Fault-Tolerant Computers Using ``Dotted Logic'' Redundancy Techniques
A new redundancy technique termed dotted logic is presented. Critical input errors are eliminated by joining together the output of NAND gates and NOR gates. The remaining subcritical errors are corrected by introducing redundant inputs to each logic element. Two different schemes, dotted alternatin...
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Veröffentlicht in: | IEEE transactions on computers 1972-08, Vol.C-21 (8), p.867-871 |
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container_title | IEEE transactions on computers |
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creator | Freeman, Harvey A. Metze, Gernot |
description | A new redundancy technique termed dotted logic is presented. Critical input errors are eliminated by joining together the output of NAND gates and NOR gates. The remaining subcritical errors are corrected by introducing redundant inputs to each logic element. Two different schemes, dotted alternating and dotted identical, are described and compared with existing error-correcting techniques. It is shown that these new methods have several advantages over quadded or triple modular redundancy (TMR) networks. In addition to correcting single faults, dotted schemes are easily extended to cover multiple faults. Methods for initial failure determinations for dotted schemes are proposed. Finally, it is shown that a network consisting of complex function elements can be made more reliable by dotting. |
doi_str_mv | 10.1109/TC.1972.5009042 |
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Critical input errors are eliminated by joining together the output of NAND gates and NOR gates. The remaining subcritical errors are corrected by introducing redundant inputs to each logic element. Two different schemes, dotted alternating and dotted identical, are described and compared with existing error-correcting techniques. It is shown that these new methods have several advantages over quadded or triple modular redundancy (TMR) networks. In addition to correcting single faults, dotted schemes are easily extended to cover multiple faults. Methods for initial failure determinations for dotted schemes are proposed. 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Critical input errors are eliminated by joining together the output of NAND gates and NOR gates. The remaining subcritical errors are corrected by introducing redundant inputs to each logic element. Two different schemes, dotted alternating and dotted identical, are described and compared with existing error-correcting techniques. It is shown that these new methods have several advantages over quadded or triple modular redundancy (TMR) networks. In addition to correcting single faults, dotted schemes are easily extended to cover multiple faults. Methods for initial failure determinations for dotted schemes are proposed. Finally, it is shown that a network consisting of complex function elements can be made more reliable by dotting.</description><subject>Circuit faults</subject><subject>Computers</subject><subject>Data mining</subject><subject>DNA</subject><subject>Dotted alternating</subject><subject>dotted identical</subject><subject>dotted logic</subject><subject>dotted NAND</subject><subject>dotted NOR</subject><subject>Logic gates</subject><subject>quadded logic</subject><subject>Redundancy</subject><subject>triple modular redundancy</subject><subject>Tunneling magnetoresistance</subject><issn>0018-9340</issn><issn>1557-9956</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1972</creationdate><recordtype>article</recordtype><recordid>eNo9kL9PwlAUhV-MJiI6O7h0Yyrc-8qj746mgpqQmJgyl_fjFmugxb524L8XAjqd4ZzvDJ8QjwhjRKBJno2RUjlWAARTeSUGqFQaE6nZtRgAoI4pmcKtuAvhGwBmEmgg5gvTb7s4b7bcmrqLsma37ztuQ7QKVb2J1uuXpuvYR8tmU7nRKPpk39fe1O4Q5ey-6uqn53AvbkqzDfxwyaFYLeZ59hYvP17fs-dl7KSiLtZsEmJt_MwTg0wkoysRpbQOvdc2sZZKyy7VTqXobTk1pKzXrCQi6TQZisn517VNCC2Xxb6tdqY9FAjFyUKRZ8XJQnGxcCSezkTFzP_rv_YXNNlZEA</recordid><startdate>197208</startdate><enddate>197208</enddate><creator>Freeman, Harvey A.</creator><creator>Metze, Gernot</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>197208</creationdate><title>Fault-Tolerant Computers Using ``Dotted Logic'' Redundancy Techniques</title><author>Freeman, Harvey A. ; Metze, Gernot</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c259t-8ea39e8ad6d9e0232e1cf1122bc1dd8b3bb9fbec78c571dbf4a95bd8e52119873</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1972</creationdate><topic>Circuit faults</topic><topic>Computers</topic><topic>Data mining</topic><topic>DNA</topic><topic>Dotted alternating</topic><topic>dotted identical</topic><topic>dotted logic</topic><topic>dotted NAND</topic><topic>dotted NOR</topic><topic>Logic gates</topic><topic>quadded logic</topic><topic>Redundancy</topic><topic>triple modular redundancy</topic><topic>Tunneling magnetoresistance</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Freeman, Harvey A.</creatorcontrib><creatorcontrib>Metze, Gernot</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE transactions on computers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Freeman, Harvey A.</au><au>Metze, Gernot</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Fault-Tolerant Computers Using ``Dotted Logic'' Redundancy Techniques</atitle><jtitle>IEEE transactions on computers</jtitle><stitle>TC</stitle><date>1972-08</date><risdate>1972</risdate><volume>C-21</volume><issue>8</issue><spage>867</spage><epage>871</epage><pages>867-871</pages><issn>0018-9340</issn><eissn>1557-9956</eissn><coden>ITCOB4</coden><abstract>A new redundancy technique termed dotted logic is presented. Critical input errors are eliminated by joining together the output of NAND gates and NOR gates. The remaining subcritical errors are corrected by introducing redundant inputs to each logic element. Two different schemes, dotted alternating and dotted identical, are described and compared with existing error-correcting techniques. It is shown that these new methods have several advantages over quadded or triple modular redundancy (TMR) networks. In addition to correcting single faults, dotted schemes are easily extended to cover multiple faults. Methods for initial failure determinations for dotted schemes are proposed. Finally, it is shown that a network consisting of complex function elements can be made more reliable by dotting.</abstract><pub>IEEE</pub><doi>10.1109/TC.1972.5009042</doi><tpages>5</tpages></addata></record> |
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subjects | Circuit faults Computers Data mining DNA Dotted alternating dotted identical dotted logic dotted NAND dotted NOR Logic gates quadded logic Redundancy triple modular redundancy Tunneling magnetoresistance |
title | Fault-Tolerant Computers Using ``Dotted Logic'' Redundancy Techniques |
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