Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor
Multicore microprocessors provide a natural application environment for IEEE Std 1500 and, as this article proves, allow for innovative approaches that capitalize on the fact that the various cores are identical.
Gespeichert in:
| Veröffentlicht in: | IEEE design & test of computers 2009-01, Vol.26 (1), p.52-59 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 59 |
|---|---|
| container_issue | 1 |
| container_start_page | 52 |
| container_title | IEEE design & test of computers |
| container_volume | 26 |
| creator | Balakrishnan, K.J. Giles, G. Wingfield, J. |
| description | Multicore microprocessors provide a natural application environment for IEEE Std 1500 and, as this article proves, allow for innovative approaches that capitalize on the fact that the various cores are identical. |
| doi_str_mv | 10.1109/MDT.2009.17 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_MDT_2009_17</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4760116</ieee_id><sourcerecordid>2543423241</sourcerecordid><originalsourceid>FETCH-LOGICAL-c312t-4ee12db9924b4fd73381f5c366381d335562adb0d412ba11972aa6b7b4575113</originalsourceid><addsrcrecordid>eNpdkD1PwzAQhi0EEqUwMbJYLAwo5c4fcTxGLV9Sowopu-UkjhrUJsVOB_49jooYmO6G5-7eewi5RVgggn4qVuWCAegFqjMyQymzBDVm52QGSkCihJKX5CqETwBATNMZyUsXRprXtQuBFq7e2r4Le9r1dNw6-nG0TbIcvKN5saKbw-j80NOiq_1w8MM0M_hrctHaXXA3v3VOypfncvmWrDev78t8ndQc2ZgI55A1ldZMVKJtFOcZtrLmaRqbhnMpU2abChqBrLKIWjFr00pVQiqJyOfk4bQ2Hv46xtBm34Xa7Xa2d8MxmExJ4BlwHcn7f-TncPR9zGY0MmCAICP0eILiKyF415qD7_bWfxsEM7k00aWZXBpUkb470Z1z7o8UKp0s8h_kLmx7</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>912020105</pqid></control><display><type>article</type><title>Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor</title><source>IEEE Electronic Library (IEL)</source><creator>Balakrishnan, K.J. ; Giles, G. ; Wingfield, J.</creator><creatorcontrib>Balakrishnan, K.J. ; Giles, G. ; Wingfield, J.</creatorcontrib><description>Multicore microprocessors provide a natural application environment for IEEE Std 1500 and, as this article proves, allow for innovative approaches that capitalize on the fact that the various cores are identical.</description><identifier>ISSN: 0740-7475</identifier><identifier>ISSN: 2168-2356</identifier><identifier>EISSN: 1558-1918</identifier><identifier>EISSN: 2168-2364</identifier><identifier>DOI: 10.1109/MDT.2009.17</identifier><identifier>CODEN: IDTCEC</identifier><language>eng</language><publisher>Los Alamitos: IEEE Computer Society</publisher><subject>Bandwidth ; Broadcasting ; Circuit testing ; embedded-core testing ; Fault detection ; Job shop scheduling ; Laser mode locking ; Manufacturing ; microprocessor testing ; Microprocessors ; Multicore processing ; Pins ; quad-core AMD microprocessor ; SoC testing ; test access mechanism ; test compression</subject><ispartof>IEEE design & test of computers, 2009-01, Vol.26 (1), p.52-59</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c312t-4ee12db9924b4fd73381f5c366381d335562adb0d412ba11972aa6b7b4575113</citedby><cites>FETCH-LOGICAL-c312t-4ee12db9924b4fd73381f5c366381d335562adb0d412ba11972aa6b7b4575113</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4760116$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,777,781,793,27906,27907,54740</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4760116$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Balakrishnan, K.J.</creatorcontrib><creatorcontrib>Giles, G.</creatorcontrib><creatorcontrib>Wingfield, J.</creatorcontrib><title>Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor</title><title>IEEE design & test of computers</title><addtitle>MDT</addtitle><description>Multicore microprocessors provide a natural application environment for IEEE Std 1500 and, as this article proves, allow for innovative approaches that capitalize on the fact that the various cores are identical.