Open Challenges for Probabilistic Measurement-Based Worst-Case Execution Time
The worst-case execution time (WCET) is a critical parameter describing the largest value for the execution time of programs. Even though such a parameter is very hard to attain, it is essential as part of guaranteeing a real-time system meets its timing requirements. The complexity of modern hardwa...
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Veröffentlicht in: | IEEE embedded systems letters 2017-09, Vol.9 (3), p.69-72 |
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creator | Jimenez Gil, Samuel Bate, Iain Lima, George Santinelli, Luca Gogonel, Adriana Cucu-Grosjean, Liliana |
description | The worst-case execution time (WCET) is a critical parameter describing the largest value for the execution time of programs. Even though such a parameter is very hard to attain, it is essential as part of guaranteeing a real-time system meets its timing requirements. The complexity of modern hardware has increased the challenges of statically analyzing the WCET and reduced the reliability of purely measuring the WCET. This has led to the emergence of probabilistic WCETs (pWCETs) analysis as a viable technique. The low probability of appearance of large execution times of a program has motivated the utilization of rare events theory like extreme value theory (EVT). As pWCET estimation based on EVT has matured as a discipline, a number of open challenges have become apparent when applying the existing approaches. This letter enumerates key challenges while establishing a state of the art of EVT-based pWCET estimation methods. |
doi_str_mv | 10.1109/LES.2017.2712858 |
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fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_LES_2017_2712858</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>7942057</ieee_id><sourcerecordid>1934543114</sourcerecordid><originalsourceid>FETCH-LOGICAL-c367t-28708836c5adcbac1f6d82911d21382b7f1b0ab4aa2ccb7b3a6a7831abec4d2b3</originalsourceid><addsrcrecordid>eNo9kMFLwzAUxosoOHR3wUvBk4fOvCRt0uMs0wkdE5x4DEmaakbXzqQV_e_N6Ni7vMfj9318fFF0A2gGgPKHcvE2wwjYDDPAPOVn0QRyShKUMTg_3Rm5jKbeb1GYlLKUpJNotd6bNi6-ZNOY9tP4uO5c_Oo6JZVtrO-tjldG-sGZnWn75FF6U8UfnfN9UoQ7XvwaPfS2a-ON3Znr6KKWjTfT476K3p8Wm2KZlOvnl2JeJppkrE8wZ4hzkulUVlpJDXVWcZwDVBgIx4rVoJBUVEqstWKKyEwyTkAqo2mFFbmK7kffkFvsnd1J9yc6acVyXorDD0FGCEf4BwJ7N7J7130Pxvdi2w2uDfEE5ISmlADQQKGR0q7z3pn6ZAtIHDoWoWNx6FgcOw6S21FijTEnnOUUo5SRf2R8doM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1934543114</pqid></control><display><type>article</type><title>Open Challenges for Probabilistic Measurement-Based Worst-Case Execution Time</title><source>IEEE Electronic Library (IEL)</source><creator>Jimenez Gil, Samuel ; Bate, Iain ; Lima, George ; Santinelli, Luca ; Gogonel, Adriana ; Cucu-Grosjean, Liliana</creator><creatorcontrib>Jimenez Gil, Samuel ; Bate, Iain ; Lima, George ; Santinelli, Luca ; Gogonel, Adriana ; Cucu-Grosjean, Liliana</creatorcontrib><description>The worst-case execution time (WCET) is a critical parameter describing the largest value for the execution time of programs. Even though such a parameter is very hard to attain, it is essential as part of guaranteeing a real-time system meets its timing requirements. The complexity of modern hardware has increased the challenges of statically analyzing the WCET and reduced the reliability of purely measuring the WCET. This has led to the emergence of probabilistic WCETs (pWCETs) analysis as a viable technique. The low probability of appearance of large execution times of a program has motivated the utilization of rare events theory like extreme value theory (EVT). As pWCET estimation based on EVT has matured as a discipline, a number of open challenges have become apparent when applying the existing approaches. This letter enumerates key challenges while establishing a state of the art of EVT-based pWCET estimation methods.</description><identifier>ISSN: 1943-0663</identifier><identifier>EISSN: 1943-0671</identifier><identifier>DOI: 10.1109/LES.2017.2712858</identifier><identifier>CODEN: ESLMAP</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Computer Science ; Embedded software ; Estimation ; Extreme value theory ; Probabilistic logic ; Protocols ; real-time systems ; Reliability ; Reliability analysis ; Simulation ; statistical distributions ; Testing ; Timing</subject><ispartof>IEEE embedded systems letters, 2017-09, Vol.9 (3), p.69-72</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2017</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c367t-28708836c5adcbac1f6d82911d21382b7f1b0ab4aa2ccb7b3a6a7831abec4d2b3</citedby><cites>FETCH-LOGICAL-c367t-28708836c5adcbac1f6d82911d21382b7f1b0ab4aa2ccb7b3a6a7831abec4d2b3</cites><orcidid>0000-0003-2415-8219</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7942057$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,314,780,784,796,885,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7942057$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttps://hal.science/hal-01633802$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Jimenez Gil, Samuel</creatorcontrib><creatorcontrib>Bate, Iain</creatorcontrib><creatorcontrib>Lima, George</creatorcontrib><creatorcontrib>Santinelli, Luca</creatorcontrib><creatorcontrib>Gogonel, Adriana</creatorcontrib><creatorcontrib>Cucu-Grosjean, Liliana</creatorcontrib><title>Open Challenges for Probabilistic Measurement-Based Worst-Case Execution Time</title><title>IEEE embedded systems letters</title><addtitle>LES</addtitle><description>The worst-case execution time (WCET) is a critical parameter describing the largest value for the execution time of programs. Even though such a parameter is very hard to attain, it is essential as part of guaranteeing a real-time system meets its timing requirements. The complexity of modern hardware has increased the challenges of statically analyzing the WCET and reduced the reliability of purely measuring the WCET. This has led to the emergence of probabilistic WCETs (pWCETs) analysis as a viable technique. The low probability of appearance of large execution times of a program has motivated the utilization of rare events theory like extreme value theory (EVT). As pWCET estimation based on EVT has matured as a discipline, a number of open challenges have become apparent when applying the existing approaches. This letter enumerates key challenges while establishing a state of the art of EVT-based pWCET estimation methods.