Hall-Probe Bench for Insertion-Device Characterization at LNLS
A 4.2-m-long Hall-probe bench was developed for high-precision magnetic characterization of insertion devices at the Brazilian Synchrotron Light Laboratory. In this paper, its mechanical and electrical features are described, as well as the procedures applied to improve accuracy and repeatability. T...
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| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 2007-12, Vol.56 (6), p.2725-2730 |
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| creator | Tosin, G. Citadini, J.F. Conforti, E. |
| description | A 4.2-m-long Hall-probe bench was developed for high-precision magnetic characterization of insertion devices at the Brazilian Synchrotron Light Laboratory. In this paper, its mechanical and electrical features are described, as well as the procedures applied to improve accuracy and repeatability. Tests used to establish measuring precision were performed in a 2-T planar wiggler, which is 2.8-m long, with periods of 180 mm. The obtained fields were integrated and compared with the rotating-coil measurements. |
| doi_str_mv | 10.1109/TIM.2007.908123 |
| format | Article |
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The obtained fields were integrated and compared with the rotating-coil measurements.</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/TIM.2007.908123</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Coils ; Hall effect devices ; Hall probes ; insertion devices (IDs) ; Intrusion detection ; Laboratories ; magnetic characterization ; Magnetic devices ; Magnetic field measurement ; magnetic-field measurements ; magnets ; Probes ; rotating coil ; sources of errors ; Synchrotrons ; Testing ; Undulators</subject><ispartof>IEEE transactions on instrumentation and measurement, 2007-12, Vol.56 (6), p.2725-2730</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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In this paper, its mechanical and electrical features are described, as well as the procedures applied to improve accuracy and repeatability. Tests used to establish measuring precision were performed in a 2-T planar wiggler, which is 2.8-m long, with periods of 180 mm. The obtained fields were integrated and compared with the rotating-coil measurements.</description><subject>Coils</subject><subject>Hall effect devices</subject><subject>Hall probes</subject><subject>insertion devices (IDs)</subject><subject>Intrusion detection</subject><subject>Laboratories</subject><subject>magnetic characterization</subject><subject>Magnetic devices</subject><subject>Magnetic field measurement</subject><subject>magnetic-field measurements</subject><subject>magnets</subject><subject>Probes</subject><subject>rotating coil</subject><subject>sources of errors</subject><subject>Synchrotrons</subject><subject>Testing</subject><subject>Undulators</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kEtLw0AUhQdRsFbXLtwE92nn_dgI2qotxAdY18Nkcoem1KTOpIL-elMiri4cvnMufAhdEjwhBJvpavk0oRiricGaUHaERkQIlRsp6TEaYUx0briQp-gspQ3uQcnVCN0s3Habv8a2hOwOGr_OQhuzZZMgdnXb5HP4qj1ks7WLzncQ6x93yDPXZcVz8XaOToLbJrj4u2P0_nC_mi3y4uVxObstck-17nImFZQYs4oHwzU3lJfUhYqqyivQGERFBZFBKSGhMrI0joGU2qkAgvtQsTG6HnZ3sf3cQ-rspt3Hpn9ptWRKS6FND00HyMc2pQjB7mL94eK3JdgeHNnekT04soOjvnE1NGoA-Kc504ZwxX4BHNxhKQ</recordid><startdate>20071201</startdate><enddate>20071201</enddate><creator>Tosin, G.</creator><creator>Citadini, J.F.</creator><creator>Conforti, E.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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In this paper, its mechanical and electrical features are described, as well as the procedures applied to improve accuracy and repeatability. Tests used to establish measuring precision were performed in a 2-T planar wiggler, which is 2.8-m long, with periods of 180 mm. The obtained fields were integrated and compared with the rotating-coil measurements.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TIM.2007.908123</doi><tpages>6</tpages></addata></record> |
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| source | IEEE Electronic Library (IEL) |
| subjects | Coils Hall effect devices Hall probes insertion devices (IDs) Intrusion detection Laboratories magnetic characterization Magnetic devices Magnetic field measurement magnetic-field measurements magnets Probes rotating coil sources of errors Synchrotrons Testing Undulators |
| title | Hall-Probe Bench for Insertion-Device Characterization at LNLS |
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