First Principles Codes and Analysis Environments for Vacuum Electronics Simulation
The status of first principles modeling and simulation tools for vacuum electronics (VEs) is presented. These tools, when combined with parametric beam-wave interaction tools, comprise the suite of tools that enable the design and optimization of VE devices, such as RF amplifiers. Although many basi...
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Veröffentlicht in: | IEEE transactions on electron devices 2023-06, Vol.70 (6), p.2666-2679 |
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creator | Petillo, John J. Cooke, Simon J. Antonsen, Thomas M. Ovtchinnikov, Serguei G. Jensen, Aaron J. Nelson, Eric M. Jensen, Kevin L. Levush, Baruch |
description | The status of first principles modeling and simulation tools for vacuum electronics (VEs) is presented. These tools, when combined with parametric beam-wave interaction tools, comprise the suite of tools that enable the design and optimization of VE devices, such as RF amplifiers. Although many basic algorithms discussed in the article have been around for decades, the advances in electromagnetic and electrostatic particle-in-cell and meshless beam codes have revolutionized the VE device development process where first-pass design has become the standard. These include advances in emission physics, disparate-mesh geometry resolution, advanced boundary conditions, intercode operability, multimodule simulation pipelines, exploitation of computer hardware, optimization and sensitivity analysis, and advanced user simulation environments with multimodule pipelines. The article presents these advances. |
doi_str_mv | 10.1109/TED.2023.3236910 |
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These tools, when combined with parametric beam-wave interaction tools, comprise the suite of tools that enable the design and optimization of VE devices, such as RF amplifiers. Although many basic algorithms discussed in the article have been around for decades, the advances in electromagnetic and electrostatic particle-in-cell and meshless beam codes have revolutionized the VE device development process where first-pass design has become the standard. These include advances in emission physics, disparate-mesh geometry resolution, advanced boundary conditions, intercode operability, multimodule simulation pipelines, exploitation of computer hardware, optimization and sensitivity analysis, and advanced user simulation environments with multimodule pipelines. The article presents these advances.</description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/TED.2023.3236910</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Algorithms ; Beam optics ; Boundary conditions ; Codes ; Computational modeling ; Design optimization ; Design standards ; electron emission ; Electronics ; electrostatic (ES) codes ; Finite element analysis ; Finite element method ; finite-difference ; finite-element ; First principles ; first-principles electromagnetic (EM) codes ; gun code ; Mathematical models ; particle-in-cell (PIC) ; Pipelines ; Sensitivity analysis ; Simulation ; Solid modeling ; Steady-state ; Time-domain analysis ; user environments ; vacuum electronics (VEs) device modeling and simulation ; Wave interaction</subject><ispartof>IEEE transactions on electron devices, 2023-06, Vol.70 (6), p.2666-2679</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2023</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c292t-e421d19a99917c9a4b18526c9d3d394a626dddaabafc0a88277c1bf4e018d2383</citedby><cites>FETCH-LOGICAL-c292t-e421d19a99917c9a4b18526c9d3d394a626dddaabafc0a88277c1bf4e018d2383</cites><orcidid>0000-0001-5199-5712 ; 0000-0002-4019-7560 ; 0000-0002-1409-6651</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10026656$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10026656$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Petillo, John J.</creatorcontrib><creatorcontrib>Cooke, Simon J.</creatorcontrib><creatorcontrib>Antonsen, Thomas M.</creatorcontrib><creatorcontrib>Ovtchinnikov, Serguei G.</creatorcontrib><creatorcontrib>Jensen, Aaron J.</creatorcontrib><creatorcontrib>Nelson, Eric M.</creatorcontrib><creatorcontrib>Jensen, Kevin L.