Bivariate Lifetime Model for Organic Light-Emitting Diodes
Despite advantages of organic light-emitting diode (OLED) displays over liquid crystal displays, reliability concerns persist. These concerns must be addressed before OLED displays are widely adopted. In particular, existing methods are unable to reliably estimate the lifetime of large OLED displays...
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on industrial electronics (1982) 2017-03, Vol.64 (3), p.2325-2334 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 2334 |
|---|---|
| container_issue | 3 |
| container_start_page | 2325 |
| container_title | IEEE transactions on industrial electronics (1982) |
| container_volume | 64 |
| creator | Kim, Dae Whan Oh, Hyunseok Youn, Byeng Dong Kwon, Dongil |
| description | Despite advantages of organic light-emitting diode (OLED) displays over liquid crystal displays, reliability concerns persist. These concerns must be addressed before OLED displays are widely adopted. In particular, existing methods are unable to reliably estimate the lifetime of large OLED displays (i.e., displays of 55 in or larger). This study proposes a novel model that incorporates physical and statistical uncertainty to estimate the lifetime of large OLED panels under normal usage conditions. A likelihood-ratio-based validation method is presented to determine the validity of the calculated model parameters. A bivariate acceleration model with two critical factors-temperature and luminance-is presented. The lifespan predicted by the proposed lifetime model shows a good agreement with the experimental results. |
| doi_str_mv | 10.1109/TIE.2016.2623584 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TIE_2016_2623584</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>7728062</ieee_id><sourcerecordid>1868427163</sourcerecordid><originalsourceid>FETCH-LOGICAL-c291t-428dccfdd8cdb3f7d022faab27f904da42f865ec9ee1735a8c93b93184daf6483</originalsourceid><addsrcrecordid>eNo9kEtPAjEUhRujiYjuTdxM4nrGvh_uFFFJMGxw3ZQ-sAQYbIuJ_94SiKu7ON85N_kAuEWwQwiqh_lk3GGIeIc5JkzSMzBAjIlWKSrPwQBiIVsIKb8EVzmvIESUITYAj8_xx6Roim-mMfgSN7756J1fN6FPzSwtzTbaGi2_SjvexFLidtm8xErka3ARzDr7m9Mdgs_X8Xz03k5nb5PR07S1WKHSUiydtcE5ad2CBOEgxsGYBRZBQeoMxUFy5q3yHgnCjLSKLBRBsmaBU0mG4P64u0v9997nolf9Pm3rS40klxQLxEml4JGyqc85-aB3KW5M-tUI6oMhXQ3pgyF9MlQrd8dK9N7_40JgCSvxBxqOYSU</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1868427163</pqid></control><display><type>article</type><title>Bivariate Lifetime Model for Organic Light-Emitting Diodes</title><source>IEEE Electronic Library (IEL)</source><creator>Kim, Dae Whan ; Oh, Hyunseok ; Youn, Byeng Dong ; Kwon, Dongil</creator><creatorcontrib>Kim, Dae Whan ; Oh, Hyunseok ; Youn, Byeng Dong ; Kwon, Dongil</creatorcontrib><description>Despite advantages of organic light-emitting diode (OLED) displays over liquid crystal displays, reliability concerns persist. These concerns must be addressed before OLED displays are widely adopted. In particular, existing methods are unable to reliably estimate the lifetime of large OLED displays (i.e., displays of 55 in or larger). This study proposes a novel model that incorporates physical and statistical uncertainty to estimate the lifetime of large OLED panels under normal usage conditions. A likelihood-ratio-based validation method is presented to determine the validity of the calculated model parameters. A bivariate acceleration model with two critical factors-temperature and luminance-is presented. The lifespan predicted by the proposed lifetime model shows a good agreement with the experimental results.</description><identifier>ISSN: 0278-0046</identifier><identifier>EISSN: 1557-9948</identifier><identifier>DOI: 10.1109/TIE.2016.2623584</identifier><identifier>CODEN: ITIED6</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Acceleration ; Acceleration factor (AF) ; Bivariate analysis ; Degradation ; Life (durability) ; Life estimation ; lifetime model ; Liquid crystal displays ; Organic light emitting diodes ; organic light-emitting diodes (OLEDs) ; Temperature ; Thin film transistors ; Uncertainty</subject><ispartof>IEEE transactions on industrial electronics (1982), 2017-03, Vol.64 (3), p.2325-2334</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2017</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c291t-428dccfdd8cdb3f7d022faab27f904da42f865ec9ee1735a8c93b93184daf6483</citedby><cites>FETCH-LOGICAL-c291t-428dccfdd8cdb3f7d022faab27f904da42f865ec9ee1735a8c93b93184daf6483</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7728062$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7728062$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kim, Dae Whan</creatorcontrib><creatorcontrib>Oh, Hyunseok</creatorcontrib><creatorcontrib>Youn, Byeng Dong</creatorcontrib><creatorcontrib>Kwon, Dongil</creatorcontrib><title>Bivariate Lifetime Model for Organic Light-Emitting Diodes</title><title>IEEE transactions on industrial electronics (1982)</title><addtitle>TIE</addtitle><description>Despite advantages of organic light-emitting diode (OLED) displays over liquid crystal displays, reliability concerns persist. These concerns must be addressed before OLED displays are widely adopted. In particular, existing methods are unable to reliably estimate the lifetime of large OLED displays (i.e., displays of 55 in or larger). This study proposes a novel model that incorporates physical and statistical uncertainty to estimate the lifetime of large OLED panels under normal usage conditions. A likelihood-ratio-based validation method is presented to determine the validity of the calculated model parameters. A bivariate acceleration model with two critical factors-temperature and luminance-is presented. The lifespan predicted by the proposed lifetime model shows a good agreement with the experimental results.