Microwave techniques in the study of semiconductors

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Proceedings of the IEEE 1964-01, Vol.52 (10), p.1247-1247
Hauptverfasser:	Champlin, K.S., Bhar, J.N.
Format:	Artikel
Sprache:	eng
Schlagworte:	Conductivity Electrons Equations Frequency Germanium Microwave theory and techniques Nitrogen Permittivity Scattering Temperature distribution
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page	1247
container_issue	10
container_start_page	1247
container_title	Proceedings of the IEEE
container_volume	52
creator	Champlin, K.S. Bhar, J.N.
description
doi_str_mv	10.1109/PROC.1964.3321
format	Article
fullrecord	<record><control><sourceid>crossref_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_PROC_1964_3321</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1445251</ieee_id><sourcerecordid>10_1109_PROC_1964_3321</sourcerecordid><originalsourceid>FETCH-LOGICAL-c214t-9b870655e65d301db5f91b530d814f390833df05632ae83fd7fd77c2ad0097bd3</originalsourceid><addsrcrecordid>eNpFj01LxDAYhIMoWFevXrzkD7S-b96mbY5S_IKVFdFzaPPBRtxWm1bZf2_LCsLAXGaGeRi7RMgQQV0_v2zqDFWRZ0QCj1iCUlapELI4ZgkAVqkSqE7ZWYzvAECyoITRUzBD_9N8Oz46s-3C1-QiDx0ft47HcbJ73nse3S6YvrOTGfshnrMT33xEd_HnK_Z2d_taP6Trzf1jfbNOjcB8TFVblVBI6QppCdC20itsJYGtMPekoCKyHuYbonEVeVvOKo1oLIAqW0srlh1254cxDs7rzyHsmmGvEfSCrBdkvSDrBXkuXB0KwTn3H85zKSTSL6s1UeM</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Microwave techniques in the study of semiconductors</title><source>IEEE Electronic Library (IEL)</source><creator>Champlin, K.S. ; Bhar, J.N.</creator><creatorcontrib>Champlin, K.S. ; Bhar, J.N.</creatorcontrib><identifier>ISSN: 0018-9219</identifier><identifier>EISSN: 1558-2256</identifier><identifier>DOI: 10.1109/PROC.1964.3321</identifier><identifier>CODEN: IEEPAD</identifier><language>eng</language><publisher>IEEE</publisher><subject>Conductivity ; Electrons ; Equations ; Frequency ; Germanium ; Microwave theory and techniques ; Nitrogen ; Permittivity ; Scattering ; Temperature distribution</subject><ispartof>Proceedings of the IEEE, 1964-01, Vol.52 (10), p.1247-1247</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1445251$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1445251$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Champlin, K.S.</creatorcontrib><creatorcontrib>Bhar, J.N.</creatorcontrib><title>Microwave techniques in the study of semiconductors</title><title>Proceedings of the IEEE</title><addtitle>JPROC</addtitle><subject>Conductivity</subject><subject>Electrons</subject><subject>Equations</subject><subject>Frequency</subject><subject>Germanium</subject><subject>Microwave theory and techniques</subject><subject>Nitrogen</subject><subject>Permittivity</subject><subject>Scattering</subject><subject>Temperature distribution</subject><issn>0018-9219</issn><issn>1558-2256</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1964</creationdate><recordtype>article</recordtype><recordid>eNpFj01LxDAYhIMoWFevXrzkD7S-b96mbY5S_IKVFdFzaPPBRtxWm1bZf2_LCsLAXGaGeRi7RMgQQV0_v2zqDFWRZ0QCj1iCUlapELI4ZgkAVqkSqE7ZWYzvAECyoITRUzBD_9N8Oz46s-3C1-QiDx0ft47HcbJ73nse3S6YvrOTGfshnrMT33xEd_HnK_Z2d_taP6Trzf1jfbNOjcB8TFVblVBI6QppCdC20itsJYGtMPekoCKyHuYbonEVeVvOKo1oLIAqW0srlh1254cxDs7rzyHsmmGvEfSCrBdkvSDrBXkuXB0KwTn3H85zKSTSL6s1UeM</recordid><startdate>19640101</startdate><enddate>19640101</enddate><creator>Champlin, K.S.</creator><creator>Bhar, J.N.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19640101</creationdate><title>Microwave techniques in the study of semiconductors</title><author>Champlin, K.S. ; Bhar, J.N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c214t-9b870655e65d301db5f91b530d814f390833df05632ae83fd7fd77c2ad0097bd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1964</creationdate><topic>Conductivity</topic><topic>Electrons</topic><topic>Equations</topic><topic>Frequency</topic><topic>Germanium</topic><topic>Microwave theory and techniques</topic><topic>Nitrogen</topic><topic>Permittivity</topic><topic>Scattering</topic><topic>Temperature distribution</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Champlin, K.S.</creatorcontrib><creatorcontrib>Bhar, J.N.</creatorcontrib><collection>CrossRef</collection><jtitle>Proceedings of the IEEE</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Champlin, K.S.</au><au>Bhar, J.N.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Microwave techniques in the study of semiconductors</atitle><jtitle>Proceedings of the IEEE</jtitle><stitle>JPROC</stitle><date>1964-01-01</date><risdate>1964</risdate><volume>52</volume><issue>10</issue><spage>1247</spage><epage>1247</epage><pages>1247-1247</pages><issn>0018-9219</issn><eissn>1558-2256</eissn><coden>IEEPAD</coden><pub>IEEE</pub><doi>10.1109/PROC.1964.3321</doi><tpages>1</tpages></addata></record>
fulltext	fulltext_linktorsrc
identifier	ISSN: 0018-9219
ispartof	Proceedings of the IEEE, 1964-01, Vol.52 (10), p.1247-1247
issn	0018-9219 1558-2256
language	eng
recordid	cdi_crossref_primary_10_1109_PROC_1964_3321
source	IEEE Electronic Library (IEL)
subjects	Conductivity Electrons Equations Frequency Germanium Microwave theory and techniques Nitrogen Permittivity Scattering Temperature distribution
title	Microwave techniques in the study of semiconductors
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T08%3A11%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Microwave%20techniques%20in%20the%20study%20of%20semiconductors&rft.jtitle=Proceedings%20of%20the%20IEEE&rft.au=Champlin,%20K.S.&rft.date=1964-01-01&rft.volume=52&rft.issue=10&rft.spage=1247&rft.epage=1247&rft.pages=1247-1247&rft.issn=0018-9219&rft.eissn=1558-2256&rft.coden=IEEPAD&rft_id=info:doi/10.1109/PROC.1964.3321&rft_dat=%3Ccrossref_RIE%3E10_1109_PROC_1964_3321%3C/crossref_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1445251&rfr_iscdi=true