"Hot" and "Cool" chips [Guest Editor's Introduction]

"Hot" and "Cool" chips [Guest Editor's Introduction]

The annual Hot Chips Symposium is always an interesting experience. For Hot Chips IV, the program committee (chaired by Dave Patterson and myself) once again had the pleasure (and difficulty) of selecting from too many interesting papers. The conference itself was a stimulating experience, bringing...

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Veröffentlicht in:IEEE MICRO 1993-06, Vol.13 (3), p.9-10
1. Verfasser: Mashey, John R.
Format: Artikel
Sprache:eng
Schlagworte:
Benchmark testing
Chips
Graphics
Industries
Pipelines
Reduced instruction set computing
Semiconductors
Silicon
Uncertainty
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Zusammenfassung:The annual Hot Chips Symposium is always an interesting experience. For Hot Chips IV, the program committee (chaired by Dave Patterson and myself) once again had the pleasure (and difficulty) of selecting from too many interesting papers. The conference itself was a stimulating experience, bringing together a wide variety of people from both industry and academia.
ISSN:0272-1732
1937-4143
DOI:10.1109/MM.1993.8171524