Full-Periphery Surface Impedance for Skin-Effect Approximation in Electric Field Integral Equation
A new surface impedance model for RL-extraction in lossy two-dimensional (2-D) interconnects of rectangular cross section is presented. The model is derived directly from the volumetric electric field integral equation under the approximation of the unknown volumetric current density as a product of...
Gespeichert in:
| Veröffentlicht in: | IEEE microwave and wireless components letters 2009-01, Vol.19 (1), p.9-11 |
|---|---|
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 11 |
|---|---|
| container_issue | 1 |
| container_start_page | 9 |
| container_title | IEEE microwave and wireless components letters |
| container_volume | 19 |
| creator | Al-Qedra, M. Okhmatovski, V.I. |
| description | A new surface impedance model for RL-extraction in lossy two-dimensional (2-D) interconnects of rectangular cross section is presented. The model is derived directly from the volumetric electric field integral equation under the approximation of the unknown volumetric current density as a product of the exponential factor describing the skin-effect and the unknown surface current density on the conductor's periphery. By proper accounting for the coupling between the boundary elements situated on the top and bottom surfaces of conductor with the elements located on the side-walls, the model maintains accuracy from dc to multi-GHz frequencies as well as for conductors with both large and small thickness/width ratios. |
| doi_str_mv | 10.1109/LMWC.2008.2008530 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_LMWC_2008_2008530</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4729655</ieee_id><sourcerecordid>875043252</sourcerecordid><originalsourceid>FETCH-LOGICAL-c385t-b6f533371094439f1f9ebc75fb38084c7067c9685b6dff932dda74d66b6adfd03</originalsourceid><addsrcrecordid>eNp9kc1qGzEUhYfQQNwkDxC6EYWmq3Gl0f8yGLs1OCSQhiyFRiO1cuWZsTQDydtHE5ssushGukjfPdx7TlFcIThHCMofm9unxbyCULwdFMOTYoYoFSXijHyaaoxKhKE8Kz6ntIUQEUHQrKhXYwjlvY2-_2vjC3gYo9PGgvWut41uc-W6CB7--bZcOmfNAG76PnbPfqcH37XAt2AZ8nP0Bqy8DQ1Yt4P9E3UAy_34xlwUp06HZC-P93nxuFr-XvwqN3c_14ubTWmwoENZM0cxxjxvQwiWDjlpa8Opq7GAghgOGTeSCVqzxjmJq6bRnDSM1Uw3roH4vPh-0M3z7UebBrXzydgQdGu7MSnBKSS4olUmrz8kMSGSVUhk8Ot_4LYbY5u3UIJl35msJjV0gEzsUorWqT5me-KLQlBN4agpHDXloo7h5J5vR2GdjA4uZqt9em-sEMzChGfuy4Hz1tr3b8IrySjFr7eulys</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>861106922</pqid></control><display><type>article</type><title>Full-Periphery Surface Impedance for Skin-Effect Approximation in Electric Field Integral Equation</title><source>IEEE Electronic Library (IEL)</source><creator>Al-Qedra, M. ; Okhmatovski, V.I.</creator><creatorcontrib>Al-Qedra, M. ; Okhmatovski, V.I.</creatorcontrib><description>A new surface impedance model for RL-extraction in lossy two-dimensional (2-D) interconnects of rectangular cross section is presented. The model is derived directly from the volumetric electric field integral equation under the approximation of the unknown volumetric current density as a product of the exponential factor describing the skin-effect and the unknown surface current density on the conductor's periphery. By proper accounting for the coupling between the boundary elements situated on the top and bottom surfaces of conductor with the elements located on the side-walls, the model maintains accuracy from dc to multi-GHz frequencies as well as for conductors with both large and small thickness/width ratios.