</description><subject>Computer Science</subject><subject>Embedded software</subject><subject>Estimation</subject><subject>Extreme value theory</subject><subject>Probabilistic logic</subject><subject>Protocols</subject><subject>real-time systems</subject><subject>Reliability</subject><subject>Reliability analysis</subject><subject>Simulation</subject><subject>statistical distributions</subject><subject>Testing</subject><subject>Timing</subject><issn>1943-0663</issn><issn>1943-0671</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kMFLwzAUxosoOHR3wUvBk4fOvCRt0uMs0wkdE5x4DEmaakbXzqQV_e_N6Ni7vMfj9318fFF0A2gGgPKHcvE2wwjYDDPAPOVn0QRyShKUMTg_3Rm5jKbeb1GYlLKUpJNotd6bNi6-ZNOY9tP4uO5c_Oo6JZVtrO-tjldG-sGZnWn75FF6U8UfnfN9UoQ7XvwaPfS2a-ON3Znr6KKWjTfT476K3p8Wm2KZlOvnl2JeJppkrE8wZ4hzkulUVlpJDXVWcZwDVBgIx4rVoJBUVEqstWKKyEwyTkAqo2mFFbmK7kffkFvsnd1J9yc6acVyXorDD0FGCEf4BwJ7N7J7130Pxvdi2w2uDfEE5ISmlADQQKGR0q7z3pn6ZAtIHDoWoWNx6FgcOw6S21FijTEnnOUUo5SRf2R8doM</recordid><startdate>20170901</startdate><enddate>20170901</enddate><creator>Jimenez Gil, Samuel</creator><creator>Bate, Iain</creator><creator>Lima, George</creator><creator>Santinelli, Luca</creator><creator>Gogonel, Adriana</creator><creator>Cucu-Grosjean, Liliana</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><general>Institute of Electrical and Electronics Engineers</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>1XC</scope><scope>VOOES</scope><orcidid>https://orcid.org/0000-0003-2415-8219</orcidid></search><sort><creationdate>20170901</creationdate><title>Open Challenges for Probabilistic Measurement-Based Worst-Case Execution Time</title><author>Jimenez Gil, Samuel ; Bate, Iain ; Lima, George ; Santinelli, Luca ; Gogonel, Adriana ; Cucu-Grosjean, Liliana</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c367t-28708836c5adcbac1f6d82911d21382b7f1b0ab4aa2ccb7b3a6a7831abec4d2b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Computer Science</topic><topic>Embedded software</topic><topic>Estimation</topic><topic>Extreme value theory</topic><topic>Probabilistic logic</topic><topic>Protocols</topic><topic>real-time systems</topic><topic>Reliability</topic><topic>Reliability analysis</topic><topic>Simulation</topic><topic>statistical distributions</topic><topic>Testing</topic><topic>Timing</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jimenez Gil, Samuel</creatorcontrib><creatorcontrib>Bate, Iain</creatorcontrib><creatorcontrib>Lima, George</creatorcontrib><creatorcontrib>Santinelli, Luca</creatorcontrib><creatorcontrib>Gogonel, Adriana</creatorcontrib><creatorcontrib>Cucu-Grosjean, Liliana</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>Hyper Article en Ligne (HAL) (Open Access)</collection><jtitle>IEEE embedded systems letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jimenez Gil, Samuel</au><au>Bate, Iain</au><au>Lima, George</au><au>Santinelli, Luca</au><au>Gogonel, Adriana</au><au>Cucu-Grosjean, Liliana</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Open Challenges for Probabilistic Measurement-Based Worst-Case Execution Time</atitle><jtitle>IEEE embedded systems letters</jtitle><stitle>LES</stitle><date>2017-09-01</date><risdate>2017</risdate><volume>9</volume><issue>3</issue><spage>69</spage><epage>72</epage><pages>69-72</pages><issn>1943-0663</issn><eissn>1943-0671</eissn><coden>ESLMAP</coden><abstract>The worst-case execution time (WCET) is a critical parameter describing the largest value for the execution time of programs. Even though such a parameter is very hard to attain, it is essential as part of guaranteeing a real-time system meets its timing requirements. The complexity of modern hardware has increased the challenges of statically analyzing the WCET and reduced the reliability of purely measuring the WCET. This has led to the emergence of probabilistic WCETs (pWCETs) analysis as a viable technique. The low probability of appearance of large execution times of a program has motivated the utilization of rare events theory like extreme value theory (EVT). As pWCET estimation based on EVT has matured as a discipline, a number of open challenges have become apparent when applying the existing approaches. This letter enumerates key challenges while establishing a state of the art of EVT-based pWCET estimation methods.</abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/LES.2017.2712858</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0003-2415-8219</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Computer Science Embedded software Estimation Extreme value theory Probabilistic logic Protocols real-time systems Reliability Reliability analysis Simulation statistical distributions Testing Timing |
title | Open Challenges for Probabilistic Measurement-Based Worst-Case Execution Time |
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