Ambipolar Black Phosphorus MOSFETs With Record n-Channel Transconductance

Ambipolar black phosphorus MOSFETs with record n-channel extrinsic transconductance are reported. The devices consist of multilayer black phosphorus aligned to a local back-gate electrode with 10-nm-thick HfO 2 gate dielectric. Before passivation, devices with 0.3-μm gate length behaved as p-MOSFETs...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE electron device letters 2016-01, Vol.37 (1), p.103-106
Hauptverfasser: Haratipour, Nazila, Koester, Steven J.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 106
container_issue 1
container_start_page 103
container_title IEEE electron device letters
container_volume 37
creator Haratipour, Nazila
Koester, Steven J.
description Ambipolar black phosphorus MOSFETs with record n-channel extrinsic transconductance are reported. The devices consist of multilayer black phosphorus aligned to a local back-gate electrode with 10-nm-thick HfO 2 gate dielectric. Before passivation, devices with 0.3-μm gate length behaved as p-MOSFETs with peak extrinsic transconductance, g m , of 282 μS/μm at V DS = -2 V. After passivation, the same devices displayed the ambipolar behavior, and when tested as n-MOSFETs, had peak g m = 66 μS/μm at V DS = +2 V, and similar devices on the same wafer had g m as high as 80 μS/μm. These results are an important step toward the realization of high-performance black phosphorus complementary logic circuits.
doi_str_mv 10.1109/LED.2015.2499209
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_LED_2015_2499209</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>7323815</ieee_id><sourcerecordid>3905858091</sourcerecordid><originalsourceid>FETCH-LOGICAL-c324t-a01d7a904521e52e629ca503f483d07cf3cc02bc8daa302ac4641350c2d5f7733</originalsourceid><addsrcrecordid>eNpdkD1PwzAQQC0EEqWwI7FEYmFJOX_F8VhK-ZCKiqCI0XIdR0lJ42AnA_8eV60YmG557-70ELrEMMEY5O1ifj8hgPmEMCkJyCM0wpznKfCMHqMRCIZTiiE7RWchbAAwY4KN0PN0u64712if3DXafCWvlQtd5fwQkpfl-8N8FZLPuq-SN2ucL5I2nVW6bW2TrLxug3FtMZhet8aeo5NSN8FeHOYYfUR79pQulo_Ps-kiNZSwPtWAC6ElME6w5cRmRBrNgZYspwUIU1JjgKxNXmhNgWjDMoYpB0MKXgpB6Rjd7Pd23n0PNvRqWwdjm0a31g1BYSEpoZIwEdHrf-jGDb6N30WKEwDBIYsU7CnjXQjelqrz9Vb7H4VB7dqq2Fbt2qpD26hc7ZXaWvuHi3g3x5z-Aoygctg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1752007506</pqid></control><display><type>article</type><title>Ambipolar Black Phosphorus MOSFETs With Record n-Channel Transconductance</title><source>IEEE Electronic Library (IEL)</source><creator>Haratipour, Nazila ; Koester, Steven J.</creator><creatorcontrib>Haratipour, Nazila ; Koester, Steven J.</creatorcontrib><description>Ambipolar black phosphorus MOSFETs with record n-channel extrinsic transconductance are reported. The devices consist of multilayer black phosphorus aligned to a local back-gate electrode with 10-nm-thick HfO 2 gate dielectric. Before passivation, devices with 0.3-μm gate length behaved as p-MOSFETs with peak extrinsic transconductance, g m , of 282 μS/μm at V DS = -2 V. After passivation, the same devices displayed the ambipolar behavior, and when tested as n-MOSFETs, had peak g m = 66 μS/μm at V DS = +2 V, and similar devices on the same wafer had g m as high as 80 μS/μm. These results are an important step toward the realization of high-performance black phosphorus complementary logic circuits.</description><identifier>ISSN: 0741-3106</identifier><identifier>EISSN: 1558-0563</identifier><identifier>DOI: 10.1109/LED.2015.2499209</identifier><identifier>CODEN: EDLEDZ</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Devices ; Dielectrics ; Electrodes ; Gates ; Hafnium oxide ; Logic gates ; MOSFET ; MOSFET circuits ; MOSFETs ; Passivation ; Phosphorus ; Transconductance</subject><ispartof>IEEE electron device letters, 2016-01, Vol.37 (1), p.103-106</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c324t-a01d7a904521e52e629ca503f483d07cf3cc02bc8daa302ac4641350c2d5f7733</citedby><cites>FETCH-LOGICAL-c324t-a01d7a904521e52e629ca503f483d07cf3cc02bc8daa302ac4641350c2d5f7733</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7323815$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7323815$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Haratipour, Nazila</creatorcontrib><creatorcontrib>Koester, Steven J.