Analytical Cell-Based Model for the Breakdown Statistics of Multilayer Insulator Stacks

A fully analytical cell-based model is proposed to describe the breakdown (BD) statistics of multiple-layer insulator stacks. The model is shown to be completely equivalent to the full percolation model by comparing with recently published kinetic Monte Carlo simulations. The role of an initial dens...

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Veröffentlicht in:	IEEE electron device letters 2009-12, Vol.30 (12), p.1359-1361
Hauptverfasser:	Sune, J., Tous, S., Wu, E.Y.
Format:	Artikel
Sprache:	eng
Schlagworte:	Analytical models Applied sciences Breakdown Compound structure devices Computer simulation Density Dielectric breakdown (BD) Dielectric substrates Electric breakdown Electronics Exact sciences and technology High K dielectric materials Insulation Insulators Kinetic theory Mathematical analysis Mathematical models Microelectronics MOS devices Nonhomogeneous media reliability theory Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Stacks Statistical analysis Statistics
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