Investigation on Erosion of Cu/W Contacts in High-Voltage Circuit Breakers
The prediction and understanding of the erosion process of the Cu/W arcing contacts in high-voltage circuit breakers is important for the improvement of the breaker lifetime. The change of the contact geometry due to erosion is a main factor, which influences the lifetime. It is known that the ablat...
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Veröffentlicht in: | IEEE transactions on components and packaging technologies 2006-09, Vol.29 (3), p.658-665 |
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creator | Tepper, J. Seeger, M. Votteler, T. Behrens, V. Honig, T. |
description | The prediction and understanding of the erosion process of the Cu/W arcing contacts in high-voltage circuit breakers is important for the improvement of the breaker lifetime. The change of the contact geometry due to erosion is a main factor, which influences the lifetime. It is known that the ablation of contact material depends at least on parameters like the arcing current-amplitude, arcing time, total charge, and contact material properties. Based on experimental results, a method for an improved prediction of the erosion was derived. The experiments have been carried out in a SF 6 self-blast circuit breaker test device with commercial high-voltage circuit breaker contacts at a current amplitude up to 45kA RMS and arcing time up to 17ms. From the power balance at the electrodes, the material erosion due to evaporation is calculated. The resulting erosion rates are in good agreement to the experimental results and explain that the specific erosion scales with current, polarity, and the arcing time. This indicates that erosion in this range of arcing stress occurs mainly due to evaporation of contact material and less to emission of droplets |
doi_str_mv | 10.1109/TCAPT.2006.880476 |
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The change of the contact geometry due to erosion is a main factor, which influences the lifetime. It is known that the ablation of contact material depends at least on parameters like the arcing current-amplitude, arcing time, total charge, and contact material properties. Based on experimental results, a method for an improved prediction of the erosion was derived. The experiments have been carried out in a SF 6 self-blast circuit breaker test device with commercial high-voltage circuit breaker contacts at a current amplitude up to 45kA RMS and arcing time up to 17ms. From the power balance at the electrodes, the material erosion due to evaporation is calculated. The resulting erosion rates are in good agreement to the experimental results and explain that the specific erosion scales with current, polarity, and the arcing time. This indicates that erosion in this range of arcing stress occurs mainly due to evaporation of contact material and less to emission of droplets</description><identifier>ISSN: 1521-3331</identifier><identifier>EISSN: 1557-9972</identifier><identifier>DOI: 10.1109/TCAPT.2006.880476</identifier><identifier>CODEN: ITCPFB</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Ablation ; Ambient intelligence ; Arcing contacts ; Circuit breakers ; Circuit testing ; Copper ; copper-tungsten ; Droplets ; Electrodes ; Erosion ; Erosion mechanisms ; Erosion rate ; Evaporation ; Geometry ; Heating ; high-voltage circuit breakers ; Stress ; Tungsten ; Voltage</subject><ispartof>IEEE transactions on components and packaging technologies, 2006-09, Vol.29 (3), p.658-665</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2006</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c373t-b852b618e073a946b24e812894a08e4d3f0c71c9c4e94cd74029e5b3a09a54a03</citedby><cites>FETCH-LOGICAL-c373t-b852b618e073a946b24e812894a08e4d3f0c71c9c4e94cd74029e5b3a09a54a03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1684190$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1684190$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Tepper, J.</creatorcontrib><creatorcontrib>Seeger, M.</creatorcontrib><creatorcontrib>Votteler, T.</creatorcontrib><creatorcontrib>Behrens, V.</creatorcontrib><creatorcontrib>Honig, T.</creatorcontrib><title>Investigation on Erosion of Cu/W Contacts in High-Voltage Circuit Breakers</title><title>IEEE transactions on components and packaging technologies</title><addtitle>TCAPT</addtitle><description>The prediction and understanding of the erosion process of the Cu/W arcing contacts in high-voltage circuit breakers is important for the improvement of the breaker lifetime. The change of the contact geometry due to erosion is a main factor, which influences the lifetime. It is known that the ablation of contact material depends at least on parameters like the arcing current-amplitude, arcing time, total charge, and contact material properties. Based on experimental results, a method for an improved prediction of the erosion was derived. The experiments have been carried out in a SF 6 self-blast circuit breaker test device with commercial high-voltage circuit breaker contacts at a current amplitude up to 45kA RMS and arcing time up to 17ms. From the power balance at the electrodes, the material erosion