Joint Knowledge Graph and Large Language Model for Fault Diagnosis and Its Application in Aviation Assembly
In complex assembly industry settings, fault localization involves rapidly and accurately identifying the source of a fault and obtaining a troubleshooting solution based on fault symptoms. This study proposes a knowledge-enhanced joint model that incorporates aviation assembly knowledge graph (KG)...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on industrial informatics 2024-06, Vol.20 (6), p.8160-8169 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 8169 |
---|---|
container_issue | 6 |
container_start_page | 8160 |
container_title | IEEE transactions on industrial informatics |
container_volume | 20 |
creator | LIU, Peifeng Qian, Lu Zhao, Xingwei Tao, Bo |
description | In complex assembly industry settings, fault localization involves rapidly and accurately identifying the source of a fault and obtaining a troubleshooting solution based on fault symptoms. This study proposes a knowledge-enhanced joint model that incorporates aviation assembly knowledge graph (KG) embedding into large language models (LLMs). This model utilizes graph-structured Big Data within KGs to conduct prefix-tuning of the LLMs. The KGs for prefix-tuning enable an online reconfiguration of the LLMs, which avoids a massive computational load. Through the subgraph embedding learning process, the specialized knowledge of the joint model within the aviation assembly domain, especially in fault localization, is strengthened. In the context of aviation assembly functional testing, the joint model can generate knowledge subgraphs, fuse knowledge through retrieval augmentation, and ultimately provide knowledge-based reasoning responses. In practical industrial scenario experiments, the joint enhancement model demonstrates an accuracy of 98.5% for fault diagnosis and troubleshooting schemes. |
doi_str_mv | 10.1109/TII.2024.3366977 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TII_2024_3366977</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>10463190</ieee_id><sourcerecordid>3064715523</sourcerecordid><originalsourceid>FETCH-LOGICAL-c245t-db23d1e1d976f5d6493e346877f75340ea7d89ac9a29940fe686f37cdc6fa4d03</originalsourceid><addsrcrecordid>eNpNkDFPwzAQRiMEEqWwMzBYYk45x45dj1GhJRDEUubIjZ3iktrBTkD996SEgem-k953J70ousYwwxjE3TrPZwkkdEYIY4Lzk2iCBcUxQAqnQ05THJMEyHl0EcIOgHAgYhJ9PDljO_Rs3Xej1VajlZftO5JWoUL6YS-k3fZyCC9O6QbVzqOl7JsO3Ru5tS6Y8AvnXUBZ2zamkp1xFhmLsi8z5iwEvd80h8vorJZN0Fd_cxq9LR_Wi8e4eF3li6yIq4SmXaw2CVFYYyU4q1PFqCCaUDbnvOYpoaAlV3MhKyETISjUms1ZTXilKlZLqoBMo9vxbuvdZ69DV-5c7-3wsiTAKB9cJGSgYKQq70Lwui5bb_bSH0oM5VFpOSgtj0rLP6VD5WasGK31P5wyggWQHzT5chI</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3064715523</pqid></control><display><type>article</type><title>Joint Knowledge Graph and Large Language Model for Fault Diagnosis and Its Application in Aviation Assembly</title><source>IEEE Electronic Library (IEL)</source><creator>LIU, Peifeng ; Qian, Lu ; Zhao, Xingwei ; Tao, Bo</creator><creatorcontrib>LIU, Peifeng ; Qian, Lu ; Zhao, Xingwei ; Tao, Bo</creatorcontrib><description>In complex assembly industry settings, fault localization involves rapidly and accurately identifying the source of a fault and obtaining a troubleshooting solution based on fault symptoms. This study proposes a knowledge-enhanced joint model that incorporates aviation assembly knowledge graph (KG) embedding into large language models (LLMs). This model utilizes graph-structured Big Data within KGs to conduct prefix-tuning of the LLMs. The KGs for prefix-tuning enable an online reconfiguration of the LLMs, which avoids a massive computational load. Through the subgraph embedding learning process, the specialized knowledge of the joint model within the aviation assembly domain, especially in fault localization, is strengthened. In the context of aviation assembly functional testing, the joint model can generate knowledge subgraphs, fuse knowledge through retrieval augmentation, and ultimately provide knowledge-based reasoning responses. In practical industrial scenario experiments, the joint enhancement model demonstrates an accuracy of 98.5% for fault diagnosis and troubleshooting schemes.