Demonstration and Comparison of On-chip High-frequency Test Methods for RSFQ Circuits
On-chip high-frequency test for Rapid Single Flux Quantum (RSFQ) circuits without external high-frequency equipment is very attractive and promising. The test method based on Shift Register (SR) is widely used for long time. Recently, we have proposed two test methods based on Pseudo Random Binary S...
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| Veröffentlicht in: | IEEE transactions on applied superconductivity 2023-08, Vol.33 (5), p.1-6 |
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| container_title | IEEE transactions on applied superconductivity |
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| creator | Li, Songrui Chen, Liyun Ying, Liliang Ren, Jie Wang, Zhen |
| description | On-chip high-frequency test for Rapid Single Flux Quantum (RSFQ) circuits without external high-frequency equipment is very attractive and promising. The test method based on Shift Register (SR) is widely used for long time. Recently, we have proposed two test methods based on Pseudo Random Binary Sequence (PRBS) generator. In this paper, a Full Adder (FA) is taken as an example of circuit under test and the design methodology of the above approaches is presented. For FA with the traditional and two proposed approaches, the high-frequency test circuits are fabricated and tested. We demonstrate the successful measurement of the three circuits with the maximum operating frequency of the full adder at 23.3 GHz, 26.2 GHz and 27.4 GHz respectively. Based on the experimental results, the clock frequency measurement in the proposed two PRBS based test systems is more accurate and time-saving, which is advantageous for high-frequency RSFQ circuits measurement. |
| doi_str_mv | 10.1109/TASC.2023.3234880 |
| format | Article |
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The test method based on Shift Register (SR) is widely used for long time. Recently, we have proposed two test methods based on Pseudo Random Binary Sequence (PRBS) generator. In this paper, a Full Adder (FA) is taken as an example of circuit under test and the design methodology of the above approaches is presented. For FA with the traditional and two proposed approaches, the high-frequency test circuits are fabricated and tested. We demonstrate the successful measurement of the three circuits with the maximum operating frequency of the full adder at 23.3 GHz, 26.2 GHz and 27.4 GHz respectively. 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The test method based on Shift Register (SR) is widely used for long time. Recently, we have proposed two test methods based on Pseudo Random Binary Sequence (PRBS) generator. In this paper, a Full Adder (FA) is taken as an example of circuit under test and the design methodology of the above approaches is presented. For FA with the traditional and two proposed approaches, the high-frequency test circuits are fabricated and tested. We demonstrate the successful measurement of the three circuits with the maximum operating frequency of the full adder at 23.3 GHz, 26.2 GHz and 27.4 GHz respectively. Based on the experimental results, the clock frequency measurement in the proposed two PRBS based test systems is more accurate and time-saving, which is advantageous for high-frequency RSFQ circuits measurement.</description><subject>Adders</subject><subject>Adding circuits</subject><subject>Circuit design</subject><subject>Clocks</subject><subject>Frequency measurement</subject><subject>Generators</subject><subject>High frequency</subject><subject>LFSR</subject><subject>on-chip testing system</subject><subject>Pipelines</subject><subject>RSFQ circuits</subject><subject>Shift registers</subject><subject>System-on-chip</subject><subject>Testing</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkE1PAjEQhhujiYj-ABMPTTwv9nPpHskqYoIhCpybbj-kRLZrWw78e5bAwdPMJM87M3kAeMRohDGqXlaTZT0iiNARJZQJga7AAHMuCsIxv-57xHEhCKG34C6lLUKYCcYHYP1qd6FNOarsQwtVa2Addp2KPvVjcHDRFnrjOzjzP5vCRfu3t60-wJVNGX7avAkmQRci_F5Ov2Dto977nO7BjVO_yT5c6hCsp2-relbMF-8f9WReaFKxXChaurHWJVXOaIq4U4xpil3ZEGrMGHFijOHOCiYarRkpTcmRrgRTDbPYNXQIns97uxj6x1KW27CPbX9SkrFAlRC8KnsKnykdQ0rROtlFv1PxIDGSJ3vyZE-e7MmLvT7zdM54a-0_HjFUVYweAQ9Pa-g</recordid><startdate>20230801</startdate><enddate>20230801</enddate><creator>Li, Songrui</creator><creator>Chen, Liyun</creator><creator>Ying, Liliang</creator><creator>Ren, Jie</creator><creator>Wang, Zhen</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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The test method based on Shift Register (SR) is widely used for long time. Recently, we have proposed two test methods based on Pseudo Random Binary Sequence (PRBS) generator. In this paper, a Full Adder (FA) is taken as an example of circuit under test and the design methodology of the above approaches is presented. For FA with the traditional and two proposed approaches, the high-frequency test circuits are fabricated and tested. We demonstrate the successful measurement of the three circuits with the maximum operating frequency of the full adder at 23.3 GHz, 26.2 GHz and 27.4 GHz respectively. 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| source | IEEE Electronic Library (IEL) |
| subjects | Adders Adding circuits Circuit design Clocks Frequency measurement Generators High frequency LFSR on-chip testing system Pipelines RSFQ circuits Shift registers System-on-chip Testing |
| title | Demonstration and Comparison of On-chip High-frequency Test Methods for RSFQ Circuits |
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