Self-Excitation Thresholds in RF Structures

Self-Excitation Thresholds in RF Structures

A theory and general method for calculating self-excitation thresholds for a large class of standing and traveling-wave structures used in amplifiers, klystrons, traveling-wave tubes, and other vacuum electronic devices (VED) is presented. One determines the circuit parameters of RF structures that...

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Veröffentlicht in:IEEE transactions on electron devices 2022-05, Vol.69 (5), p.2611-2617
Hauptverfasser: Jabotinski, Vadim, Chernyavskiy, Igor A., Vlasov, Alexander N., Antonsen, Thomas M., Levush, Baruch
Format: Artikel
Sprache:eng
Schlagworte:
Admittance
Circuit parameter matrix
Circuit stability
Circuits
dynamical system
electron beam
Electron beams
Electron tubes
Electronic devices
Klystrons
Mathematical models
multiport network
Radio frequency
RF structure
Self excitation
stability
Stability analysis
Stability criteria
Structural stability
Thermal stability
Thresholds
Transmission line matrix methods
Traveling wave tubes
Traveling waves
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Beschreibung
Zusammenfassung:A theory and general method for calculating self-excitation thresholds for a large class of standing and traveling-wave structures used in amplifiers, klystrons, traveling-wave tubes, and other vacuum electronic devices (VED) is presented. One determines the circuit parameters of RF structures that are changed due to the presence of electron beam and analyze the stability of the obtained matrices. New determinant equations defined by such stability matrices are derived in a general form applicable to any RF structure and as an important special case for RF structures with electron beams. The theory and computational methods described here are essential for stability analysis of RF structures and VED.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2022.3156970