</description><identifier>ISSN: 1551-3203</identifier><identifier>EISSN: 1941-0050</identifier><identifier>DOI: 10.1109/TII.2024.3366977</identifier><identifier>CODEN: ITIICH</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Assembly ; Aviation ; Cognition ; Data-driven ; Embedding ; Fault diagnosis ; fault localization ; Fault location ; Functional testing ; Graph theory ; Hidden Markov models ; intelligent fault diagnosis ; Knowledge engineering ; knowledge graph (KG) ; Knowledge graphs ; Knowledge representation ; large language model (LLM) ; Large language models ; Reconfiguration ; Task analysis ; Training ; Troubleshooting ; Tuning</subject><ispartof>IEEE transactions on industrial informatics, 2024-06, Vol.20 (6), p.8160-8169</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2024</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c245t-db23d1e1d976f5d6493e346877f75340ea7d89ac9a29940fe686f37cdc6fa4d03</cites><orcidid>0000-0001-8477-7877 ; 0000-0002-4058-6128 ; 0000-0002-4568-6814 ; 0000-0001-5589-1662</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10463190$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10463190$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>LIU, Peifeng</creatorcontrib><creatorcontrib>Qian, Lu</creatorcontrib><creatorcontrib>Zhao, Xingwei</creatorcontrib><creatorcontrib>Tao, Bo</creatorcontrib><title>Joint Knowledge Graph and Large Language Model for Fault Diagnosis and Its Application in Aviation Assembly</title><title>IEEE transactions on industrial informatics</title><addtitle>TII</addtitle><description>In complex assembly industry settings, fault localization involves rapidly and accurately identifying the source of a fault and obtaining a troubleshooting solution based on fault symptoms. This study proposes a knowledge-enhanced joint model that incorporates aviation assembly knowledge graph (KG) embedding into large language models (LLMs). This model utilizes graph-structured Big Data within KGs to conduct prefix-tuning of the LLMs. The KGs for prefix-tuning enable an online reconfiguration of the LLMs, which avoids a massive computational load. Through the subgraph embedding learning process, the specialized knowledge of the joint model within the aviation assembly domain, especially in fault localization, is strengthened. In the context of aviation assembly functional testing, the joint model can generate knowledge subgraphs, fuse knowledge through retrieval augmentation, and ultimately provide knowledge-based reasoning responses. In practical industrial scenario experiments, the joint enhancement model demonstrates an accuracy of 98.5% for fault diagnosis and troubleshooting schemes.</description><subject>Assembly</subject><subject>Aviation</subject><subject>Cognition</subject><subject>Data-driven</subject><subject>Embedding</subject><subject>Fault diagnosis</subject><subject>fault localization</subject><subject>Fault location</subject><subject>Functional testing</subject><subject>Graph theory</subject><subject>Hidden Markov models</subject><subject>intelligent fault diagnosis</subject><subject>Knowledge engineering</subject><subject>knowledge graph (KG)</subject><subject>Knowledge graphs</subject><subject>Knowledge representation</subject><subject>large language model (LLM)</subject><subject>Large language models</subject><subject>Reconfiguration</subject><subject>Task analysis</subject><subject>Training</subject><subject>Troubleshooting</subject><subject>Tuning</subject><issn>1551-3203</issn><issn>1941-0050</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkDFPwzAQRiMEEqWwMzBYYk45x45dj1GhJRDEUubIjZ3iktrBTkD996SEgem-k953J70ousYwwxjE3TrPZwkkdEYIY4Lzk2iCBcUxQAqnQ05THJMEyHl0EcIOgHAgYhJ9PDljO_Rs3Xej1VajlZftO5JWoUL6YS-k3fZyCC9O6QbVzqOl7JsO3Ru5tS6Y8AvnXUBZ2zamkp1xFhmLsi8z5iwEvd80h8vorJZN0Fd_cxq9LR_Wi8e4eF3li6yIq4SmXaw2CVFYYyU4q1PFqCCaUDbnvOYpoaAlV3MhKyETISjUms1ZTXilKlZLqoBMo9vxbuvdZ69DV-5c7-3wsiTAKB9cJGSgYKQq70Lwui5bb_bSH0oM5VFpOSgtj0rLP6VD5WasGK31P5wyggWQHzT5chI</recordid><startdate>20240601</startdate><enddate>20240601</enddate><creator>LIU, Peifeng</creator><creator>Qian, Lu</creator><creator>Zhao, Xingwei</creator><creator>Tao, Bo</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><orcidid>https://orcid.org/0000-0001-8477-7877</orcidid><orcidid>https://orcid.org/0000-0002-4058-6128</orcidid><orcidid>https://orcid.org/0000-0002-4568-6814</orcidid><orcidid>https://orcid.org/0000-0001-5589-1662</orcidid></search><sort><creationdate>20240601</creationdate><title>Joint Knowledge Graph and Large Language Model for Fault Diagnosis and Its Application in Aviation Assembly</title><author>LIU, Peifeng ; Qian, Lu ; Zhao, Xingwei ; Tao, Bo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c245t-db23d1e1d976f5d6493e346877f75340ea7d89ac9a29940fe686f37cdc6fa4d03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Assembly</topic><topic>Aviation</topic><topic>Cognition</topic><topic>Data-driven</topic><topic>Embedding</topic><topic>Fault