Unified Mechanism for Graphene FET's Electrothermal Breakdown and Its Implications on Safe Operating Limits
Unique electrothermal properties of graphene and the chemical nature of its degradation present a compelling set of conditions for the exploration of its breakdown at different time scales. In this work, we give a phenomenological description of graphene's electrical breakdown ranging from a no...
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on electron devices 2021-05, Vol.68 (5), p.2530-2537 |
|---|---|
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 2537 |
|---|---|
| container_issue | 5 |
| container_start_page | 2530 |
| container_title | IEEE transactions on electron devices |
| container_volume | 68 |
| creator | Mishra, Abhishek Meersha, Adil Kranthi, N. K. Kumar, Jeevesh Bellamkonda, N. S. Veenadhari Variar, Harsha B. Shrivastava, Mayank |
| description | Unique electrothermal properties of graphene and the chemical nature of its degradation present a compelling set of conditions for the exploration of its breakdown at different time scales. In this work, we give a phenomenological description of graphene's electrical breakdown ranging from a nonequilibrium (transient) electrothermal state to far-equilibrium state while spanning a time scale from few nanoseconds to few minutes. The intricate roles of Pauli-blocked states, intraband heating, and mechanism of degradation in defining a safe operating area (SOA) have been explored. The time and field evolution of defects, resulting in defect-by-defect breakdown, have been studied using Raman spectroscopy. The unified mechanism of breakdown discussed here provides a basic understanding of reliability of graphene-based devices under high-current and/or high-field conditions as well as degradation due to its prolonged operation. |
| doi_str_mv | 10.1109/TED.2021.3068081 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TED_2021_3068081</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>9393503</ieee_id><sourcerecordid>2517038456</sourcerecordid><originalsourceid>FETCH-LOGICAL-c291t-34778ba907242c64459b6071db31b9e01bf82b152ff776af6312c56dd7b52a73</originalsourceid><addsrcrecordid>eNo9kL1PwzAQxS0EEqWwI7FYYmBK8UdsxyOUUioVdaDMlpPY1G1iBzsV4r8nVSum053ee_f0A-AWownGSD6uZy8TggieUMQLVOAzMMKMiUzynJ-DEUK4yCQt6CW4Smk7rDzPyQjsPr2zztTw3VQb7V1qoQ0RzqPuNsYb-DpbPyQ4a0zVx9BvTGx1A5-j0bs6_HiofQ0XfYKLtmtcpXsXfILBww9tDVx1Jg4n_wWXrnV9ugYXVjfJ3JzmGKyH-OlbtlzNF9OnZVYRifuM5kIUpZZIkJxUQ00mS44ErkuKS2kQLm1BSsyItUJwbTnFpGK8rkXJiBZ0DO6PsV0M33uTerUN--iHj4owLBAtcsYHFTqqqhhSisaqLrpWx1-FkToQVQNRdSCqTkQHy93R4owx_3JJJWWI0j8kPXEE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2517038456</pqid></control><display><type>article</type><title>Unified Mechanism for Graphene FET's Electrothermal Breakdown and Its Implications on Safe Operating Limits</title><source>IEEE Electronic Library (IEL)</source><creator>Mishra, Abhishek ; Meersha, Adil ; Kranthi, N. K. ; Kumar, Jeevesh ; Bellamkonda, N. S. Veenadhari ; Variar, Harsha B. ; Shrivastava, Mayank</creator><creatorcontrib>Mishra, Abhishek ; Meersha, Adil ; Kranthi, N. K. ; Kumar, Jeevesh ; Bellamkonda, N. S. Veenadhari ; Variar, Harsha B. ; Shrivastava, Mayank</creatorcontrib><description>Unique electrothermal properties of graphene and the chemical nature of its degradation present a compelling set of conditions for the exploration of its breakdown at different time scales. In this work, we give a phenomenological description of graphene's electrical breakdown ranging from a nonequilibrium (transient) electrothermal state to far-equilibrium state while spanning a time scale from few nanoseconds to few minutes. The intricate roles of Pauli-blocked states, intraband heating, and mechanism of degradation in defining a safe operating area (SOA) have been explored. The time and field evolution of defects, resulting in defect-by-defect breakdown, have been studied using Raman spectroscopy. The unified mechanism of breakdown discussed here provides a basic understanding of reliability of graphene-based devices under high-current and/or high-field conditions as well as degradation due to its prolonged operation.