Rad-Hard Designs by Automated Latching-Delay Assignment and Time-Borrowable D-Flip-Flop

As the safety-critical applications (e.g., automotive and medical electronics) emerge, various techniques of radiation hardening by design (RHBD) are proposed to deal with soft errors. Among all RHBD techniques, Built-In Soft-Error Resilience (BISER) is the first one to apply the delayed latching to...

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Veröffentlicht in:	IEEE transactions on computers 2022-05, Vol.71 (5), p.1008-1020
Hauptverfasser:	Lin, Dave Y.-W., Wen, Charles H.-P.
Format:	Artikel
Sprache:	eng
Schlagworte:	Automation Benchmark testing Circuit protection Clocks Delay delayed latching Delays design flow Design modifications Error detection flip-flop Flip-flops Latches Radiation hardening Radiation hardening (electronics) radiation hardening by design Safety critical Single event upsets single-event transient single-event upset soft error Soft errors time borrowing Transient analysis
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