Characterization Method of Electric Field Probe by Using Transfer Standard in GTEM Cell
In this paper, we introduce a simple and wideband characterization method for electric field probes using a transfer standard. As a transfer standard, a thin disk-type reference probe that can operate from 50 to 1000 MHz is used and calibrated using a micro transverse electromagnetic (mu-TEM) cell....
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| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 2009-04, Vol.58 (4), p.1109-1113 |
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| container_issue | 4 |
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| container_title | IEEE transactions on instrumentation and measurement |
| container_volume | 58 |
| creator | Kang, No-Weon Kang, Jin-Seob Kim, Dae-Chan Kim, Jeong-Hwan Lee, Joo-Gwang |
| description | In this paper, we introduce a simple and wideband characterization method for electric field probes using a transfer standard. As a transfer standard, a thin disk-type reference probe that can operate from 50 to 1000 MHz is used and calibrated using a micro transverse electromagnetic (mu-TEM) cell. A gigahertz transverse electromagnetic (GTEM) cell is used to generate a reference electric field. It has been shown that the uncertainty of the proposed method can be increased due to the imperfection of the field condition in the cell. According to the measurement result, the proposed characterization method for the electric probes agrees within 6.3%, compared with the method that uses the TEM cell and standard antennas in a fully anechoic chamber. |
| doi_str_mv | 10.1109/TIM.2008.2008592 |
| format | Article |
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As a transfer standard, a thin disk-type reference probe that can operate from 50 to 1000 MHz is used and calibrated using a micro transverse electromagnetic (mu-TEM) cell. A gigahertz transverse electromagnetic (GTEM) cell is used to generate a reference electric field. It has been shown that the uncertainty of the proposed method can be increased due to the imperfection of the field condition in the cell. 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As a transfer standard, a thin disk-type reference probe that can operate from 50 to 1000 MHz is used and calibrated using a micro transverse electromagnetic (mu-TEM) cell. A gigahertz transverse electromagnetic (GTEM) cell is used to generate a reference electric field. It has been shown that the uncertainty of the proposed method can be increased due to the imperfection of the field condition in the cell. According to the measurement result, the proposed characterization method for the electric probes agrees within 6.3%, compared with the method that uses the TEM cell and standard antennas in a fully anechoic chamber.</description><subject>Anechoic chambers</subject><subject>Antenna measurements</subject><subject>Antennas</subject><subject>Broadband antennas</subject><subject>Calibration</subject><subject>Electric fields</subject><subject>Electric variables measurement</subject><subject>electromagnetic field</subject><subject>Electromagnetic fields</subject><subject>Instrumentation</subject><subject>measurement standard</subject><subject>Measurement standards</subject><subject>probe antenna</subject><subject>Probes</subject><subject>TEM cells</subject><subject>transfer standard</subject><subject>Transmission electron microscopy</subject><subject>Uncertainty</subject><subject>Wideband</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kb1PwzAQxS0EEqWwI7FYDDCl2PFHnBFFbanUCiRSMVqOY1NXaVLsdCh_PS5FDAwsd8P93undPQCuMRphjPKHcrYYpQiJ78Ly9AQMMGNZknOenoIBQlgkOWX8HFyEsEYIZZxmA_BWrJRXujfefaredS1cmH7V1bCzcNwY3Xun4cSZpoYvvqsMrPZwGVz7Dkuv2mCNh6-9amvla-haOC3HC1iYprkEZ1Y1wVz99CFYTsZl8ZTMn6ez4nGeaMJInyhNc15ZYo2mKVJCUEoJF7RSiolKWcstNvww4QRRy7BGVSUykaYYW8ZqMgT3x71b333sTOjlxgUdDajWdLsgBc8FxRjzSN79SxJKRfwPjuDtH3Dd7Xwbr5CCcZERmosIoSOkfReCN1Zuvdsov5cYyUMgMgYiD1nIn0Ci5OYoccaYX5xm0V3KyRcOn4Tf</recordid><startdate>20090401</startdate><enddate>20090401</enddate><creator>Kang, No-Weon</creator><creator>Kang, Jin-Seob</creator><creator>Kim, Dae-Chan</creator><creator>Kim, Jeong-Hwan</creator><creator>Lee, Joo-Gwang</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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As a transfer standard, a thin disk-type reference probe that can operate from 50 to 1000 MHz is used and calibrated using a micro transverse electromagnetic (mu-TEM) cell. A gigahertz transverse electromagnetic (GTEM) cell is used to generate a reference electric field. It has been shown that the uncertainty of the proposed method can be increased due to the imperfection of the field condition in the cell. According to the measurement result, the proposed characterization method for the electric probes agrees within 6.3%, compared with the method that uses the TEM cell and standard antennas in a fully anechoic chamber.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TIM.2008.2008592</doi><tpages>5</tpages></addata></record> |
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| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Anechoic chambers Antenna measurements Antennas Broadband antennas Calibration Electric fields Electric variables measurement electromagnetic field Electromagnetic fields Instrumentation measurement standard Measurement standards probe antenna Probes TEM cells transfer standard Transmission electron microscopy Uncertainty Wideband |
| title | Characterization Method of Electric Field Probe by Using Transfer Standard in GTEM Cell |
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