Properties of Surface Metal Micromachined Rectangular Waveguide Operating Near 3 THz
Single-mode TE10 rectangular waveguides operating near 3 THz have been demonstrated. The waveguides have internal dimensions of 75 μm × 37 μm (WR-0.3) and are fabricated using an additive gold electroplating process on a silicon substrate. The impact of photoresist removal holes was minimized by ful...
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Veröffentlicht in: | IEEE journal of selected topics in quantum electronics 2011-01, Vol.17 (1), p.130-137 |
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creator | Nordquist, C D Wanke, M C Rowen, A M Arrington, C L Grine, A D Fuller, C T |
description | Single-mode TE10 rectangular waveguides operating near 3 THz have been demonstrated. The waveguides have internal dimensions of 75 μm × 37 μm (WR-0.3) and are fabricated using an additive gold electroplating process on a silicon substrate. The impact of photoresist removal holes was minimized by full-wave design of the hole and matching structures. Waveguides were measured at three frequencies from 2.56 to 3.11 THz and demonstrated loss as low as 1.3 dB/mm at 3.11 THz, corresponding to a loss per wavelength of 0.12 dB/λ. This paper summarizes the design, fabrication, and measurement of these micromachined waveguides operating near 3 THz. |
doi_str_mv | 10.1109/JSTQE.2010.2049095 |
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The waveguides have internal dimensions of 75 μm × 37 μm (WR-0.3) and are fabricated using an additive gold electroplating process on a silicon substrate. The impact of photoresist removal holes was minimized by full-wave design of the hole and matching structures. Waveguides were measured at three frequencies from 2.56 to 3.11 THz and demonstrated loss as low as 1.3 dB/mm at 3.11 THz, corresponding to a loss per wavelength of 0.12 dB/λ. 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(IEEE) Jan/Feb 2011</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c393t-e170aaf4518776da5d6c94b48b4536b53705d9420229e1b0a78a7e990ad9d5253</citedby><cites>FETCH-LOGICAL-c393t-e170aaf4518776da5d6c94b48b4536b53705d9420229e1b0a78a7e990ad9d5253</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5497065$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5497065$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Nordquist, C D</creatorcontrib><creatorcontrib>Wanke, M C</creatorcontrib><creatorcontrib>Rowen, A M</creatorcontrib><creatorcontrib>Arrington, C L</creatorcontrib><creatorcontrib>Grine, A D</creatorcontrib><creatorcontrib>Fuller, C T</creatorcontrib><title>Properties of Surface Metal Micromachined Rectangular Waveguide Operating Near 3 THz</title><title>IEEE journal of selected topics in quantum electronics</title><addtitle>JSTQE</addtitle><description>Single-mode TE10 rectangular waveguides operating near 3 THz have been demonstrated. The waveguides have internal dimensions of 75 μm × 37 μm (WR-0.3) and are fabricated using an additive gold electroplating process on a silicon substrate. The impact of photoresist removal holes was minimized by full-wave design of the hole and matching structures. Waveguides were measured at three frequencies from 2.56 to 3.11 THz and demonstrated loss as low as 1.3 dB/mm at 3.11 THz, corresponding to a loss per wavelength of 0.12 dB/λ. This paper summarizes the design, fabrication, and measurement of these micromachined waveguides operating near 3 THz.</description><subject>Additives</subject><subject>Frequency measurement</subject><subject>Gold</subject><subject>Internal dimensions</subject><subject>Loss measurement</subject><subject>Micromachining</subject><subject>Micromechanics</subject><subject>Noise levels</subject><subject>Optical device fabrication</subject><subject>Rectangular waveguides</subject><subject>Resists</subject><subject>Silicon</subject><subject>Silicon substrates</subject><subject>submillimeter wave technology</subject><subject>Surface waves</subject><subject>Waveguides</subject><subject>Wavelength measurement</subject><subject>Wavelengths</subject><issn>1077-260X</issn><issn>1558-4542</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1PwzAMhisEEmPwB-ASceLS4aRJkxzRNBhoY8CG4BZlrTs6de1IWiT49XQf4sApjvw8lv0GwTmFHqWgrx-ms-dBj0H7Z8A1aHEQdKgQKuSCs8O2BilDFsP7cXDi_RIAFFfQCWZPrlqjq3P0pMrItHGZTZCMsbYFGeeJq1Y2-chLTMkLJrUtF01hHXmzX7ho8hTJpLVtnZcL8ohtIyKz4c9pcJTZwuPZ_u0Gr7eDWX8YjiZ39_2bUZhEOqpDpBKszbigSso4tSKNE83nXM25iOK5iCSIVHMGjGmkc7BSWYlag011KpiIusHVbu7aVZ8N-tqscp9gUdgSq8YbGkvKFFVatejlP3RZNa5stzNKUBZLuYXYDmrP9t5hZtYuX1n3bSiYTc5mm7PZ5Gz2ObfSxU7KEfFPEFxLiEX0C2GbeAY</recordid><startdate>201101</startdate><enddate>201101</enddate><creator>Nordquist, C D</creator><creator>Wanke, M C</creator><creator>Rowen, A M</creator><creator>Arrington, C L</creator><creator>Grine, A D</creator><creator>Fuller, C T</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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subjects | Additives Frequency measurement Gold Internal dimensions Loss measurement Micromachining Micromechanics Noise levels Optical device fabrication Rectangular waveguides Resists Silicon Silicon substrates submillimeter wave technology Surface waves Waveguides Wavelength measurement Wavelengths |
title | Properties of Surface Metal Micromachined Rectangular Waveguide Operating Near 3 THz |
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