Quantum Size Effects on Dielectric Constants and Optical Absorption of Ultrathin Silicon Films

The size dependence of the dielectric constants and optical absorption for silicon nanostructured films are investigated using density-functional theory. A critical thickness of 4.3 nm is observed for Si (100)-oriented thin films. Within this critical thickness, the dielectric function and optical a...

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Veröffentlicht in:	IEEE electron device letters 2008-12, Vol.29 (12), p.1302-1305
Hauptverfasser:	GANG ZHANG, YU, Ming-Bin, TUNG, Chih-Hang, LO, Guo-Qiang
Format:	Artikel
Sprache:	eng
Schlagworte:	Absorption Applied sciences Circuit properties Dielectric constant Dielectric thin films Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Film thickness Integrated optics. Optical fibers and wave guides Nanocomposites Nanomaterials Nanostructure Nanotechnology Optical and optoelectronic circuits Optical films Optical refraction Optical superlattices Optical variables control Optoelectronic devices Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Semiconductor films Semiconductor thin films Silicon Silicon films Thin films
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