due to evaporation is calculated. The resulting erosion rates are in good agreement to the experimental results and explain that the specific erosion scales with current, polarity, and the arcing time. This indicates that erosion in this range of arcing stress occurs mainly due to evaporation of contact material and less to emission of droplets</description><subject>Ablation</subject><subject>Ambient intelligence</subject><subject>Arcing contacts</subject><subject>Circuit breakers</subject><subject>Circuit testing</subject><subject>Copper</subject><subject>copper-tungsten</subject><subject>Droplets</subject><subject>Electrodes</subject><subject>Erosion</subject><subject>Erosion mechanisms</subject><subject>Erosion rate</subject><subject>Evaporation</subject><subject>Geometry</subject><subject>Heating</subject><subject>high-voltage circuit breakers</subject><subject>Stress</subject><subject>Tungsten</subject><subject>Voltage</subject><issn>1521-3331</issn><issn>1557-9972</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE9LAzEQxYMoWKsfQLwsnrxsm3-bTY51qbZS0EPVY8imszW13a3JruC3N3UFQRiYd_i9Yd5D6JLgESFYjZfF5Gk5ohiLkZSY5-IIDUiW5alSOT0-aEpSxhg5RWchbDAmXHI1QA_z-hNC69amdU2dxJn6JvzIKim68WtSNHVrbBsSVyczt35LX5pta9aQFM7bzrXJrQfzDj6co5PKbANc_O4her6bLotZuni8nxeTRWpZztq0lBktBZGAc2YUFyXlIAmVihssga9YhW1OrLIcFLernGOqICuZwcpkkWFDdNPf3fvmo4vP650LFrZbU0PTBU1ETliMzWhEr_-hm6bzdfxOSyGY5DSTESI9ZGPy4KHSe-92xn9pgvWhXP1Trj6Uq_tyo-eq9zgA-OOF5ERh9g21r3O6</recordid><startdate>20060901</startdate><enddate>20060901</enddate><creator>Tepper, J.</creator><creator>Seeger, M.</creator><creator>Votteler, T.</creator><creator>Behrens, V.</creator><creator>Honig, T.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope></search><sort><creationdate>20060901</creationdate><title>Investigation on Erosion of Cu/W Contacts in High-Voltage Circuit Breakers</title><author>Tepper, J. ; Seeger, M. ; Votteler, T. ; Behrens, V. ; Honig, T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c373t-b852b618e073a946b24e812894a08e4d3f0c71c9c4e94cd74029e5b3a09a54a03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Ablation</topic><topic>Ambient intelligence</topic><topic>Arcing contacts</topic><topic>Circuit breakers</topic><topic>Circuit testing</topic><topic>Copper</topic><topic>copper-tungsten</topic><topic>Droplets</topic><topic>Electrodes</topic><topic>Erosion</topic><topic>Erosion mechanisms</topic><topic>Erosion rate</topic><topic>Evaporation</topic><topic>Geometry</topic><topic>Heating</topic><topic>high-voltage circuit breakers</topic><topic>Stress</topic><topic>Tungsten</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tepper, J.</creatorcontrib><creatorcontrib>Seeger, M.</creatorcontrib><creatorcontrib>Votteler, T.</creatorcontrib><creatorcontrib>Behrens, V.</creatorcontrib><creatorcontrib>Honig, T.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on components and packaging technologies</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tepper, J.</au><au>Seeger, M.</au><au>Votteler, T.</au><au>Behrens, V.</au><au>Honig, T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Investigation on Erosion of Cu/W Contacts in High-Voltage Circuit Breakers</atitle><jtitle>IEEE transactions on components and packaging technologies</jtitle><stitle>TCAPT</stitle><date>2006-09-01</date><risdate>2006</risdate><volume>29</volume><issue>3</issue><spage>658</spage><epage>665</epage><pages>658-665</pages><issn>1521-3331</issn><eissn>1557-9972</eissn><coden>ITCPFB</coden><abstract>The prediction and understanding of the erosion process of the Cu/W arcing contacts in high-voltage circuit breakers is important for the improvement of the breaker lifetime. The change of the contact geometry due to erosion is a main factor, which influences the lifetime. It is known that the ablation of contact material depends at least on parameters like the arcing current-amplitude, arcing time, total charge, and contact material properties. Based on experimental results, a method for an improved prediction of the erosion was derived. The experiments have been carried out in a SF 6 self-blast circuit breaker test device with commercial high-voltage circuit breaker contacts at a current amplitude up to 45kA RMS and arcing time up to 17ms. From the power balance at the electrodes, the material erosion due to evaporation is calculated. The resulting erosion rates are in good agreement to the experimental results and explain that the specific erosion scales with current, polarity, and the arcing time. This indicates that erosion in this range of arcing stress occurs mainly due to evaporation of contact material and less to emission of droplets</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TCAPT.2006.880476</doi><tpages>8</tpages></addata></record> |
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subjects | Ablation Ambient intelligence Arcing contacts Circuit breakers Circuit testing Copper copper-tungsten Droplets Electrodes Erosion Erosion mechanisms Erosion rate Evaporation Geometry Heating high-voltage circuit breakers Stress Tungsten Voltage |
title | Investigation on Erosion of Cu/W Contacts in High-Voltage Circuit Breakers |
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