</description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/TED.2021.3068081</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Degradation ; Electric breakdown ; Electrical faults ; Electrical overstress (EOS)/electrostatic discharge (ESD) ; electrothermal transport ; Graphene ; Heating systems ; Phonons ; Raman spectroscopy ; Reliability ; Reliability aspects ; safe operating area (SOA) ; Scattering ; time-dependent failure ; Transient analysis</subject><ispartof>IEEE transactions on electron devices, 2021-05, Vol.68 (5), p.2530-2537</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c291t-34778ba907242c64459b6071db31b9e01bf82b152ff776af6312c56dd7b52a73</citedby><cites>FETCH-LOGICAL-c291t-34778ba907242c64459b6071db31b9e01bf82b152ff776af6312c56dd7b52a73</cites><orcidid>0000-0002-1267-2440 ; 0000-0003-1005-040X ; 0000-0001-6178-8434 ; 0000-0003-0851-5618</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9393503$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9393503$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Mishra, Abhishek</creatorcontrib><creatorcontrib>Meersha, Adil</creatorcontrib><creatorcontrib>Kranthi, N. K.</creatorcontrib><creatorcontrib>Kumar, Jeevesh</creatorcontrib><creatorcontrib>Bellamkonda, N. S. Veenadhari</creatorcontrib><creatorcontrib>Variar, Harsha B.</creatorcontrib><creatorcontrib>Shrivastava, Mayank</creatorcontrib><title>Unified Mechanism for Graphene FET's Electrothermal Breakdown and Its Implications on Safe Operating Limits</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>Unique electrothermal properties of graphene and the chemical nature of its degradation present a compelling set of conditions for the exploration of its breakdown at different time scales. In this work, we give a phenomenological description of graphene's electrical breakdown ranging from a nonequilibrium (transient) electrothermal state to far-equilibrium state while spanning a time scale from few nanoseconds to few minutes. The intricate roles of Pauli-blocked states, intraband heating, and mechanism of degradation in defining a safe operating area (SOA) have been explored. The time and field evolution of defects, resulting in defect-by-defect breakdown, have been studied using Raman spectroscopy. The unified mechanism of breakdown discussed here provides a basic understanding of reliability of graphene-based devices under high-current and/or high-field conditions as well as degradation due to its prolonged operation.</description><subject>Degradation</subject><subject>Electric breakdown</subject><subject>Electrical faults</subject><subject>Electrical overstress (EOS)/electrostatic discharge (ESD)</subject><subject>electrothermal transport</subject><subject>Graphene</subject><subject>Heating systems</subject><subject>Phonons</subject><subject>Raman spectroscopy</subject><subject>Reliability</subject><subject>Reliability aspects</subject><subject>safe operating area (SOA)</subject><subject>Scattering</subject><subject>time-dependent failure</subject><subject>Transient analysis</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kL1PwzAQxS0EEqWwI7FYYmBK8UdsxyOUUioVdaDMlpPY1G1iBzsV4r8nVSum053ee_f0A-AWownGSD6uZy8TggieUMQLVOAzMMKMiUzynJ-DEUK4yCQt6CW4Smk7rDzPyQjsPr2zztTw3VQb7V1qoQ0RzqPuNsYb-DpbPyQ4a0zVx9BvTGx1A5-j0bs6_HiofQ0XfYKLtmtcpXsXfILBww9tDVx1Jg4n_wWXrnV9ugYXVjfJ3JzmGKyH-OlbtlzNF9OnZVYRifuM5kIUpZZIkJxUQ00mS44ErkuKS2kQLm1BSsyItUJwbTnFpGK8rkXJiBZ0DO6PsV0M33uTerUN--iHj4owLBAtcsYHFTqqqhhSisaqLrpWx1-FkToQVQNRdSCqTkQHy93R4owx_3JJJWWI0j8kPXEE</recordid><startdate>20210501</startdate><enddate>20210501</enddate><creator>Mishra, Abhishek</creator><creator>Meersha, Adil</creator><creator>Kranthi, N. K.</creator><creator>Kumar, Jeevesh</creator><creator>Bellamkonda, N. S. Veenadhari</creator><creator>Variar, Harsha B.