</description><identifier>ISSN: 1531-1309</identifier><identifier>ISSN: 2771-957X</identifier><identifier>EISSN: 1558-1764</identifier><identifier>EISSN: 2771-9588</identifier><identifier>DOI: 10.1109/LMWC.2008.2008530</identifier><identifier>CODEN: IMWCBJ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Approximation ; Conductors ; Conductors (devices) ; Current density ; Design. Technologies. Operation analysis. Testing ; Electric field integral equation (EFIE) ; Electric fields ; Electromagnetic modeling ; Electronics ; Exact sciences and technology ; Frequency ; Impedance ; Inductance ; Integral equations ; Integrated circuits ; interconnect modeling ; Mathematical analysis ; Mathematical models ; Moment methods ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; skin-effect ; Surface impedance ; Surface resistance ; Two dimensional displays</subject><ispartof>IEEE microwave and wireless components letters, 2009-01, Vol.19 (1), p.9-11</ispartof><rights>2009 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c385t-b6f533371094439f1f9ebc75fb38084c7067c9685b6dff932dda74d66b6adfd03</citedby><cites>FETCH-LOGICAL-c385t-b6f533371094439f1f9ebc75fb38084c7067c9685b6dff932dda74d66b6adfd03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4729655$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,778,782,794,4012,27910,27911,27912,54745</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4729655$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21022347$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Al-Qedra, M.</creatorcontrib><creatorcontrib>Okhmatovski, V.I.</creatorcontrib><title>Full-Periphery Surface Impedance for Skin-Effect Approximation in Electric Field Integral Equation</title><title>IEEE microwave and wireless components letters</title><addtitle>LMWC</addtitle><description>A new surface impedance model for RL-extraction in lossy two-dimensional (2-D) interconnects of rectangular cross section is presented. The model is derived directly from the volumetric electric field integral equation under the approximation of the unknown volumetric current density as a product of the exponential factor describing the skin-effect and the unknown surface current density on the conductor's periphery. By proper accounting for the coupling between the boundary elements situated on the top and bottom surfaces of conductor with the elements located on the side-walls, the model maintains accuracy from dc to multi-GHz frequencies as well as for conductors with both large and small thickness/width ratios.</description><subject>Applied sciences</subject><subject>Approximation</subject><subject>Conductors</subject><subject>Conductors (devices)</subject><subject>Current density</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electric field integral equation (EFIE)</subject><subject>Electric fields</subject><subject>Electromagnetic modeling</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Frequency</subject><subject>Impedance</subject><subject>Inductance</subject><subject>Integral equations</subject><subject>Integrated circuits</subject><subject>interconnect modeling</subject><subject>Mathematical analysis</subject><subject>Mathematical models</subject><subject>Moment methods</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>skin-effect</subject><subject>Surface impedance</subject><subject>Surface resistance</subject><subject>Two dimensional displays</subject><issn>1531-1309</issn><issn>2771-957X</issn><issn>1558-1764</issn><issn>2771-9588</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kc1qGzEUhYfQQNwkDxC6EYWmq3Gl0f8yGLs1OCSQhiyFRiO1cuWZsTQDydtHE5ssushGukjfPdx7TlFcIThHCMofm9unxbyCULwdFMOTYoYoFSXijHyaaoxKhKE8Kz6ntIUQEUHQrKhXYwjlvY2-_2vjC3gYo9PGgvWut41uc-W6CB7--bZcOmfNAG76PnbPfqcH37XAt2AZ8nP0Bqy8DQ1Yt4P9E3UAy_34xlwUp06HZC-P93nxuFr-XvwqN3c_14ubTWmwoENZM0cxxjxvQwiWDjlpa8Opq7GAghgOGTeSCVqzxjmJq6bRnDSM1Uw3roH4vPh-0M3z7UebBrXzydgQdGu7MSnBKSS4olUmrz8kMSGSVUhk8Ot_4LYbY5u3UIJl35msJjV0gEzsUorWqT5me-KLQlBN4agpHDXloo7h5J5vR2GdjA4uZqt9em-sEMzChGfuy4Hz1tr3b8IrySjFr7eulys</recordid><startdate>200901</startdate><enddate>200901</enddate><creator>Al-Qedra, M.</creator><creator>Okhmatovski, V.I.