Influence Analysis of Asymmetric Correction Method on the Key Characteristics of the Electromagnetic Dual Probing System
The asymmetric correction method (ACM) has been proven that it can be used to eliminate the asymmetry of the differential port magnetic field probing system. Furthermore, this article proves that ACM can also be effective for asymmetric electromagnetic dual probing system when the traditional calibr...
Gespeichert in:
Veröffentlicht in: | IEEE sensors journal 2024-03, Vol.24 (6), p.8361-8370 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 8370 |
---|---|
container_issue | 6 |
container_start_page | 8361 |
container_title | IEEE sensors journal |
container_volume | 24 |
creator | Chen, Yinghui Shao, Weiheng He, Liuxing Zhou, Changjian Chen, Yiqiang |
description | The asymmetric correction method (ACM) has been proven that it can be used to eliminate the asymmetry of the differential port magnetic field probing system. Furthermore, this article proves that ACM can also be effective for asymmetric electromagnetic dual probing system when the traditional calibration method (TCM) has a huge measurement error. The characteristics' influence of the ACM on the electromagnetic dual probing system is also studied, including electric field calibration factor, magnetic field calibration factor, spatial resolution, differential electric field suppression, common electric field suppression, standing-wave measurement, and electromagnetic field scanning measurement. The analysis results show that most of the above-mentioned characteristics after using the ACM are basically consistent with those of the original symmetric probing system. The maximum characteristics' influence of the ACM is less than 10%, which appears in the electric field scanning measurement results. |
doi_str_mv | 10.1109/JSEN.2024.3357215 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_JSEN_2024_3357215</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>10416164</ieee_id><sourcerecordid>2956384122</sourcerecordid><originalsourceid>FETCH-LOGICAL-c246t-35e7e18e24c54312452787f4da4e4599f97fb9352e4cb3e7d94d3707bbc7c1943</originalsourceid><addsrcrecordid>eNpNkE1Lw0AQhoMoWKs_QPCw4Dl1P7PZY4lV6zdUwVtINpM2JcnW3Q2Yf29ie_A0w8z7DMwTBJcEzwjB6uZxtXidUUz5jDEhKRFHwYQIEYdE8vh47BkOOZNfp8GZc1uMiZJCToKfZVvWHbQa0LzN6t5VDpkSzV3fNOBtpVFirAXtK9OiF_AbU6Ch8xtAT9CjZJPZTHuwlfOV_kPH1aIeCGuabN3CMEe3XVajd2vyql2jVe88NOfBSZnVDi4OdRp83i0-kofw-e1-mcyfQ0155EMmQAKJgXItOCOUCypjWfIi48CFUqWSZa6YoMB1zkAWihdMYpnnWmqiOJsG1_u7O2u-O3A-3ZrODq-6lCoRsZgTSocU2ae0Nc5ZKNOdrZrM9inB6Sg4HQWno-D0IHhgrvZMBQD_8pxEJOLsF1YjeCo</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2956384122</pqid></control><display><type>article</type><title>Influence Analysis of Asymmetric Correction Method on the Key Characteristics of the Electromagnetic Dual Probing System</title><source>IEEE Electronic Library (IEL)</source><creator>Chen, Yinghui ; Shao, Weiheng ; He, Liuxing ; Zhou, Changjian ; Chen, Yiqiang</creator><creatorcontrib>Chen, Yinghui ; Shao, Weiheng ; He, Liuxing ; Zhou, Changjian ; Chen, Yiqiang</creatorcontrib><description>The asymmetric correction method (ACM) has been proven that it can be used to eliminate the asymmetry of the differential port magnetic field probing system. Furthermore, this article proves that ACM can also be effective for asymmetric electromagnetic dual probing system when the traditional calibration method (TCM) has a huge measurement error. The characteristics' influence of the ACM on the electromagnetic dual probing system is also studied, including electric field calibration factor, magnetic field calibration factor, spatial resolution, differential electric field suppression, common electric field suppression, standing-wave measurement, and electromagnetic field scanning measurement. The analysis results show that most of the above-mentioned characteristics after using the ACM are basically consistent with those of the original symmetric probing system. The maximum characteristics' influence of the ACM is less than 10%, which appears in the electric field scanning measurement results.