Investigations Into Unintended ESD Generator Artifacts: Prepulse and Postpulse
An electrostatic discharge (ESD) generator may create pre- and postpulses in addition to the main pulse. These artifacts can cause additional device under test (DUT) failures. The origin and magnitude of these pulses were investigated in four commercial generators using measurements and simulation....
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on electromagnetic compatibility 2021-12, Vol.63 (6), p.1791-1798 |
|---|---|
| Hauptverfasser: | , , , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 1798 |
|---|---|
| container_issue | 6 |
| container_start_page | 1791 |
| container_title | IEEE transactions on electromagnetic compatibility |
| container_volume | 63 |
| creator | Zhou, Jianchi Wei, Pengyu Shen, Li Yan, Xin Maghlakelidze, Giorgi Notermans, Guido Bub, Sergej Holland, Steffen Pommerenke, David |
| description | An electrostatic discharge (ESD) generator may create pre- and postpulses in addition to the main pulse. These artifacts can cause additional device under test (DUT) failures. The origin and magnitude of these pulses were investigated in four commercial generators using measurements and simulation. Two types of unwanted pulses were identified. One is caused by the reignition of the spark, and the other relates to the relay contacting for charging the main capacitor. These pulses cause strong high-frequency signals, partially surpassing the radio frequency content of the main pulse. The spectrum of the pre- and postpulses varies greatly between different generators. These differences and the fact that some DUTs may react to the pre- or postpulse instead of the main pulse lead to repeatability problems between test sites. The other artifact that has been investigated is the leakage current in contact discharge mode. The charge accumulated on the gun tip by the leakage current can contribute to a short (few nanoseconds) fast-rising pulse ( |
| doi_str_mv | 10.1109/TEMC.2021.3079899 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TEMC_2021_3079899</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>9473035</ieee_id><sourcerecordid>2610171644</sourcerecordid><originalsourceid>FETCH-LOGICAL-c288t-a19b850df8881f22717b810f95c2632ed29f3b07a6436302a9b2563fd4cfad0b3</originalsourceid><addsrcrecordid>eNo9kEFLAzEUhIMoWKs_QLwEPG_NSzabxJvUWgtVC7bgLWR3E9miSU1SwX_v1hZPw8DMPN6H0CWQEQBRN8vJ03hECYURI0JJpY7QADiXBUjxdowGhIAsFBP8FJ2ltO5tySkboOeZ_7Ypd-8md8EnPPM54JXvfLa-tS2evN7jqfU2mhwivou5c6bJ6RYvot1sP5LFxrd4EVL-c-foxJleLw46RKuHyXL8WMxfprPx3bxoqJS5MKBqyUnrpJTgKBUgagnEKd7QilHbUuVYTYSpSlYxQo2qKa-Ya8vGmZbUbIiu97ubGL62_QN6HbbR9yc1rYCAgKos-xTsU00MKUXr9CZ2nyb-aCB6h03vsOkdNn3A1neu9p3OWvufV6VghHH2Cyc4aIA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2610171644</pqid></control><display><type>article</type><title>Investigations Into Unintended ESD Generator Artifacts: Prepulse and Postpulse</title><source>IEEE Electronic Library (IEL)</source><creator>Zhou, Jianchi ; Wei, Pengyu ; Shen, Li ; Yan, Xin ; Maghlakelidze, Giorgi ; Notermans, Guido ; Bub, Sergej ; Holland, Steffen ; Pommerenke, David</creator><creatorcontrib>Zhou, Jianchi ; Wei, Pengyu ; Shen, Li ; Yan, Xin ; Maghlakelidze, Giorgi ; Notermans, Guido ; Bub, Sergej ; Holland, Steffen ; Pommerenke, David</creatorcontrib><description>An electrostatic discharge (ESD) generator may create pre- and postpulses in addition to the main pulse. These artifacts can cause additional device under test (DUT) failures. The origin and magnitude of these pulses were investigated in four commercial generators using measurements and simulation. Two types of unwanted pulses were identified. One is caused by the reignition of the spark, and the other relates to the relay contacting for charging the main capacitor. These pulses cause strong high-frequency signals, partially surpassing the radio frequency content of the main pulse. The spectrum of the pre- and postpulses varies greatly between different generators. These differences and the fact that some DUTs may react to the pre- or postpulse instead of the main pulse lead to repeatability problems between test sites. The other artifact that has been investigated is the leakage current in contact discharge mode. The charge accumulated on the gun tip by the leakage current can contribute to a short (few nanoseconds) fast-rising pulse (<500 ps) that occurs the moment the tip is contacted, thus, before the main pulse in contact mode.