Conference Reports

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Veröffentlicht in:IEEE design & test of computers 2007-03, Vol.24 (2), p.202-203
Hauptverfasser: Ravikumar, C.P., Nurmi, Jari
Format: Artikel
Sprache:eng
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container_end_page 203
container_issue 2
container_start_page 202
container_title IEEE design & test of computers
container_volume 24
creator Ravikumar, C.P.
Nurmi, Jari
description
doi_str_mv 10.1109/MDT.2007.39
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1109_MDT_2007_39</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2544443381</sourcerecordid><originalsourceid>FETCH-LOGICAL-c133t-bdd82b15a97956c16b8e996b94b0a92c2d0f9964a70f5af06a349f5f59a3a6c83</originalsourceid><addsrcrecordid>eNotj01Lw0AURQdRMFY3-gfErSR9bz7zlhKrFiqC1PUwmcyARZM4ky7896bU1eXC4V4OYzcIFSLQ8vVxW3EAUwk6YQVHXZdcaHnKCjASSiONOmcXOe8AAFHrgl03Qx9DCr0Pt-9hHNKUL9lZdF85XP3ngn08rbbNS7l5e143D5vSoxBT2XZdzVtUjgwp7VG3dSDSLckWHHHPO4hzl85AVC6CdkJSVFGRE077WizY3XF3TMPPPuTJ7oZ96udLS8ixRqFwhu6PkE9DzilEO6bPb5d-LYI9ONvZ2R6crSDxBwKfRs8</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>912181351</pqid></control><display><type>article</type><title>Conference Reports</title><source>IEEE Electronic Library (IEL)</source><creator>Ravikumar, C.P. ; Nurmi, Jari</creator><creatorcontrib>Ravikumar, C.P. ; Nurmi, Jari</creatorcontrib><identifier>ISSN: 0740-7475</identifier><identifier>ISSN: 2168-2356</identifier><identifier>EISSN: 2168-2364</identifier><identifier>DOI: 10.1109/MDT.2007.39</identifier><language>eng</language><publisher>Los Alamitos: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</publisher><ispartof>IEEE design &amp; test of computers, 2007-03, Vol.24 (2), p.202-203</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2007</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27922,27923</link.rule.ids></links><search><creatorcontrib>Ravikumar, C.P.</creatorcontrib><creatorcontrib>Nurmi, Jari</creatorcontrib><title>Conference Reports</title><title>IEEE design &amp; test of computers</title><issn>0740-7475</issn><issn>2168-2356</issn><issn>2168-2364</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNotj01Lw0AURQdRMFY3-gfErSR9bz7zlhKrFiqC1PUwmcyARZM4ky7896bU1eXC4V4OYzcIFSLQ8vVxW3EAUwk6YQVHXZdcaHnKCjASSiONOmcXOe8AAFHrgl03Qx9DCr0Pt-9hHNKUL9lZdF85XP3ngn08rbbNS7l5e143D5vSoxBT2XZdzVtUjgwp7VG3dSDSLckWHHHPO4hzl85AVC6CdkJSVFGRE077WizY3XF3TMPPPuTJ7oZ96udLS8ixRqFwhu6PkE9DzilEO6bPb5d-LYI9ONvZ2R6crSDxBwKfRs8</recordid><startdate>200703</startdate><enddate>200703</enddate><creator>Ravikumar, C.P.</creator><creator>Nurmi, Jari</creator><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>200703</creationdate><title>Conference Reports</title><author>Ravikumar, C.P. ; Nurmi, Jari</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c133t-bdd82b15a97956c16b8e996b94b0a92c2d0f9964a70f5af06a349f5f59a3a6c83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Ravikumar, C.P.</creatorcontrib><creatorcontrib>Nurmi, Jari</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE design &amp; test of computers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ravikumar, C.P.</au><au>Nurmi, Jari</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Conference Reports</atitle><jtitle>IEEE design &amp; test of computers</jtitle><date>2007-03</date><risdate>2007</risdate><volume>24</volume><issue>2</issue><spage>202</spage><epage>203</epage><pages>202-203</pages><issn>0740-7475</issn><issn>2168-2356</issn><eissn>2168-2364</eissn><cop>Los Alamitos</cop><pub>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</pub><doi>10.1109/MDT.2007.39</doi><tpages>2</tpages></addata></record>
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identifier ISSN: 0740-7475
ispartof IEEE design & test of computers, 2007-03, Vol.24 (2), p.202-203
issn 0740-7475
2168-2356
2168-2364
language eng
recordid cdi_crossref_primary_10_1109_MDT_2007_39
source IEEE Electronic Library (IEL)
title Conference Reports
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T20%3A46%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Conference%20Reports&rft.jtitle=IEEE%20design%20&%20test%20of%20computers&rft.au=Ravikumar,%20C.P.&rft.date=2007-03&rft.volume=24&rft.issue=2&rft.spage=202&rft.epage=203&rft.pages=202-203&rft.issn=0740-7475&rft.eissn=2168-2364&rft_id=info:doi/10.1109/MDT.2007.39&rft_dat=%3Cproquest_cross%3E2544443381%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=912181351&rft_id=info:pmid/&rfr_iscdi=true