</creatorcontrib><title>Ambipolar Black Phosphorus MOSFETs With Record n-Channel Transconductance</title><title>IEEE electron device letters</title><addtitle>LED</addtitle><description>Ambipolar black phosphorus MOSFETs with record n-channel extrinsic transconductance are reported. The devices consist of multilayer black phosphorus aligned to a local back-gate electrode with 10-nm-thick HfO 2 gate dielectric. Before passivation, devices with 0.3-μm gate length behaved as p-MOSFETs with peak extrinsic transconductance, g m , of 282 μS/μm at V DS = -2 V. After passivation, the same devices displayed the ambipolar behavior, and when tested as n-MOSFETs, had peak g m = 66 μS/μm at V DS = +2 V, and similar devices on the same wafer had g m as high as 80 μS/μm. These results are an important step toward the realization of high-performance black phosphorus complementary logic circuits.</description><subject>Devices</subject><subject>Dielectrics</subject><subject>Electrodes</subject><subject>Gates</subject><subject>Hafnium oxide</subject><subject>Logic gates</subject><subject>MOSFET</subject><subject>MOSFET circuits</subject><subject>MOSFETs</subject><subject>Passivation</subject><subject>Phosphorus</subject><subject>Transconductance</subject><issn>0741-3106</issn><issn>1558-0563</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkD1PwzAQQC0EEqWwI7FEYmFJOX_F8VhK-ZCKiqCI0XIdR0lJ42AnA_8eV60YmG557-70ELrEMMEY5O1ifj8hgPmEMCkJyCM0wpznKfCMHqMRCIZTiiE7RWchbAAwY4KN0PN0u64712if3DXafCWvlQtd5fwQkpfl-8N8FZLPuq-SN2ucL5I2nVW6bW2TrLxug3FtMZhet8aeo5NSN8FeHOYYfUR79pQulo_Ps-kiNZSwPtWAC6ElME6w5cRmRBrNgZYspwUIU1JjgKxNXmhNgWjDMoYpB0MKXgpB6Rjd7Pd23n0PNvRqWwdjm0a31g1BYSEpoZIwEdHrf-jGDb6N30WKEwDBIYsU7CnjXQjelqrz9Vb7H4VB7dqq2Fbt2qpD26hc7ZXaWvuHi3g3x5z-Aoygctg</recordid><startdate>201601</startdate><enddate>201601</enddate><creator>Haratipour, Nazila</creator><creator>Koester, Steven J.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>201601</creationdate><title>Ambipolar Black Phosphorus MOSFETs With Record n-Channel Transconductance</title><author>Haratipour, Nazila ; Koester, Steven J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c324t-a01d7a904521e52e629ca503f483d07cf3cc02bc8daa302ac4641350c2d5f7733</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Devices</topic><topic>Dielectrics</topic><topic>Electrodes</topic><topic>Gates</topic><topic>Hafnium oxide</topic><topic>Logic gates</topic><topic>MOSFET</topic><topic>MOSFET circuits</topic><topic>MOSFETs</topic><topic>Passivation</topic><topic>Phosphorus</topic><topic>Transconductance</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Haratipour, Nazila</creatorcontrib><creatorcontrib>Koester, Steven J.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE electron device letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Haratipour, Nazila</au><au>Koester, Steven J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Ambipolar Black Phosphorus MOSFETs With Record n-Channel Transconductance</atitle><jtitle>IEEE electron device letters</jtitle><stitle>LED</stitle><date>2016-01</date><risdate>2016</risdate><volume>37</volume><issue>1</issue><spage>103</spage><epage>106</epage><pages>103-106</pages><issn>0741-3106</issn><eissn>1558-0563</eissn><coden>EDLEDZ</coden><abstract>Ambipolar black phosphorus MOSFETs with record n-channel extrinsic transconductance are reported. The devices consist of multilayer black phosphorus aligned to a local back-gate electrode with 10-nm-thick HfO 2 gate dielectric. Before passivation, devices with 0.3-μm gate length behaved as p-MOSFETs with peak extrinsic transconductance, g m , of 282 μS/μm at V DS = -2 V. After passivation, the same devices displayed the ambipolar behavior, and when tested as n-MOSFETs, had peak g m = 66 μS/μm at V DS = +2 V, and similar devices on the same wafer had g m as high as 80 μS/μm. These results are an important step toward the realization of high-performance black phosphorus complementary logic circuits.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/LED.2015.2499209</doi><tpages>4</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0741-3106
ispartof IEEE electron device letters, 2016-01, Vol.37 (1), p.103-106
issn 0741-3106
1558-0563
language eng
recordid cdi_crossref_primary_10_1109_LED_2015_2499209
source IEEE Electronic Library (IEL)
subjects Devices
Dielectrics
Electrodes
Gates
Hafnium oxide
Logic gates
MOSFET
MOSFET circuits
MOSFETs
Passivation
Phosphorus
Transconductance
title Ambipolar Black Phosphorus MOSFETs With Record n-Channel Transconductance
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T20%3A16%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Ambipolar%20Black%20Phosphorus%20MOSFETs%20With%20Record%20n-Channel%20Transconductance&rft.jtitle=IEEE%20electron%20device%20letters&rft.au=Haratipour,%20Nazila&rft.date=2016-01&rft.volume=37&rft.issue=1&rft.spage=103&rft.epage=106&rft.pages=103-106&rft.issn=0741-3106&rft.eissn=1558-0563&rft.coden=EDLEDZ&rft_id=info:doi/10.1109/LED.2015.2499209&rft_dat=%3Cproquest_RIE%3E3905858091%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1752007506&rft_id=info:pmid/&rft_ieee_id=7323815&rfr_iscdi=true