Fatigue Properties of ITO and Graphene on Flexible Substrates

The first determination of the fatigue behavior of Graphene and Indium Tin Oxide (ITO) as interconnect materials for electronic components on flexible substrates is reported. ITO and Graphene samples were fabricated on Silicon Nitride (Si 3N 4)/Polyethylene Naphthalate (PEN) substrates. The results...

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Veröffentlicht in:	IEEE transactions on device and materials reliability 2015-09, Vol.15 (3), p.423-428
Hauptverfasser:	Paradee, Gary, Martin, Tom, Christou, Aris
Format:	Magazinearticle
Sprache:	eng
Schlagworte:	Fatigue Graphene Indium tin oxide Strain Stress Substrates
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