</description><identifier>ISSN: 1530-437X</identifier><identifier>EISSN: 1558-1748</identifier><identifier>DOI: 10.1109/JSEN.2024.3357215</identifier><identifier>CODEN: ISJEAZ</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Asymmetric correction method (ACM) ; Asymmetry ; Calibration ; calibration factors ; Electric fields ; Electric variables measurement ; Electromagnetic fields ; Electromagnetics ; Error analysis ; Magnetic field measurement ; Magnetic fields ; Magnetic resonance imaging ; near-field scanning ; Probes ; Spatial resolution ; Standing waves ; Transmission line measurements ; Wave measurement</subject><ispartof>IEEE sensors journal, 2024-03, Vol.24 (6), p.8361-8370</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2024</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c246t-35e7e18e24c54312452787f4da4e4599f97fb9352e4cb3e7d94d3707bbc7c1943</cites><orcidid>0009-0000-8922-0322 ; 0000-0002-7156-348X ; 0000-0002-7345-3479 ; 0000-0001-6901-3000</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/10416164$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/10416164$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Chen, Yinghui</creatorcontrib><creatorcontrib>Shao, Weiheng</creatorcontrib><creatorcontrib>He, Liuxing</creatorcontrib><creatorcontrib>Zhou, Changjian</creatorcontrib><creatorcontrib>Chen, Yiqiang</creatorcontrib><title>Influence Analysis of Asymmetric Correction Method on the Key Characteristics of the Electromagnetic Dual Probing System</title><title>IEEE sensors journal</title><addtitle>JSEN</addtitle><description>The asymmetric correction method (ACM) has been proven that it can be used to eliminate the asymmetry of the differential port magnetic field probing system. Furthermore, this article proves that ACM can also be effective for asymmetric electromagnetic dual probing system when the traditional calibration method (TCM) has a huge measurement error. The characteristics' influence of the ACM on the electromagnetic dual probing system is also studied, including electric field calibration factor, magnetic field calibration factor, spatial resolution, differential electric field suppression, common electric field suppression, standing-wave measurement, and electromagnetic field scanning measurement. The analysis results show that most of the above-mentioned characteristics after using the ACM are basically consistent with those of the original symmetric probing system. The maximum characteristics' influence of the ACM is less than 10%, which appears in the electric field scanning measurement results.</description><subject>Asymmetric correction method (ACM)</subject><subject>Asymmetry</subject><subject>Calibration</subject><subject>calibration factors</subject><subject>Electric fields</subject><subject>Electric variables measurement</subject><subject>Electromagnetic fields</subject><subject>Electromagnetics</subject><subject>Error analysis</subject><subject>Magnetic field measurement</subject><subject>Magnetic fields</subject><subject>Magnetic resonance imaging</subject><subject>near-field scanning</subject><subject>Probes</subject><subject>Spatial resolution</subject><subject>Standing waves</subject><subject>Transmission line measurements</subject><subject>Wave measurement</subject><issn>1530-437X</issn><issn>1558-1748</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkE1Lw0AQhoMoWKs_QPCw4Dl1P7PZY4lV6zdUwVtINpM2JcnW3Q2Yf29ie_A0w8z7DMwTBJcEzwjB6uZxtXidUUz5jDEhKRFHwYQIEYdE8vh47BkOOZNfp8GZc1uMiZJCToKfZVvWHbQa0LzN6t5VDpkSzV3fNOBtpVFirAXtK9OiF_AbU6Ch8xtAT9CjZJPZTHuwlfOV_kPH1aIeCGuabN3CMEe3XVajd2vyql2jVe88NOfBSZnVDi4OdRp83i0-kofw-e1-mcyfQ0155EMmQAKJgXItOCOUCypjWfIi48CFUqWSZa6YoMB1zkAWihdMYpnnWmqiOJsG1_u7O2u-O3A-3ZrODq-6lCoRsZgTSocU2ae0Nc5ZKNOdrZrM9inB6Sg4HQWno-D0IHhgrvZMBQD_8pxEJOLsF1YjeCo</recordid><startdate>20240315</startdate><enddate>20240315</enddate><creator>Chen, Yinghui</creator><creator>Shao, Weiheng</creator><creator>He, Liuxing</creator><creator>Zhou, Changjian</creator><creator>Chen, Yiqiang</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0009-0000-8922-0322</orcidid><orcidid>https://orcid.org/0000-0002-7156-348X</orcidid><orcidid>https://orcid.org/0000-0002-7345-3479</orcidid><orcidid>https://orcid.org/0000-0001-6901-3000</orcidid></search><sort><creationdate>20240315</creationdate><title>Influence