An AMOLED Panel Test System Using Universal Data Driver ICs for Various Pixel Structures

In this paper, we propose a test system for active-matrix organic light emitting diode (AMOLED) panels with various pixel structures with the external compensation method. The proposed AMOLED panel test system employs universal data drive ICs to measure the current of a driving thin-film transistor...

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Veröffentlicht in:	IEEE transactions on electron devices 2017-01, Vol.64 (1), p.189-194
Hauptverfasser:	Seol, Hyeon-Cheon, Ra, Jong-Hyun, Hong, Seong-Kwan, Kwon, Oh-Kyong
Format:	Artikel
Sprache:	eng
Schlagworte:	Active matrix displays Active matrix organic light emitting diodes Active-matrix organic light emitting diode (AMOLED) Analog to digital converters Arrays Compensation Current measurement Current sources data drive IC Digital to analog conversion Digital to analog converters Error analysis initial panel test Integrated circuits Organic light emitting diodes Pixels Reproducibility Semiconductor devices Sensors Switches Test systems Thin film transistors thin-film transistor (TFT)
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