A Polarization Parametric Method of Sensing the Scattering Signals From a Submicrometer Particle

In this letter, we report a new far-field polarization microscopic technique for detecting the scattering signals from a submicron particle. A diamond-like carbon submicrometer particle is imaged in terms of its scattered field intensity and polarization parameters involving the Stokes parameters. Our experimental results indicate that the proposed technique is able to resolve fine information from the anisotropic edge scattering of scatterers and also to quantitatively measure the scattered field spectra with an effective spatial range significantly extending beyond the conventional microscopy.