Design of a New Microcontroller-Based Vernier Fringe Counter for Interferometric Measurement of Laser Wavelength
This paper presents a new electronic Vernier fringe counter for the wavelength measurement of a diode laser in a scanning interferometer. The system is intended to be a low cost alternative to commercial systems used for gauge block calibration. The counter stage and phase coincidence detector are m...
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| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 2016-02, Vol.65 (2), p.407-412 |
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| container_title | IEEE transactions on instrumentation and measurement |
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| creator | Diz-Bugarin, Javier Outumuro-Gonzalez, Ismael Vazquez-Dorrio, Jose Benito Valencia-Alvarez, Jose Luis Blanco-Garcia, Jesus |
| description | This paper presents a new electronic Vernier fringe counter for the wavelength measurement of a diode laser in a scanning interferometer. The system is intended to be a low cost alternative to commercial systems used for gauge block calibration. The counter stage and phase coincidence detector are made with a microcontroller and high-speed CMOS logic to achieve the required resolution. The microcontroller also can synchronize with other elements to make a fully automated measurement system. This electronic design improves the resolution of the electronic counters in the previous designs. |
| doi_str_mv | 10.1109/TIM.2015.2482258 |
| format | Article |
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This electronic design improves the resolution of the electronic counters in the previous designs.</description><subject>Detectors</subject><subject>Generators</subject><subject>Instrumentation</subject><subject>laser diodes</subject><subject>Microcontrollers</subject><subject>Optical interferometry</subject><subject>photodetectors</subject><subject>Prototypes</subject><subject>Radiation detectors</subject><subject>Wavelength measurement</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>ESBDL</sourceid><sourceid>RIE</sourceid><recordid>eNo9kEFPwzAMhSMEEmNwR-ISiXNHkjZNe4TBYNIGlwHHKE3dUbQlw2lB_HtSbeJkW3rv2f4IueRswjkrb1bz5UQwLiciK4SQxREZcSlVUua5OCYjxniRlJnMT8lZCJ-MMZVnakR29xDataO-oYY-ww9dtha99a5Dv9kAJncmQE3fAF0LSGfYujXQqe9dF8fGI50PXQPot9Bha-kSTOgRtuC6IXUR_UjfzTdswK27j3Ny0phNgItDHZPX2cNq-pQsXh7n09tFYjOWdklWyUJCLeqqtoorUQFAprKmNnVdFKW1YKzhZZqXJi2jUom8gkIyW9QpVAbSMbne5-7Qf_UQOv3pe3RxpeZKpimTTOZRxfaq-HQICI3eYbs1-Ks50wNXHbnqgas-cI2Wq72ljSf9y5WIoHOZ_gGLZHZc</recordid><startdate>20160201</startdate><enddate>20160201</enddate><creator>Diz-Bugarin, Javier</creator><creator>Outumuro-Gonzalez, Ismael</creator><creator>Vazquez-Dorrio, Jose Benito</creator><creator>Valencia-Alvarez, Jose Luis</creator><creator>Blanco-Garcia, Jesus</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| source | IEEE Electronic Library (IEL) |
| subjects | Detectors Generators Instrumentation laser diodes Microcontrollers Optical interferometry photodetectors Prototypes Radiation detectors Wavelength measurement |
| title | Design of a New Microcontroller-Based Vernier Fringe Counter for Interferometric Measurement of Laser Wavelength |
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