Complementary Strained Si GAA Nanowire TFET Inverter With Suppressed Ambipolarity
In this letter, we present complementary tunneling field-effect transistors (CTFETs) based on strained Si with gate all around nanowire structures on a single chip. The main focus is to suppress the ambipolar behavior of the TFETs with a gate-drain underlap. Detailed device characterization and demo...
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Veröffentlicht in: | IEEE electron device letters 2016-08, Vol.37 (8), p.950-953 |
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creator | Luong, G. V. Narimani, K. Tiedemann, A. T. Bernardy, P. Trellenkamp, S. Zhao, Q. T. Mantl, S. |
description | In this letter, we present complementary tunneling field-effect transistors (CTFETs) based on strained Si with gate all around nanowire structures on a single chip. The main focus is to suppress the ambipolar behavior of the TFETs with a gate-drain underlap. Detailed device characterization and demonstration of a CTFET inverter show that the ambipolar current is successfully eliminated for both pand n-devices. The CTFET inverter transfer characteristics indicate maximum separation of the high/low level with a sharp transition (high voltage gain) at a Vdd down to 0.4 V. In addition, high noise margin levels of 40% of the applied Vdd are obtained. |
doi_str_mv | 10.1109/LED.2016.2582041 |
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V. ; Narimani, K. ; Tiedemann, A. T. ; Bernardy, P. ; Trellenkamp, S. ; Zhao, Q. T. ; Mantl, S.</creator><creatorcontrib>Luong, G. V. ; Narimani, K. ; Tiedemann, A. T. ; Bernardy, P. ; Trellenkamp, S. ; Zhao, Q. T. ; Mantl, S.</creatorcontrib><description>In this letter, we present complementary tunneling field-effect transistors (CTFETs) based on strained Si with gate all around nanowire structures on a single chip. The main focus is to suppress the ambipolar behavior of the TFETs with a gate-drain underlap. Detailed device characterization and demonstration of a CTFET inverter show that the ambipolar current is successfully eliminated for both pand n-devices. The CTFET inverter transfer characteristics indicate maximum separation of the high/low level with a sharp transition (high voltage gain) at a Vdd down to 0.4 V. 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(IEEE) 2016</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c394t-50af490f6852f121abce1f4b4063b9a7f7d2d5c845c77259e2d792d5ea5c99233</citedby><cites>FETCH-LOGICAL-c394t-50af490f6852f121abce1f4b4063b9a7f7d2d5c845c77259e2d792d5ea5c99233</cites><orcidid>0000-0001-8690-725X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7493630$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7493630$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Luong, G. V.</creatorcontrib><creatorcontrib>Narimani, K.</creatorcontrib><creatorcontrib>Tiedemann, A. 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In addition, high noise margin levels of 40% of the applied Vdd are obtained.</description><subject>ambipolar behavior</subject><subject>CTFET</subject><subject>Devices</subject><subject>Gain</subject><subject>Gates</subject><subject>High voltages</subject><subject>inverter</subject><subject>Inverters</subject><subject>Junctions</subject><subject>Logic gates</subject><subject>Low level</subject><subject>Nanowires</subject><subject>Silicides</subject><subject>Silicon</subject><subject>Silicon nanowire</subject><subject>TFETs</subject><subject>Tunneling</subject><subject>tunneling FET</subject><issn>0741-3106</issn><issn>1558-0563</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkD1LA0EQQBdRMEZ7webAxubi7PdtGWKMQlAkEctjc5nDDffl7kXJv3dDgoXVwPDeMDxCrimMKAVzP58-jBhQNWIyYyDoCRlQKbMUpOKnZABa0JRTUOfkIoQNABVCiwF5m7R1V2GNTW_9Lln03roG18nCJbPxOHmxTfvjPCbLx-kyeW6-0ffokw_XfyaLbdd5DCHS43rluray3vW7S3JW2irg1XEOyXt0J0_p_HX2PBnP04Ib0acSbCkMlCqTrKSM2lWBtBQrAYqvjNWlXrO1LDIhC62ZNMjW2sQNWlkYwzgfkrvD3c63X1sMfV67UGBV2QbbbchpxqWCTCoZ0dt_6Kbd-iZ-FylQIgOa6UjBgSp8G4LHMu-8q2OVnEK-b5zHxvm-cX5sHJWbg-IQ8Q_XwnDFgf8CKiZ2Hg</recordid><startdate>201608</startdate><enddate>201608</enddate><creator>Luong, G. V.</creator><creator>Narimani, K.</creator><creator>Tiedemann, A. T.</creator><creator>Bernardy, P.</creator><creator>Trellenkamp, S.</creator><creator>Zhao, Q. T.</creator><creator>Mantl, S.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope><orcidid>https://orcid.org/0000-0001-8690-725X</orcidid></search><sort><creationdate>201608</creationdate><title>Complementary Strained Si GAA Nanowire TFET Inverter With Suppressed Ambipolarity</title><author>Luong, G. V. ; Narimani, K. ; Tiedemann, A. T. ; Bernardy, P. ; Trellenkamp, S. ; Zhao, Q. 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T.</creatorcontrib><creatorcontrib>Bernardy, P.</creatorcontrib><creatorcontrib>Trellenkamp, S.</creatorcontrib><creatorcontrib>Zhao, Q. T.</creatorcontrib><creatorcontrib>Mantl, S.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE electron device letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Luong, G. V.</au><au>Narimani, K.</au><au>Tiedemann, A. T.</au><au>Bernardy, P.</au><au>Trellenkamp, S.</au><au>Zhao, Q. T.</au><au>Mantl, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Complementary Strained Si GAA Nanowire TFET Inverter With Suppressed Ambipolarity</atitle><jtitle>IEEE electron device letters</jtitle><stitle>LED</stitle><date>2016-08</date><risdate>2016</risdate><volume>37</volume><issue>8</issue><spage>950</spage><epage>953</epage><pages>950-953</pages><issn>0741-3106</issn><eissn>1558-0563</eissn><coden>EDLEDZ</coden><abstract>In this letter, we present complementary tunneling field-effect transistors (CTFETs) based on strained Si with gate all around nanowire structures on a single chip. The main focus is to suppress the ambipolar behavior of the TFETs with a gate-drain underlap. Detailed device characterization and demonstration of a CTFET inverter show that the ambipolar current is successfully eliminated for both pand n-devices. The CTFET inverter transfer characteristics indicate maximum separation of the high/low level with a sharp transition (high voltage gain) at a Vdd down to 0.4 V. In addition, high noise margin levels of 40% of the applied Vdd are obtained.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/LED.2016.2582041</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0001-8690-725X</orcidid></addata></record> |
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subjects | ambipolar behavior CTFET Devices Gain Gates High voltages inverter Inverters Junctions Logic gates Low level Nanowires Silicides Silicon Silicon nanowire TFETs Tunneling tunneling FET |
title | Complementary Strained Si GAA Nanowire TFET Inverter With Suppressed Ambipolarity |
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