Error-Feedback Mismatch Error Shaping for High-Resolution Data Converters

Device mismatch is a key concern for high-resolution data converters. This paper presents a comprehensive study of the error-feedback (EF)-based mismatch error shaping (MES) technique. EF MES overcomes the key challenge of the classic dynamic element matching-based MES whose complexity grows exponen...

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Veröffentlicht in:	IEEE transactions on circuits and systems. I, Regular papers Regular papers, 2019-04, Vol.66 (4), p.1342-1354
Hauptverfasser:	Liu, Jiaxin, Hsu, Chen-Kai, Tang, Xiyuan, Li, Shaolan, Wen, Guangjun, Sun, Nan
Format:	Artikel
Sprache:	eng
Schlagworte:	ADC with prediction Analog-to-digital converter (ADC) Calibration Capacitors Complexity theory Data converters digital-to-analog converter (DAC) dynamic element matching (DEM) Dynamic range Error analysis error-feedback (EF) Feedback Hardware High resolution Linearity mismatch error shaping (MES) Quantization (signal) successive approximation register (SAR)
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