Machine Learning-Based Read Access Yield Estimation and Design Optimization for High-Density SRAM

This article presents an efficient yield estimation method for the compensated-most probable failure point (C-MPFP) with the probability density function (PDF) estimation. Bayesian optimization (BO) is used to estimate the PDF. The computational cost can be significantly reduced using this method, w...

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Veröffentlicht in:	IEEE transactions on computer-aided design of integrated circuits and systems 2023-08, Vol.42 (8), p.2618-2630
Hauptverfasser:	Yoon, Taehwan, Jeong, Hanwool
Format:	Artikel
Sprache:	eng
Schlagworte:	Bayesian optimization (BO) circuit design automation Circuit synthesis Computational efficiency Computing costs Design optimization Integrated circuit modeling Machine learning Optimization Probability density function Probability density functions process variation Random access memory read access yield Static random access memory static random-access memory (SRAM) Yield estimation
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