Noise Measure Revisited for Design of Amplifiers Close to Activity Limits

This article revisits the concept of "noise measure" and its importance in designing high-frequency low-noise amplifiers. A new derivation is offered which is simpler than the original derivation of Haus and Adler. Several examples are used to calculate the minimum noise measure of a CMOS...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on circuits and systems. I, Regular papers Regular papers, 2022-06, Vol.69 (6), p.2276-2283
Hauptverfasser: Baniasadi, Nima, Niknejad, Ali M.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 2283
container_issue 6
container_start_page 2276
container_title IEEE transactions on circuits and systems. I, Regular papers
container_volume 69
creator Baniasadi, Nima
Niknejad, Ali M.
description This article revisits the concept of "noise measure" and its importance in designing high-frequency low-noise amplifiers. A new derivation is offered which is simpler than the original derivation of Haus and Adler. Several examples are used to calculate the minimum noise measure of a CMOS amplifier. It is also shown that "noise cancellation" techniques cannot improve the minimum noise measure.
doi_str_mv 10.1109/TCSI.2022.3157622
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TCSI_2022_3157622</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>9743300</ieee_id><sourcerecordid>2670204440</sourcerecordid><originalsourceid>FETCH-LOGICAL-c245t-5b8ed6388ae7ec9836898a9867bc78cc97dcc9a3a61b852ac4d000e946a75c6a3</originalsourceid><addsrcrecordid>eNo9kE1LAzEQhhdRsFZ_gHgJeN46-dh8HMv6VagKWs8hzc5KStvUZFvov3dLi5d55_C8M_AUxS2FEaVgHmb112TEgLERp5WSjJ0VA1pVugQN8vywC1NqzvRlcZXzAoAZ4HRQTN5jyEje0OVtQvKJu5BDhw1pYyKPmMPPmsSWjFebZWgDpkzqZewLXSRj34Vd6PZkGlahy9fFReuWGW9OOSy-n59m9Ws5_XiZ1ONp6ZmourKaa2wk19qhQm80l9poZ7RUc6-090Y1_XDcSTrXFXNeNACARkinKi8dHxb3x7ubFH-3mDu7iNu07l9aJhUwEEJAT9Ej5VPMOWFrNymsXNpbCvZgzB6M2YMxezLWd-6OnYCI_7xRgnMA_gd4d2ai</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2670204440</pqid></control><display><type>article</type><title>Noise Measure Revisited for Design of Amplifiers Close to Activity Limits</title><source>IEEE Electronic Library (IEL)</source><creator>Baniasadi, Nima ; Niknejad, Ali M.</creator><creatorcontrib>Baniasadi, Nima ; Niknejad, Ali M.</creatorcontrib><description>This article revisits the concept of "noise measure" and its importance in designing high-frequency low-noise amplifiers. A new derivation is offered which is simpler than the original derivation of Haus and Adler. Several examples are used to calculate the minimum noise measure of a CMOS amplifier. It is also shown that "noise cancellation" techniques cannot improve the minimum noise measure.</description><identifier>ISSN: 1549-8328</identifier><identifier>EISSN: 1558-0806</identifier><identifier>DOI: 10.1109/TCSI.2022.3157622</identifier><identifier>CODEN: ITCSCH</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Amplifier ; Amplifier design ; Amplifiers ; CMOS ; Derivation ; Impedance ; Mathematical models ; n-port network ; noise canceling ; noise figure ; noise measure ; Noise measurement ; Power measurement ; Semiconductor device measurement ; Signal to noise ratio ; Voltage</subject><ispartof>IEEE transactions on circuits and systems. I, Regular papers, 2022-06, Vol.69 (6), p.2276-2283</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c245t-5b8ed6388ae7ec9836898a9867bc78cc97dcc9a3a61b852ac4d000e946a75c6a3</cites><orcidid>0000-0003-1328-3516 ; 0000-0002-9246-9791</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9743300$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,778,782,794,27907,27908,54741</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9743300$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Baniasadi, Nima</creatorcontrib><creatorcontrib>Niknejad, Ali M.</creatorcontrib><title>Noise Measure Revisited for Design of Amplifiers Close to Activity Limits</title><title>IEEE transactions on circuits and systems. I, Regular papers</title><addtitle>TCSI</addtitle><description>This article revisits the concept of "noise measure" and its importance in designing high-frequency low-noise amplifiers. A new derivation is offered which is simpler than the original derivation of Haus and Adler. Several examples are used to calculate the minimum noise measure of a CMOS amplifier. It is also shown that "noise cancellation" techniques cannot improve the minimum noise measure.