An In-Depth, Theoretical Investigation Into Modeling Metal-Insulator-Metal Capacitors Using Symmetric Coupled Lines in a Homogeneous Medium Model
In monolithic microwave integrated circuits (MMIC) design, a metal-insulator-metal (MIM) capacitor is one of the key passive components. Research on modeling MIM capacitors in an accurate yet efficient fashion has been around for years. Models for series capacitors of small electrical length have be...
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| Veröffentlicht in: | IEEE microwave and wireless components letters 2008-01, Vol.18 (1), p.37-39 |
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| creator | Asahara, M. Campbell, C.F. Frensley, W.R. |
| description | In monolithic microwave integrated circuits (MMIC) design, a metal-insulator-metal (MIM) capacitor is one of the key passive components. Research on modeling MIM capacitors in an accurate yet efficient fashion has been around for years. Models for series capacitors of small electrical length have been well established. In the authors' previous work was pioneered the novel approach to modeling shunt capacitors of significant electrical length on multiple grounding vias with the effect of lossy media incorporated. With this in mind, this letter further expands on, and provides a significant supplement with, the previous works. At the core of this letter is to gain an in-depth, theoretical insight into the rationale that, under the condition of tight conductor coupling, asymmetric coupled lines in an inhomogeneous medium reduce to symmetric coupled lines in a homogeneous medium. |
| doi_str_mv | 10.1109/LMWC.2007.911989 |
| format | Article |
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Research on modeling MIM capacitors in an accurate yet efficient fashion has been around for years. Models for series capacitors of small electrical length have been well established. In the authors' previous work was pioneered the novel approach to modeling shunt capacitors of significant electrical length on multiple grounding vias with the effect of lossy media incorporated. With this in mind, this letter further expands on, and provides a significant supplement with, the previous works. At the core of this letter is to gain an in-depth, theoretical insight into the rationale that, under the condition of tight conductor coupling, asymmetric coupled lines in an inhomogeneous medium reduce to symmetric coupled lines in a homogeneous medium.</description><identifier>ISSN: 1531-1309</identifier><identifier>ISSN: 2771-957X</identifier><identifier>EISSN: 1558-1764</identifier><identifier>EISSN: 2771-9588</identifier><identifier>DOI: 10.1109/LMWC.2007.911989</identifier><identifier>CODEN: IMWCBJ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Asymmetry ; Capacitance ; Capacitors ; Circuit properties ; Conductors ; Conductors (devices) ; Coupling circuits ; Design. Technologies. Operation analysis. Testing ; Electric, optical and optoelectronic circuits ; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics ; Electronics ; Exact sciences and technology ; Gain ; Integrated circuit modeling ; Integrated circuits ; Joining ; Lossy media ; Metal-insulator structures ; Metal-insulator-metal (MIM) capacitor ; Microstrip ; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits ; Microwave integrated circuits ; Microwaves ; MIM capacitors ; MMICs ; Monolithic integrated circuits ; Passive components ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>IEEE microwave and wireless components letters, 2008-01, Vol.18 (1), p.37-39</ispartof><rights>2008 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2008</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c336t-6ff623aab63371620ae9e278e54e1dfa6d95f6a9d5adde7dbf1995da266908a23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4408465$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,777,781,793,4010,27904,27905,27906,54739</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4408465$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=19971895$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Asahara, M.</creatorcontrib><creatorcontrib>Campbell, C.F.</creatorcontrib><creatorcontrib>Frensley, W.R.</creatorcontrib><title>An In-Depth, Theoretical Investigation Into Modeling Metal-Insulator-Metal Capacitors Using Symmetric Coupled Lines in a Homogeneous Medium Model</title><title>IEEE microwave and wireless components letters</title><addtitle>LMWC</addtitle><description>In monolithic microwave integrated circuits (MMIC) design, a metal-insulator-metal (MIM) capacitor is one of the key passive components. Research on modeling MIM capacitors in an accurate yet efficient fashion has been around for years. Models for series capacitors of small electrical length have been well established. In the authors' previous work was pioneered the novel approach to modeling shunt capacitors of significant electrical length on multiple grounding vias with the effect of lossy media incorporated. With this in mind, this letter further expands on, and provides a significant supplement with, the previous works. At the core of this letter is to gain an in-depth, theoretical insight into the rationale that, under the condition of tight conductor coupling, asymmetric coupled lines in an inhomogeneous medium reduce to symmetric coupled lines in a homogeneous medium.