Overestimating the Performance of Photon Ultraviolet Detectors
Over the past few years, the available literature shows signaled great progress in improving the performance of ultraviolet detectors, even exceeding the physical limit of detection determined by signal fluctuations. This is particularly true for Ga 2 O 3 phototransistors and a new generation of pho...
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| Veröffentlicht in: | IEEE electron device letters 2023-05, Vol.44 (5), p.1-1 |
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| container_title | IEEE electron device letters |
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| creator | Rogalski, A. |
| description | Over the past few years, the available literature shows signaled great progress in improving the performance of ultraviolet detectors, even exceeding the physical limit of detection determined by signal fluctuations. This is particularly true for Ga 2 O 3 phototransistors and a new generation of photodetectors with active areas containing low-dimensional solids. The purpose of this paper is to show cases of overestimation of the performance of ultraviolet detectors noted by the author and to draw attention to their fundamental physical limitations which are overlooked in the characterization of detectors. |
| doi_str_mv | 10.1109/LED.2023.3262000 |
| format | Article |
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The purpose of this paper is to show cases of overestimation of the performance of ultraviolet detectors noted by the author and to draw attention to their fundamental physical limitations which are overlooked in the characterization of detectors.</description><subject>BLIP limit</subject><subject>Detectors</subject><subject>Gallium oxides</subject><subject>II-VI semiconductor materials</subject><subject>Photodetectors</subject><subject>photogating effect</subject><subject>Photonics</subject><subject>Phototransistors</subject><subject>signal fluctuation limit</subject><subject>Ultraviolet detectors</subject><subject>ultraviolet photodetectors</subject><subject>Wide band gap semiconductors</subject><subject>Zinc oxide</subject><issn>0741-3106</issn><issn>1558-0563</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkD1PwzAQhi0EEqWwMzBEYk6581fsBQm15UOq1A50thLHoanauNhuJf49Ke3AdMv73L33EHKPMEIE_TSbTkYUKBsxKikAXJABCqFyEJJdkgEUHHOGIK_JTYxrAOS84APyPD-44GJqt2Vqu68srVy2cKHxYVt21mW-yRYrn3yXLTcplIfWb1zKJi45m3yIt-SqKTfR3Z3nkCxfp5_j93w2f_sYv8xySzVNeYUWqa4LRS21FmtdMaWl04WsaG2bsi9cSVqXXCGXQmhBy1pBgVz3UFNwNiSPp7274L_3fV-z9vvQ9ScNVSApFuwvBaeUDT7G4BqzC_1j4ccgmKMl01syR0vmbKlHHk5I65z7FwclBUP2Cz_WYhU</recordid><startdate>20230501</startdate><enddate>20230501</enddate><creator>Rogalski, A.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | BLIP limit Detectors Gallium oxides II-VI semiconductor materials Photodetectors photogating effect Photonics Phototransistors signal fluctuation limit Ultraviolet detectors ultraviolet photodetectors Wide band gap semiconductors Zinc oxide |
| title | Overestimating the Performance of Photon Ultraviolet Detectors |
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