</description><identifier>ISSN: 0018-9375</identifier><identifier>EISSN: 1558-187X</identifier><identifier>DOI: 10.1109/TEMC.2021.3079899</identifier><identifier>CODEN: IEMCAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>electromagnetic (EM) noise ; Electromagnetic interference ; Electrostatic discharge ; Electrostatic discharges ; Generators ; Ignition ; Investigations ; Leakage current ; Leakage currents ; measurements ; Static electricity</subject><ispartof>IEEE transactions on electromagnetic compatibility, 2021-12, Vol.63 (6), p.1791-1798</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c288t-a19b850df8881f22717b810f95c2632ed29f3b07a6436302a9b2563fd4cfad0b3</cites><orcidid>0000-0003-2871-1616 ; 0000-0002-0649-8159 ; 0000-0001-8595-5209 ; 0000-0003-1865-4996</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9473035$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9473035$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Zhou, Jianchi</creatorcontrib><creatorcontrib>Wei, Pengyu</creatorcontrib><creatorcontrib>Shen, Li</creatorcontrib><creatorcontrib>Yan, Xin</creatorcontrib><creatorcontrib>Maghlakelidze, Giorgi</creatorcontrib><creatorcontrib>Notermans, Guido</creatorcontrib><creatorcontrib>Bub, Sergej</creatorcontrib><creatorcontrib>Holland, Steffen</creatorcontrib><creatorcontrib>Pommerenke, David</creatorcontrib><title>Investigations Into Unintended ESD Generator Artifacts: Prepulse and Postpulse</title><title>IEEE transactions on electromagnetic compatibility</title><addtitle>TEMC</addtitle><description>An electrostatic discharge (ESD) generator may create pre- and postpulses in addition to the main pulse. These artifacts can cause additional device under test (DUT) failures. The origin and magnitude of these pulses were investigated in four commercial generators using measurements and simulation. Two types of unwanted pulses were identified. One is caused by the reignition of the spark, and the other relates to the relay contacting for charging the main capacitor. These pulses cause strong high-frequency signals, partially surpassing the radio frequency content of the main pulse. The spectrum of the pre- and postpulses varies greatly between different generators. These differences and the fact that some DUTs may react to the pre- or postpulse instead of the main pulse lead to repeatability problems between test sites. The other artifact that has been investigated is the leakage current in contact discharge mode. The charge accumulated on the gun tip by the leakage current can contribute to a short (few nanoseconds) fast-rising pulse (<500 ps) that occurs the moment the tip is contacted, thus, before the main pulse in contact mode.</description><subject>electromagnetic (EM) noise</subject><subject>Electromagnetic interference</subject><subject>Electrostatic discharge</subject><subject>Electrostatic discharges</subject><subject>Generators</subject><subject>Ignition</subject><subject>Investigations</subject><subject>Leakage current</subject><subject>Leakage currents</subject><subject>measurements</subject><subject>Static electricity</subject><issn>0018-9375</issn><issn>1558-187X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kEFLAzEUhIMoWKs_QLwEPG_NSzabxJvUWgtVC7bgLWR3E9miSU1SwX_v1hZPw8DMPN6H0CWQEQBRN8vJ03hECYURI0JJpY7QADiXBUjxdowGhIAsFBP8FJ2ltO5tySkboOeZ_7Ypd-8md8EnPPM54JXvfLa-tS2evN7jqfU2mhwivou5c6bJ6RYvot1sP5LFxrd4EVL-c-foxJleLw46RKuHyXL8WMxfprPx3bxoqJS5MKBqyUnrpJTgKBUgagnEKd7QilHbUuVYTYSpSlYxQo2qKa-Ya8vGmZbUbIiu97ubGL62_QN6HbbR9yc1rYCAgKos-xTsU00MKUXr9CZ2nyb-aCB6h03vsOkdNn3A1neu9p3OWvufV6VghHH2Cyc4aIA</recordid><startdate>20211201</startdate><enddate>20211201</enddate><creator>Zhou, Jianchi</creator><creator>Wei, Pengyu</creator><creator>Shen, Li</creator><creator>Yan, Xin</creator><creator>Maghlakelidze, Giorgi</creator><creator>Notermans, Guido</creator><creator>Bub, Sergej</creator><creator>Holland, Steffen</creator><creator>Pommerenke, David</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-2871-1616</orcidid><orcidid>https://orcid.org/0000-0002-0649-8159</orcidid><orcidid>https://orcid.org/0000-0001-8595-5209</orcidid><orcidid>https://orcid.org/0000-0003-1865-4996</orcidid></search><sort><creationdate>20211201</creationdate><title>Investigations Into Unintended ESD Generator Artifacts: Prepulse and Postpulse</title><author>Zhou, Jianchi ; Wei, Pengyu ; Shen, Li ; Yan, Xin ; Maghlakelidze, Giorgi ; Notermans, Guido ; Bub, Sergej ; Holland, Steffen ; Pommerenke, David</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c288t-a19b850df8881f22717b810f95c2632ed29f3b07a6436302a9b2563fd4cfad0b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>electromagnetic (EM) noise</topic><topic>Electromagnetic interference</topic><topic>Electrostatic discharge</topic><topic>Electrostatic discharges</topic><topic>Generators</topic><topic>Ignition</topic><topic>Investigations</topic><topic>Leakage current</topic><topic>Leakage currents</topic><topic>measurements</topic><topic>Static electricity</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhou, Jianchi</creatorcontrib><creatorcontrib>Wei, Pengyu</creatorcontrib><creatorcontrib>Shen, Li</creatorcontrib><creatorcontrib>Yan, Xin</creatorcontrib><creatorcontrib>Maghlakelidze, Giorgi</creatorcontrib><creatorcontrib>Notermans, Guido</creatorcontrib><creatorcontrib>Bub, Sergej</creatorcontrib><creatorcontrib>Holland, Steffen</creatorcontrib><creatorcontrib>Pommerenke, David</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electromagnetic compatibility</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Zhou, Jianchi</au><au>Wei, Pengyu</au><au>Shen, Li</au><au>Yan, Xin</au><au>Maghlakelidze, Giorgi</au><au>Notermans, Guido</au><au>Bub, Sergej</au><au>Holland, Steffen</au><au>Pommerenke, David</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Investigations Into Unintended ESD Generator Artifacts: Prepulse and Postpulse</atitle><jtitle>IEEE transactions on electromagnetic compatibility</jtitle><stitle>TEMC</stitle><date>2021-12-01</date><risdate>2021</risdate><volume>63</volume><issue>6</issue><spage>1791</spage><epage>1798</epage><pages>1791-1798</pages><issn>0018-9375</issn><eissn>1558-187X</eissn><coden>IEMCAE</coden><abstract>An electrostatic discharge (ESD) generator may create pre- and postpulses in addition to the main pulse. These artifacts can cause additional device under test (DUT) failures. The origin and magnitude of these pulses were investigated in four commercial generators using measurements and simulation. Two types of unwanted pulses were identified. One is caused by the reignition of the spark, and the other relates to the relay contacting for charging the main capacitor. These pulses cause strong high-frequency signals, partially surpassing the radio frequency content of the main pulse. The spectrum of the pre- and postpulses varies greatly between different generators. These differences and the fact that some DUTs may react to the pre- or postpulse instead of the main pulse lead to repeatability problems between test sites. The other artifact that has been investigated is the leakage current in contact discharge mode. The charge accumulated on the gun tip by the leakage current can contribute to a short (few nanoseconds) fast-rising pulse (<500 ps) that occurs the moment the tip is contacted, thus, before the main pulse in contact mode.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TEMC.2021.3079899</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0003-2871-1616</orcidid><orcidid>https://orcid.org/0000-0002-0649-8159</orcidid><orcidid>https://orcid.org/0000-0001-8595-5209</orcidid><orcidid>https://orcid.org/0000-0003-1865-4996</orcidid><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0018-9375 |
| ispartof | IEEE transactions on electromagnetic compatibility, 2021-12, Vol.63 (6), p.1791-1798 |
| issn | 0018-9375 1558-187X |
| language | eng |
| recordid | cdi_crossref_primary_10_1109_TEMC_2021_3079899 |
| source | IEEE Electronic Library (IEL) |
| subjects | electromagnetic (EM) noise Electromagnetic interference Electrostatic discharge Electrostatic discharges Generators Ignition Investigations Leakage current Leakage currents measurements Static electricity |
| title | Investigations Into Unintended ESD Generator Artifacts: Prepulse and Postpulse |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T17%3A39%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Investigations%20Into%20Unintended%20ESD%20Generator%20Artifacts:%20Prepulse%20and%20Postpulse&rft.jtitle=IEEE%20transactions%20on%20electromagnetic%20compatibility&rft.au=Zhou,%20Jianchi&rft.date=2021-12-01&rft.volume=63&rft.issue=6&rft.spage=1791&rft.epage=1798&rft.pages=1791-1798&rft.issn=0018-9375&rft.eissn=1558-187X&rft.coden=IEMCAE&rft_id=info:doi/10.1109/TEMC.2021.3079899&rft_dat=%3Cproquest_RIE%3E2610171644%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2610171644&rft_id=info:pmid/&rft_ieee_id=9473035&rfr_iscdi=true |