</creator><creator>Shrivastava, Mayank</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-1267-2440</orcidid><orcidid>https://orcid.org/0000-0003-1005-040X</orcidid><orcidid>https://orcid.org/0000-0001-6178-8434</orcidid><orcidid>https://orcid.org/0000-0003-0851-5618</orcidid></search><sort><creationdate>20210501</creationdate><title>Unified Mechanism for Graphene FET's Electrothermal Breakdown and Its Implications on Safe Operating Limits</title><author>Mishra, Abhishek ; Meersha, Adil ; Kranthi, N. K. ; Kumar, Jeevesh ; Bellamkonda, N. S. Veenadhari ; Variar, Harsha B. ; Shrivastava, Mayank</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c291t-34778ba907242c64459b6071db31b9e01bf82b152ff776af6312c56dd7b52a73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Degradation</topic><topic>Electric breakdown</topic><topic>Electrical faults</topic><topic>Electrical overstress (EOS)/electrostatic discharge (ESD)</topic><topic>electrothermal transport</topic><topic>Graphene</topic><topic>Heating systems</topic><topic>Phonons</topic><topic>Raman spectroscopy</topic><topic>Reliability</topic><topic>Reliability aspects</topic><topic>safe operating area (SOA)</topic><topic>Scattering</topic><topic>time-dependent failure</topic><topic>Transient analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mishra, Abhishek</creatorcontrib><creatorcontrib>Meersha, Adil</creatorcontrib><creatorcontrib>Kranthi, N. K.</creatorcontrib><creatorcontrib>Kumar, Jeevesh</creatorcontrib><creatorcontrib>Bellamkonda, N. S. Veenadhari</creatorcontrib><creatorcontrib>Variar, Harsha B.</creatorcontrib><creatorcontrib>Shrivastava, Mayank</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mishra, Abhishek</au><au>Meersha, Adil</au><au>Kranthi, N. K.</au><au>Kumar, Jeevesh</au><au>Bellamkonda, N. S. Veenadhari</au><au>Variar, Harsha B.</au><au>Shrivastava, Mayank</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Unified Mechanism for Graphene FET's Electrothermal Breakdown and Its Implications on Safe Operating Limits</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>2021-05-01</date><risdate>2021</risdate><volume>68</volume><issue>5</issue><spage>2530</spage><epage>2537</epage><pages>2530-2537</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>Unique electrothermal properties of graphene and the chemical nature of its degradation present a compelling set of conditions for the exploration of its breakdown at different time scales. In this work, we give a phenomenological description of graphene's electrical breakdown ranging from a nonequilibrium (transient) electrothermal state to far-equilibrium state while spanning a time scale from few nanoseconds to few minutes. The intricate roles of Pauli-blocked states, intraband heating, and mechanism of degradation in defining a safe operating area (SOA) have been explored. The time and field evolution of defects, resulting in defect-by-defect breakdown, have been studied using Raman spectroscopy. The unified mechanism of breakdown discussed here provides a basic understanding of reliability of graphene-based devices under high-current and/or high-field conditions as well as degradation due to its prolonged operation.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TED.2021.3068081</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0002-1267-2440</orcidid><orcidid>https://orcid.org/0000-0003-1005-040X</orcidid><orcidid>https://orcid.org/0000-0001-6178-8434</orcidid><orcidid>https://orcid.org/0000-0003-0851-5618</orcidid></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0018-9383 |
| ispartof | IEEE transactions on electron devices, 2021-05, Vol.68 (5), p.2530-2537 |
| issn | 0018-9383 1557-9646 |
| language | eng |
| recordid | cdi_crossref_primary_10_1109_TED_2021_3068081 |
| source | IEEE Electronic Library (IEL) |
| subjects | Degradation Electric breakdown Electrical faults Electrical overstress (EOS)/electrostatic discharge (ESD) electrothermal transport Graphene Heating systems Phonons Raman spectroscopy Reliability Reliability aspects safe operating area (SOA) Scattering time-dependent failure Transient analysis |
| title | Unified Mechanism for Graphene FET's Electrothermal Breakdown and Its Implications on Safe Operating Limits |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T23%3A42%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Unified%20Mechanism%20for%20Graphene%20FET's%20Electrothermal%20Breakdown%20and%20Its%20Implications%20on%20Safe%20Operating%20Limits&rft.jtitle=IEEE%20transactions%20on%20electron%20devices&rft.au=Mishra,%20Abhishek&rft.date=2021-05-01&rft.volume=68&rft.issue=5&rft.spage=2530&rft.epage=2537&rft.pages=2530-2537&rft.issn=0018-9383&rft.eissn=1557-9646&rft.coden=IETDAI&rft_id=info:doi/10.1109/TED.2021.3068081&rft_dat=%3Cproquest_RIE%3E2517038456%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2517038456&rft_id=info:pmid/&rft_ieee_id=9393503&rfr_iscdi=true |