diagnosis</topic><topic>fault localization</topic><topic>Fault location</topic><topic>Functional testing</topic><topic>Graph theory</topic><topic>Hidden Markov models</topic><topic>intelligent fault diagnosis</topic><topic>Knowledge engineering</topic><topic>knowledge graph (KG)</topic><topic>Knowledge graphs</topic><topic>Knowledge representation</topic><topic>large language model (LLM)</topic><topic>Large language models</topic><topic>Reconfiguration</topic><topic>Task analysis</topic><topic>Training</topic><topic>Troubleshooting</topic><topic>Tuning</topic><toplevel>online_resources</toplevel><creatorcontrib>LIU, Peifeng</creatorcontrib><creatorcontrib>Qian, Lu</creatorcontrib><creatorcontrib>Zhao, Xingwei</creatorcontrib><creatorcontrib>Tao, Bo</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>IEEE transactions on industrial informatics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LIU, Peifeng</au><au>Qian, Lu</au><au>Zhao, Xingwei</au><au>Tao, Bo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Joint Knowledge Graph and Large Language Model for Fault Diagnosis and Its Application in Aviation Assembly</atitle><jtitle>IEEE transactions on industrial informatics</jtitle><stitle>TII</stitle><date>2024-06-01</date><risdate>2024</risdate><volume>20</volume><issue>6</issue><spage>8160</spage><epage>8169</epage><pages>8160-8169</pages><issn>1551-3203</issn><eissn>1941-0050</eissn><coden>ITIICH</coden><abstract>In complex assembly industry settings, fault localization involves rapidly and accurately identifying the source of a fault and obtaining a troubleshooting solution based on fault symptoms. This study proposes a knowledge-enhanced joint model that incorporates aviation assembly knowledge graph (KG) embedding into large language models (LLMs). This model utilizes graph-structured Big Data within KGs to conduct prefix-tuning of the LLMs. The KGs for prefix-tuning enable an online reconfiguration of the LLMs, which avoids a massive computational load. Through the subgraph embedding learning process, the specialized knowledge of the joint model within the aviation assembly domain, especially in fault localization, is strengthened. In the context of aviation assembly functional testing, the joint model can generate knowledge subgraphs, fuse knowledge through retrieval augmentation, and ultimately provide knowledge-based reasoning responses. In practical industrial scenario experiments, the joint enhancement model demonstrates an accuracy of 98.5% for fault diagnosis and troubleshooting schemes.</abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/TII.2024.3366977</doi><tpages>10</tpages><orcidid>https://orcid.org/0000-0001-8477-7877</orcidid><orcidid>https://orcid.org/0000-0002-4058-6128</orcidid><orcidid>https://orcid.org/0000-0002-4568-6814</orcidid><orcidid>https://orcid.org/0000-0001-5589-1662</orcidid></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1551-3203 |
ispartof | IEEE transactions on industrial informatics, 2024-06, Vol.20 (6), p.8160-8169 |
issn | 1551-3203 1941-0050 |
language | eng |
recordid | cdi_crossref_primary_10_1109_TII_2024_3366977 |
source | IEEE Electronic Library (IEL) |
subjects | Assembly Aviation Cognition Data-driven Embedding Fault diagnosis fault localization Fault location Functional testing Graph theory Hidden Markov models intelligent fault diagnosis Knowledge engineering knowledge graph (KG) Knowledge graphs Knowledge representation large language model (LLM) Large language models Reconfiguration Task analysis Training Troubleshooting Tuning |
title | Joint Knowledge Graph and Large Language Model for Fault Diagnosis and Its Application in Aviation Assembly |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-21T16%3A51%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Joint%20Knowledge%20Graph%20and%20Large%20Language%20Model%20for%20Fault%20Diagnosis%20and%20Its%20Application%20in%20Aviation%20Assembly&rft.jtitle=IEEE%20transactions%20on%20industrial%20informatics&rft.au=LIU,%20Peifeng&rft.date=2024-06-01&rft.volume=20&rft.issue=6&rft.spage=8160&rft.epage=8169&rft.pages=8160-8169&rft.issn=1551-3203&rft.eissn=1941-0050&rft.coden=ITIICH&rft_id=info:doi/10.1109/TII.2024.3366977&rft_dat=%3Cproquest_RIE%3E3064715523%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=3064715523&rft_id=info:pmid/&rft_ieee_id=10463190&rfr_iscdi=true |