit for bandpass response that separately addresses nonlinear deviations and memory effects attending to DACs inner structure. |
| doi_str_mv | 10.1109/TIM.2017.2734019 |
| format | Article |
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The first are described by specific figures of merit, mainly integral nonlinearity and differential nonlinearity; the second, in terms of standard amplifier performance (e.g., total harmonic distortion, and so on). Performance is assessed without considering prior separation of the two, resulting in misleading characterization. We address the cross influence of (i) and (ii), and propose a novel figure of merit for bandpass response that separately addresses nonlinear deviations and memory effects attending to DACs inner structure.</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/TIM.2017.2734019</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Bandpass ; Digital to analog conversion ; Digital to analog converters ; Digital-analog conversion ; Digital-to-analog converter (DAC) ; Distortion ; Figure of merit ; generalized Hammerstein systems ; Harmonic distortion ; Linearity ; Logic gates ; Nonlinear response ; Nonlinearity ; performance evaluation ; Quantization (signal) ; Radio frequency ; Switches ; system testing</subject><ispartof>IEEE transactions on instrumentation and measurement, 2017-11, Vol.66 (11), p.2852-2857</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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The first are described by specific figures of merit, mainly integral nonlinearity and differential nonlinearity; the second, in terms of standard amplifier performance (e.g., total harmonic distortion, and so on). Performance is assessed without considering prior separation of the two, resulting in misleading characterization. We address the cross influence of (i) and (ii), and propose a novel figure of merit for bandpass response that separately addresses nonlinear deviations and memory effects attending to DACs inner structure.</description><subject>Bandpass</subject><subject>Digital to analog conversion</subject><subject>Digital to analog converters</subject><subject>Digital-analog conversion</subject><subject>Digital-to-analog converter (DAC)</subject><subject>Distortion</subject><subject>Figure of merit</subject><subject>generalized Hammerstein systems</subject><subject>Harmonic distortion</subject><subject>Linearity</subject><subject>Logic gates</subject><subject>Nonlinear response</subject><subject>Nonlinearity</subject><subject>performance evaluation</subject><subject>Quantization (signal)</subject><subject>Radio frequency</subject><subject>Switches</subject><subject>system testing</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE1rAjEQhkNpodb2XuhloefVmWST3RwX-yXYj4M9hxgnENFdm6yH_vtGlJ4Ghud9Z3gYu0eYIIKeLufvEw5YT3gtKkB9wUYoZV1qpfglGwFgU-pKqmt2k9IGAGpV1SM2bVOilHbUDUXvi4--24aObAxDoFT4PhZfkVxIoe-Kp3aWbtmVt9tEd-c5Zt8vz8vZW7n4fJ3P2kXphGiGErnXWle40g5F5fJPTjnvgdu1sCQ15wKkVJZQNt6uMivXKPOWPF85bsWYPZ5697H_OVAazKY_xC6fNJxzFLJWoDMFJ8rFPqVI3uxj2Nn4axDMUYvJWsxRizlryZGHUyQQ0T_eAApQWvwBxQBcNw</recordid><startdate>20171101</startdate><enddate>20171101</enddate><creator>Blanco-Murillo, Jose Luis</creator><creator>Yague-Jimenez, Virginia</creator><creator>Casajus-Quiros, Francisco Javier</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-1659-0140</orcidid></search><sort><creationdate>20171101</creationdate><title>Assessment of Nonlinearities for Precision DACs</title><author>Blanco-Murillo, Jose Luis ; Yague-Jimenez, Virginia ; Casajus-Quiros, Francisco Javier</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c338t-12f99941b9c134c273c6cff02ad3ae592230556ae158fab9995d15223ef2bc2a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Bandpass</topic><topic>Digital to analog conversion</topic><topic>Digital to analog converters</topic><topic>Digital-analog conversion</topic><topic>Digital-to-analog converter (DAC)</topic><topic>Distortion</topic><topic>Figure of merit</topic><topic>generalized Hammerstein systems</topic><topic>Harmonic distortion</topic><topic>Linearity</topic><topic>Logic gates</topic><topic>Nonlinear response</topic><topic>Nonlinearity</topic><topic>performance evaluation</topic><topic>Quantization (signal)</topic><topic>Radio frequency</topic><topic>Switches</topic><topic>system testing</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Blanco-Murillo, Jose Luis</creatorcontrib><creatorcontrib>Yague-Jimenez, Virginia</creatorcontrib><creatorcontrib>Casajus-Quiros, Francisco Javier</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Blanco-Murillo, Jose Luis</au><au>Yague-Jimenez, Virginia</au><au>Casajus-Quiros, Francisco Javier</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Assessment of Nonlinearities for Precision DACs</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>2017-11-01</date><risdate>2017</risdate><volume>66</volume><issue>11</issue><spage>2852</spage><epage>2857</epage><pages>2852-2857</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>One may identify two independent sources of nonlinearities in digital-to-analog converters: (i) deviations at input sources and switches and (ii) nonidealities in the posterior summation circuit. The first are described by specific figures of merit, mainly integral nonlinearity and differential nonlinearity; the second, in terms of standard amplifier performance (e.g., total harmonic distortion, and so on). Performance is assessed without considering prior separation of the two, resulting in misleading characterization. We address the cross influence of (i) and (ii), and propose a novel figure of merit for bandpass response that separately addresses nonlinear deviations and memory effects attending to DACs inner structure.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TIM.2017.2734019</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0003-1659-0140</orcidid></addata></record> |
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| ispartof | IEEE transactions on instrumentation and measurement, 2017-11, Vol.66 (11), p.2852-2857 |
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| subjects | Bandpass Digital to analog conversion Digital to analog converters Digital-analog conversion Digital-to-analog converter (DAC) Distortion Figure of merit generalized Hammerstein systems Harmonic distortion Linearity Logic gates Nonlinear response Nonlinearity performance evaluation Quantization (signal) Radio frequency Switches system testing |
| title | Assessment of Nonlinearities for Precision DACs |
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