Stable extraction of linearity (V/sub IP3/) for nanoscale RF CMOS devices

Stable extraction of linearity (V/sub IP3/) for nanoscale RF CMOS devices

We have proposed an improved and stable algorithm for linearity (V/sub IP3/) extraction by setting an optimized measurement node interval. This algorithm, considering the accuracy of measurement appliances, provides less noisy V/sub IP3/ without loss of details. Adopting it, V/sub IP3/ can be derive...

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Veröffentlicht in:IEEE microwave and wireless components letters 2004-02, Vol.14 (2), p.83-85
Hauptverfasser: WOO YOUNG CHOI, BYUNG YONG CHOI, WOO, Dong-Soo, JONG DUK LEE, PARK, Byung-Gook
Format: Artikel
Sprache:eng
Schlagworte:
Algorithms
Applied sciences
Capacitance measurement
CMOS
Data mining
Distortion measurement
Electronics
Exact sciences and technology
Extraction
Home appliances
Linearity
Loss measurement
Microwaves
Molecular electronics, nanoelectronics
Nanocomposites
Nanoscale devices
Nanostructure
Noise measurement
Radio frequencies
Radio frequency
Semiconductor device noise
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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Zusammenfassung:We have proposed an improved and stable algorithm for linearity (V/sub IP3/) extraction by setting an optimized measurement node interval. This algorithm, considering the accuracy of measurement appliances, provides less noisy V/sub IP3/ without loss of details. Adopting it, V/sub IP3/ can be derived satisfying 1% error criterion. Accurate V/sub IP3/ extraction can be a strong help in CMOS performance analysis for the RF applications. Measurements were carried out on a nMOSFET.
ISSN:1531-1309
2771-957X
1558-1764
2771-9588
DOI:10.1109/LMWC.2003.818527