</creatorcontrib><creatorcontrib>Levush, Baruch</creatorcontrib><title>First Principles Codes and Analysis Environments for Vacuum Electronics Simulation</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>The status of first principles modeling and simulation tools for vacuum electronics (VEs) is presented. These tools, when combined with parametric beam-wave interaction tools, comprise the suite of tools that enable the design and optimization of VE devices, such as RF amplifiers. Although many basic algorithms discussed in the article have been around for decades, the advances in electromagnetic and electrostatic particle-in-cell and meshless beam codes have revolutionized the VE device development process where first-pass design has become the standard. These include advances in emission physics, disparate-mesh geometry resolution, advanced boundary conditions, intercode operability, multimodule simulation pipelines, exploitation of computer hardware, optimization and sensitivity analysis, and advanced user simulation environments with multimodule pipelines. The article presents these advances.</description><subject>Algorithms</subject><subject>Beam optics</subject><subject>Boundary conditions</subject><subject>Codes</subject><subject>Computational modeling</subject><subject>Design optimization</subject><subject>Design standards</subject><subject>electron emission</subject><subject>Electronics</subject><subject>electrostatic (ES) codes</subject><subject>Finite element analysis</subject><subject>Finite element method</subject><subject>finite-difference</subject><subject>finite-element</subject><subject>First principles</subject><subject>first-principles electromagnetic (EM) codes</subject><subject>gun code</subject><subject>Mathematical models</subject><subject>particle-in-cell (PIC)</subject><subject>Pipelines</subject><subject>Sensitivity analysis</subject><subject>Simulation</subject><subject>Solid modeling</subject><subject>Steady-state</subject><subject>Time-domain analysis</subject><subject>user environments</subject><subject>vacuum electronics (VEs) device modeling and simulation</subject><subject>Wave interaction</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkM1LAzEQxYMoWKt3Dx4Cnrfma7M7x1K3KhQUrV5DmmQhZT9qsiv0v29Ke_AywzDvDfN-CN1TMqOUwNO6ep4xwviMMy6Bkgs0oXleZCCFvEQTQmiZAS_5NbqJcZtGKQSboM-lD3HAH8F3xu8aF_Git6nqzuJ5p5t99BFX3Z8Pfde6boi47gP-0WYcW1w1zgxp4U3EX74dGz34vrtFV7Vuors79yn6XlbrxWu2en95W8xXmWHAhswJRi0FDQC0MKDFhpY5kwYstxyElkxaa7Xe6NoQXZasKAzd1MKlJJalJFP0eLq7C_3v6OKgtv0Y0s9RsZKCAGAFJBU5qUzoYwyuVrvgWx32ihJ1JKcSOXUkp87kkuXhZPHOuX9ywqTMJT8AIKlqWA</recordid><startdate>20230601</startdate><enddate>20230601</enddate><creator>Petillo, John J.</creator><creator>Cooke, Simon J.</creator><creator>Antonsen, Thomas M.</creator><creator>Ovtchinnikov, Serguei G.</creator><creator>Jensen, Aaron J.</creator><creator>Nelson, Eric M.</creator><creator>Jensen, Kevin L.</creator><creator>Levush, Baruch</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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These tools, when combined with parametric beam-wave interaction tools, comprise the suite of tools that enable the design and optimization of VE devices, such as RF amplifiers. Although many basic algorithms discussed in the article have been around for decades, the advances in electromagnetic and electrostatic particle-in-cell and meshless beam codes have revolutionized the VE device development process where first-pass design has become the standard. These include advances in emission physics, disparate-mesh geometry resolution, advanced boundary conditions, intercode operability, multimodule simulation pipelines, exploitation of computer hardware, optimization and sensitivity analysis, and advanced user simulation environments with multimodule pipelines. 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subjects | Algorithms Beam optics Boundary conditions Codes Computational modeling Design optimization Design standards electron emission Electronics electrostatic (ES) codes Finite element analysis Finite element method finite-difference finite-element First principles first-principles electromagnetic (EM) codes gun code Mathematical models particle-in-cell (PIC) Pipelines Sensitivity analysis Simulation Solid modeling Steady-state Time-domain analysis user environments vacuum electronics (VEs) device modeling and simulation Wave interaction |
title | First Principles Codes and Analysis Environments for Vacuum Electronics Simulation |
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