</description><subject>Bandwidth</subject><subject>Broadcasting</subject><subject>Circuit testing</subject><subject>embedded-core testing</subject><subject>Fault detection</subject><subject>Job shop scheduling</subject><subject>Laser mode locking</subject><subject>Manufacturing</subject><subject>microprocessor testing</subject><subject>Microprocessors</subject><subject>Multicore processing</subject><subject>Pins</subject><subject>quad-core AMD microprocessor</subject><subject>SoC testing</subject><subject>test access mechanism</subject><subject>test compression</subject><issn>0740-7475</issn><issn>2168-2356</issn><issn>1558-1918</issn><issn>2168-2364</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkD1PwzAQhi0EEqUwMbJYLAwo5c4fcTxGLV9Sowopu-UkjhrUJsVOB_49jooYmO6G5-7eewi5RVgggn4qVuWCAegFqjMyQymzBDVm52QGSkCihJKX5CqETwBATNMZyUsXRprXtQuBFq7e2r4Le9r1dNw6-nG0TbIcvKN5saKbw-j80NOiq_1w8MM0M_hrctHaXXA3v3VOypfncvmWrDev78t8ndQc2ZgI55A1ldZMVKJtFOcZtrLmaRqbhnMpU2abChqBrLKIWjFr00pVQiqJyOfk4bQ2Hv46xtBm34Xa7Xa2d8MxmExJ4BlwHcn7f-TncPR9zGY0MmCAICP0eILiKyF415qD7_bWfxsEM7k00aWZXBpUkb470Z1z7o8UKp0s8h_kLmx7</recordid><startdate>200901</startdate><enddate>200901</enddate><creator>Balakrishnan, K.J.</creator><creator>Giles, G.</creator><creator>Wingfield, J.</creator><general>IEEE Computer Society</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>200901</creationdate><title>Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor</title><author>Balakrishnan, K.J. ; Giles, G. ; Wingfield, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c312t-4ee12db9924b4fd73381f5c366381d335562adb0d412ba11972aa6b7b4575113</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Bandwidth</topic><topic>Broadcasting</topic><topic>Circuit testing</topic><topic>embedded-core testing</topic><topic>Fault detection</topic><topic>Job shop scheduling</topic><topic>Laser mode locking</topic><topic>Manufacturing</topic><topic>microprocessor testing</topic><topic>Microprocessors</topic><topic>Multicore processing</topic><topic>Pins</topic><topic>quad-core AMD microprocessor</topic><topic>SoC testing</topic><topic>test access mechanism</topic><topic>test compression</topic><toplevel>online_resources</toplevel><creatorcontrib>Balakrishnan, K.J.</creatorcontrib><creatorcontrib>Giles, G.</creatorcontrib><creatorcontrib>Wingfield, J.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>IEEE design & test of computers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Balakrishnan, K.J.</au><au>Giles, G.</au><au>Wingfield, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor</atitle><jtitle>IEEE design & test of computers</jtitle><stitle>MDT</stitle><date>2009-01</date><risdate>2009</risdate><volume>26</volume><issue>1</issue><spage>52</spage><epage>59</epage><pages>52-59</pages><issn>0740-7475</issn><issn>2168-2356</issn><eissn>1558-1918</eissn><eissn>2168-2364</eissn><coden>IDTCEC</coden><abstract>Multicore microprocessors provide a natural application environment for IEEE Std 1500 and, as this article proves, allow for innovative approaches that capitalize on the fact that the various cores are identical.</abstract><cop>Los Alamitos</cop><pub>IEEE Computer Society</pub><doi>10.1109/MDT.2009.17</doi><tpages>8</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0740-7475 |
| ispartof | IEEE design & test of computers, 2009-01, Vol.26 (1), p.52-59 |
| issn | 0740-7475 2168-2356 1558-1918 2168-2364 |
| language | eng |
| recordid | cdi_crossref_primary_10_1109_MDT_2009_17 |
| source | IEEE Electronic Library (IEL) |
| subjects | Bandwidth Broadcasting Circuit testing embedded-core testing Fault detection Job shop scheduling Laser mode locking Manufacturing microprocessor testing Microprocessors Multicore processing Pins quad-core AMD microprocessor SoC testing test access mechanism test compression |
| title | Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T09%3A57%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Test%20Access%20Mechanism%20in%20the%20Quad-Core%20AMD%20Opteron%20Microprocessor&rft.jtitle=IEEE%20design%20&%20test%20of%20computers&rft.au=Balakrishnan,%20K.J.&rft.date=2009-01&rft.volume=26&rft.issue=1&rft.spage=52&rft.epage=59&rft.pages=52-59&rft.issn=0740-7475&rft.eissn=1558-1918&rft.coden=IDTCEC&rft_id=info:doi/10.1109/MDT.2009.17&rft_dat=%3Cproquest_RIE%3E2543423241%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=912020105&rft_id=info:pmid/&rft_ieee_id=4760116&rfr_iscdi=true |