</description><subject>Amplifier</subject><subject>Amplifier design</subject><subject>Amplifiers</subject><subject>CMOS</subject><subject>Derivation</subject><subject>Impedance</subject><subject>Mathematical models</subject><subject>n-port network</subject><subject>noise canceling</subject><subject>noise figure</subject><subject>noise measure</subject><subject>Noise measurement</subject><subject>Power measurement</subject><subject>Semiconductor device measurement</subject><subject>Signal to noise ratio</subject><subject>Voltage</subject><issn>1549-8328</issn><issn>1558-0806</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE1LAzEQhhdRsFZ_gHgJeN46-dh8HMv6VagKWs8hzc5KStvUZFvov3dLi5d55_C8M_AUxS2FEaVgHmb112TEgLERp5WSjJ0VA1pVugQN8vywC1NqzvRlcZXzAoAZ4HRQTN5jyEje0OVtQvKJu5BDhw1pYyKPmMPPmsSWjFebZWgDpkzqZewLXSRj34Vd6PZkGlahy9fFReuWGW9OOSy-n59m9Ws5_XiZ1ONp6ZmourKaa2wk19qhQm80l9poZ7RUc6-090Y1_XDcSTrXFXNeNACARkinKi8dHxb3x7ubFH-3mDu7iNu07l9aJhUwEEJAT9Ej5VPMOWFrNymsXNpbCvZgzB6M2YMxezLWd-6OnYCI_7xRgnMA_gd4d2ai</recordid><startdate>20220601</startdate><enddate>20220601</enddate><creator>Baniasadi, Nima</creator><creator>Niknejad, Ali M.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-1328-3516</orcidid><orcidid>https://orcid.org/0000-0002-9246-9791</orcidid></search><sort><creationdate>20220601</creationdate><title>Noise Measure Revisited for Design of Amplifiers Close to Activity Limits</title><author>Baniasadi, Nima ; Niknejad, Ali M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c245t-5b8ed6388ae7ec9836898a9867bc78cc97dcc9a3a61b852ac4d000e946a75c6a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Amplifier</topic><topic>Amplifier design</topic><topic>Amplifiers</topic><topic>CMOS</topic><topic>Derivation</topic><topic>Impedance</topic><topic>Mathematical models</topic><topic>n-port network</topic><topic>noise canceling</topic><topic>noise figure</topic><topic>noise measure</topic><topic>Noise measurement</topic><topic>Power measurement</topic><topic>Semiconductor device measurement</topic><topic>Signal to noise ratio</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Baniasadi, Nima</creatorcontrib><creatorcontrib>Niknejad, Ali M.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Baniasadi, Nima</au><au>Niknejad, Ali M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Noise Measure Revisited for Design of Amplifiers Close to Activity Limits</atitle><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle><stitle>TCSI</stitle><date>2022-06-01</date><risdate>2022</risdate><volume>69</volume><issue>6</issue><spage>2276</spage><epage>2283</epage><pages>2276-2283</pages><issn>1549-8328</issn><eissn>1558-0806</eissn><coden>ITCSCH</coden><abstract>This article revisits the concept of "noise measure" and its importance in designing high-frequency low-noise amplifiers. A new derivation is offered which is simpler than the original derivation of Haus and Adler. Several examples are used to calculate the minimum noise measure of a CMOS amplifier. It is also shown that "noise cancellation" techniques cannot improve the minimum noise measure.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TCSI.2022.3157622</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0003-1328-3516</orcidid><orcidid>https://orcid.org/0000-0002-9246-9791</orcidid></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1549-8328
ispartof IEEE transactions on circuits and systems. I, Regular papers, 2022-06, Vol.69 (6), p.2276-2283
issn 1549-8328
1558-0806
language eng
recordid cdi_crossref_primary_10_1109_TCSI_2022_3157622
source IEEE Electronic Library (IEL)
subjects Amplifier
Amplifier design
Amplifiers
CMOS
Derivation
Impedance
Mathematical models
n-port network
noise canceling
noise figure
noise measure
Noise measurement
Power measurement
Semiconductor device measurement
Signal to noise ratio
Voltage
title Noise Measure Revisited for Design of Amplifiers Close to Activity Limits
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T22%3A02%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Noise%20Measure%20Revisited%20for%20Design%20of%20Amplifiers%20Close%20to%20Activity%20Limits&rft.jtitle=IEEE%20transactions%20on%20circuits%20and%20systems.%20I,%20Regular%20papers&rft.au=Baniasadi,%20Nima&rft.date=2022-06-01&rft.volume=69&rft.issue=6&rft.spage=2276&rft.epage=2283&rft.pages=2276-2283&rft.issn=1549-8328&rft.eissn=1558-0806&rft.coden=ITCSCH&rft_id=info:doi/10.1109/TCSI.2022.3157622&rft_dat=%3Cproquest_RIE%3E2670204440%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2670204440&rft_id=info:pmid/&rft_ieee_id=9743300&rfr_iscdi=true