</description><subject>Applied sciences</subject><subject>Asymmetry</subject><subject>Capacitance</subject><subject>Capacitors</subject><subject>Circuit properties</subject><subject>Conductors</subject><subject>Conductors (devices)</subject><subject>Coupling circuits</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Gain</subject><subject>Integrated circuit modeling</subject><subject>Integrated circuits</subject><subject>Joining</subject><subject>Lossy media</subject><subject>Metal-insulator structures</subject><subject>Metal-insulator-metal (MIM) capacitor</subject><subject>Microstrip</subject><subject>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</subject><subject>Microwave integrated circuits</subject><subject>Microwaves</subject><subject>MIM capacitors</subject><subject>MMICs</subject><subject>Monolithic integrated circuits</subject><subject>Passive components</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><issn>1531-1309</issn><issn>2771-957X</issn><issn>1558-1764</issn><issn>2771-9588</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kU1v1DAQhiMEEqXljsTFQoJeyGLHH7GPVSh0pV1xoBXHaBpPtq6SONgJUn8G_xinqVqpB0722M-8mtGTZe8Y3TBGzZfd_le1KSgtN4Yxo82L7IhJqXNWKvFyuXOWM07N6-xNjLeUMqEFO8r-ng1kO-RfcZxuPpPLG_QBJ9dAl17_YJzcASbnF2byZO8tdm44kD1O0OXbIc4dTD7k9zWpYITGpTqSq7hgP-_6HqfgGlL5eezQkp0bMBI3ECAXvvcHHNDPMeVZN_dr_kn2qoUu4tuH8zi7-nZ-WV3kux_ft9XZLm84V1Ou2lYVHOBacV4yVVBAg0WpUQpktgVljWwVGCvBWiztdcuMkRYKpQzVUPDj7HTNHYP_PadV697FBrsO7meqdSmp1qKkifz0X5ILWTCuFvDDM_DWz2FIW9RacUlZSXWC6Ao1wccYsK3H4HoIdzWj9aKyXlTWi8p6VZlaPj7kQkxq2gBD4-JTnzEl00Ym7v3KOUR8_BaCaqEk_wfgEqiF</recordid><startdate>200801</startdate><enddate>200801</enddate><creator>Asahara, M.</creator><creator>Campbell, C.F.</creator><creator>Frensley, W.R.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>200801</creationdate><title>An In-Depth, Theoretical Investigation Into Modeling Metal-Insulator-Metal Capacitors Using Symmetric Coupled Lines in a Homogeneous Medium Model</title><author>Asahara, M. ; Campbell, C.F. ; Frensley, W.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c336t-6ff623aab63371620ae9e278e54e1dfa6d95f6a9d5adde7dbf1995da266908a23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Applied sciences</topic><topic>Asymmetry</topic><topic>Capacitance</topic><topic>Capacitors</topic><topic>Circuit properties</topic><topic>Conductors</topic><topic>Conductors (devices)</topic><topic>Coupling circuits</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Gain</topic><topic>Integrated circuit modeling</topic><topic>Integrated circuits</topic><topic>Joining</topic><topic>Lossy media</topic><topic>Metal-insulator structures</topic><topic>Metal-insulator-metal (MIM) capacitor</topic><topic>Microstrip</topic><topic>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</topic><topic>Microwave integrated circuits</topic><topic>Microwaves</topic><topic>MIM capacitors</topic><topic>MMICs</topic><topic>Monolithic integrated circuits</topic><topic>Passive components</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Asahara, M.</creatorcontrib><creatorcontrib>Campbell, C.F.</creatorcontrib><creatorcontrib>Frensley, W.R.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE microwave and wireless components letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Asahara, M.</au><au>Campbell, C.F.</au><au>Frensley, W.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An In-Depth, Theoretical Investigation Into Modeling Metal-Insulator-Metal Capacitors Using Symmetric Coupled Lines in a Homogeneous Medium Model</atitle><jtitle>IEEE microwave and wireless components letters</jtitle><stitle>LMWC</stitle><date>2008-01</date><risdate>2008</risdate><volume>18</volume><issue>1</issue><spage>37</spage><epage>39</epage><pages>37-39</pages><issn>1531-1309</issn><issn>2771-957X</issn><eissn>1558-1764</eissn><eissn>2771-9588</eissn><coden>IMWCBJ</coden><abstract>In monolithic microwave integrated circuits (MMIC) design, a metal-insulator-metal (MIM) capacitor is one of the key passive components. Research on modeling MIM capacitors in an accurate yet efficient fashion has been around for years. Models for series capacitors of small electrical length have been well established. In the authors' previous work was pioneered the novel approach to modeling shunt capacitors of significant electrical length on multiple grounding vias with the effect of lossy media incorporated. With this in mind, this letter further expands on, and provides a significant supplement with, the previous works. At the core of this letter is to gain an in-depth, theoretical insight into the rationale that, under the condition of tight conductor coupling, asymmetric coupled lines in an inhomogeneous medium reduce to symmetric coupled lines in a homogeneous medium.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/LMWC.2007.911989</doi><tpages>3</tpages></addata></record> |
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| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Asymmetry Capacitance Capacitors Circuit properties Conductors Conductors (devices) Coupling circuits Design. Technologies. Operation analysis. Testing Electric, optical and optoelectronic circuits Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Exact sciences and technology Gain Integrated circuit modeling Integrated circuits Joining Lossy media Metal-insulator structures Metal-insulator-metal (MIM) capacitor Microstrip Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits Microwave integrated circuits Microwaves MIM capacitors MMICs Monolithic integrated circuits Passive components Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
| title | An In-Depth, Theoretical Investigation Into Modeling Metal-Insulator-Metal Capacitors Using Symmetric Coupled Lines in a Homogeneous Medium Model |
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