</description><subject>Acceleration</subject><subject>Acceleration factor (AF)</subject><subject>Bivariate analysis</subject><subject>Degradation</subject><subject>Life (durability)</subject><subject>Life estimation</subject><subject>lifetime model</subject><subject>Liquid crystal displays</subject><subject>Organic light emitting diodes</subject><subject>organic light-emitting diodes (OLEDs)</subject><subject>Temperature</subject><subject>Thin film transistors</subject><subject>Uncertainty</subject><issn>0278-0046</issn><issn>1557-9948</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kEtPAjEUhRujiYjuTdxM4nrGvh_uFFFJMGxw3ZQ-sAQYbIuJ_94SiKu7ON85N_kAuEWwQwiqh_lk3GGIeIc5JkzSMzBAjIlWKSrPwQBiIVsIKb8EVzmvIESUITYAj8_xx6Roim-mMfgSN7756J1fN6FPzSwtzTbaGi2_SjvexFLidtm8xErka3ARzDr7m9Mdgs_X8Xz03k5nb5PR07S1WKHSUiydtcE5ad2CBOEgxsGYBRZBQeoMxUFy5q3yHgnCjLSKLBRBsmaBU0mG4P64u0v9997nolf9Pm3rS40klxQLxEml4JGyqc85-aB3KW5M-tUI6oMhXQ3pgyF9MlQrd8dK9N7_40JgCSvxBxqOYSU</recordid><startdate>201703</startdate><enddate>201703</enddate><creator>Kim, Dae Whan</creator><creator>Oh, Hyunseok</creator><creator>Youn, Byeng Dong</creator><creator>Kwon, Dongil</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>201703</creationdate><title>Bivariate Lifetime Model for Organic Light-Emitting Diodes</title><author>Kim, Dae Whan ; Oh, Hyunseok ; Youn, Byeng Dong ; Kwon, Dongil</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c291t-428dccfdd8cdb3f7d022faab27f904da42f865ec9ee1735a8c93b93184daf6483</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Acceleration</topic><topic>Acceleration factor (AF)</topic><topic>Bivariate analysis</topic><topic>Degradation</topic><topic>Life (durability)</topic><topic>Life estimation</topic><topic>lifetime model</topic><topic>Liquid crystal displays</topic><topic>Organic light emitting diodes</topic><topic>organic light-emitting diodes (OLEDs)</topic><topic>Temperature</topic><topic>Thin film transistors</topic><topic>Uncertainty</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kim, Dae Whan</creatorcontrib><creatorcontrib>Oh, Hyunseok</creatorcontrib><creatorcontrib>Youn, Byeng Dong</creatorcontrib><creatorcontrib>Kwon, Dongil</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998–Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on industrial electronics (1982)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kim, Dae Whan</au><au>Oh, Hyunseok</au><au>Youn, Byeng Dong</au><au>Kwon, Dongil</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Bivariate Lifetime Model for Organic Light-Emitting Diodes</atitle><jtitle>IEEE transactions on industrial electronics (1982)</jtitle><stitle>TIE</stitle><date>2017-03</date><risdate>2017</risdate><volume>64</volume><issue>3</issue><spage>2325</spage><epage>2334</epage><pages>2325-2334</pages><issn>0278-0046</issn><eissn>1557-9948</eissn><coden>ITIED6</coden><abstract>Despite advantages of organic light-emitting diode (OLED) displays over liquid crystal displays, reliability concerns persist. These concerns must be addressed before OLED displays are widely adopted. In particular, existing methods are unable to reliably estimate the lifetime of large OLED displays (i.e., displays of 55 in or larger). This study proposes a novel model that incorporates physical and statistical uncertainty to estimate the lifetime of large OLED panels under normal usage conditions. A likelihood-ratio-based validation method is presented to determine the validity of the calculated model parameters. A bivariate acceleration model with two critical factors-temperature and luminance-is presented. The lifespan predicted by the proposed lifetime model shows a good agreement with the experimental results.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TIE.2016.2623584</doi><tpages>10</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0278-0046 |
| ispartof | IEEE transactions on industrial electronics (1982), 2017-03, Vol.64 (3), p.2325-2334 |
| issn | 0278-0046 1557-9948 |
| language | eng |
| recordid | cdi_crossref_primary_10_1109_TIE_2016_2623584 |
| source | IEEE Electronic Library (IEL) |
| subjects | Acceleration Acceleration factor (AF) Bivariate analysis Degradation Life (durability) Life estimation lifetime model Liquid crystal displays Organic light emitting diodes organic light-emitting diodes (OLEDs) Temperature Thin film transistors Uncertainty |
| title | Bivariate Lifetime Model for Organic Light-Emitting Diodes |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T14%3A06%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Bivariate%20Lifetime%20Model%20for%20Organic%20Light-Emitting%20Diodes&rft.jtitle=IEEE%20transactions%20on%20industrial%20electronics%20(1982)&rft.au=Kim,%20Dae%20Whan&rft.date=2017-03&rft.volume=64&rft.issue=3&rft.spage=2325&rft.epage=2334&rft.pages=2325-2334&rft.issn=0278-0046&rft.eissn=1557-9948&rft.coden=ITIED6&rft_id=info:doi/10.1109/TIE.2016.2623584&rft_dat=%3Cproquest_RIE%3E1868427163%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1868427163&rft_id=info:pmid/&rft_ieee_id=7728062&rfr_iscdi=true |