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>200901</creationdate><title>Full-Periphery Surface Impedance for Skin-Effect Approximation in Electric Field Integral Equation</title><author>Al-Qedra, M. ; Okhmatovski, V.I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c385t-b6f533371094439f1f9ebc75fb38084c7067c9685b6dff932dda74d66b6adfd03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Applied sciences</topic><topic>Approximation</topic><topic>Conductors</topic><topic>Conductors (devices)</topic><topic>Current density</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electric field integral equation (EFIE)</topic><topic>Electric fields</topic><topic>Electromagnetic modeling</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Frequency</topic><topic>Impedance</topic><topic>Inductance</topic><topic>Integral equations</topic><topic>Integrated circuits</topic><topic>interconnect modeling</topic><topic>Mathematical analysis</topic><topic>Mathematical models</topic><topic>Moment methods</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>skin-effect</topic><topic>Surface impedance</topic><topic>Surface resistance</topic><topic>Two dimensional displays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Al-Qedra, M.</creatorcontrib><creatorcontrib>Okhmatovski, V.I.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE microwave and wireless components letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Al-Qedra, M.</au><au>Okhmatovski, V.I.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Full-Periphery Surface Impedance for Skin-Effect Approximation in Electric Field Integral Equation</atitle><jtitle>IEEE microwave and wireless components letters</jtitle><stitle>LMWC</stitle><date>2009-01</date><risdate>2009</risdate><volume>19</volume><issue>1</issue><spage>9</spage><epage>11</epage><pages>9-11</pages><issn>1531-1309</issn><issn>2771-957X</issn><eissn>1558-1764</eissn><eissn>2771-9588</eissn><coden>IMWCBJ</coden><abstract>A new surface impedance model for RL-extraction in lossy two-dimensional (2-D) interconnects of rectangular cross section is presented. The model is derived directly from the volumetric electric field integral equation under the approximation of the unknown volumetric current density as a product of the exponential factor describing the skin-effect and the unknown surface current density on the conductor's periphery. By proper accounting for the coupling between the boundary elements situated on the top and bottom surfaces of conductor with the elements located on the side-walls, the model maintains accuracy from dc to multi-GHz frequencies as well as for conductors with both large and small thickness/width ratios.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/LMWC.2008.2008530</doi><tpages>3</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1531-1309 |
| ispartof | IEEE microwave and wireless components letters, 2009-01, Vol.19 (1), p.9-11 |
| issn | 1531-1309 2771-957X 1558-1764 2771-9588 |
| language | eng |
| recordid | cdi_crossref_primary_10_1109_LMWC_2008_2008530 |
| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Approximation Conductors Conductors (devices) Current density Design. Technologies. Operation analysis. Testing Electric field integral equation (EFIE) Electric fields Electromagnetic modeling Electronics Exact sciences and technology Frequency Impedance Inductance Integral equations Integrated circuits interconnect modeling Mathematical analysis Mathematical models Moment methods Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices skin-effect Surface impedance Surface resistance Two dimensional displays |
| title | Full-Periphery Surface Impedance for Skin-Effect Approximation in Electric Field Integral Equation |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T01%3A10%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Full-Periphery%20Surface%20Impedance%20for%20Skin-Effect%20Approximation%20in%20Electric%20Field%20Integral%20Equation&rft.jtitle=IEEE%20microwave%20and%20wireless%20components%20letters&rft.au=Al-Qedra,%20M.&rft.date=2009-01&rft.volume=19&rft.issue=1&rft.spage=9&rft.epage=11&rft.pages=9-11&rft.issn=1531-1309&rft.eissn=1558-1764&rft.coden=IMWCBJ&rft_id=info:doi/10.1109/LMWC.2008.2008530&rft_dat=%3Cproquest_RIE%3E875043252%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=861106922&rft_id=info:pmid/&rft_ieee_id=4729655&rfr_iscdi=true |