Analysis of Asymmetric Correction Method on the Key Characteristics of the Electromagnetic Dual Probing System</title><author>Chen, Yinghui ; Shao, Weiheng ; He, Liuxing ; Zhou, Changjian ; Chen, Yiqiang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c246t-35e7e18e24c54312452787f4da4e4599f97fb9352e4cb3e7d94d3707bbc7c1943</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Asymmetric correction method (ACM)</topic><topic>Asymmetry</topic><topic>Calibration</topic><topic>calibration factors</topic><topic>Electric fields</topic><topic>Electric variables measurement</topic><topic>Electromagnetic fields</topic><topic>Electromagnetics</topic><topic>Error analysis</topic><topic>Magnetic field measurement</topic><topic>Magnetic fields</topic><topic>Magnetic resonance imaging</topic><topic>near-field scanning</topic><topic>Probes</topic><topic>Spatial resolution</topic><topic>Standing waves</topic><topic>Transmission line measurements</topic><topic>Wave measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chen, Yinghui</creatorcontrib><creatorcontrib>Shao, Weiheng</creatorcontrib><creatorcontrib>He, Liuxing</creatorcontrib><creatorcontrib>Zhou, Changjian</creatorcontrib><creatorcontrib>Chen, Yiqiang</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE sensors journal</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chen, Yinghui</au><au>Shao, Weiheng</au><au>He, Liuxing</au><au>Zhou, Changjian</au><au>Chen, Yiqiang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Influence Analysis of Asymmetric Correction Method on the Key Characteristics of the Electromagnetic Dual Probing System</atitle><jtitle>IEEE sensors journal</jtitle><stitle>JSEN</stitle><date>2024-03-15</date><risdate>2024</risdate><volume>24</volume><issue>6</issue><spage>8361</spage><epage>8370</epage><pages>8361-8370</pages><issn>1530-437X</issn><eissn>1558-1748</eissn><coden>ISJEAZ</coden><abstract>The asymmetric correction method (ACM) has been proven that it can be used to eliminate the asymmetry of the differential port magnetic field probing system. Furthermore, this article proves that ACM can also be effective for asymmetric electromagnetic dual probing system when the traditional calibration method (TCM) has a huge measurement error. The characteristics' influence of the ACM on the electromagnetic dual probing system is also studied, including electric field calibration factor, magnetic field calibration factor, spatial resolution, differential electric field suppression, common electric field suppression, standing-wave measurement, and electromagnetic field scanning measurement. The analysis results show that most of the above-mentioned characteristics after using the ACM are basically consistent with those of the original symmetric probing system. The maximum characteristics' influence of the ACM is less than 10%, which appears in the electric field scanning measurement results.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JSEN.2024.3357215</doi><tpages>10</tpages><orcidid>https://orcid.org/0009-0000-8922-0322</orcidid><orcidid>https://orcid.org/0000-0002-7156-348X</orcidid><orcidid>https://orcid.org/0000-0002-7345-3479</orcidid><orcidid>https://orcid.org/0000-0001-6901-3000</orcidid></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1530-437X |
ispartof | IEEE sensors journal, 2024-03, Vol.24 (6), p.8361-8370 |
issn | 1530-437X 1558-1748 |
language | eng |
recordid | cdi_crossref_primary_10_1109_JSEN_2024_3357215 |
source | IEEE Electronic Library (IEL) |
subjects | Asymmetric correction method (ACM) Asymmetry Calibration calibration factors Electric fields Electric variables measurement Electromagnetic fields Electromagnetics Error analysis Magnetic field measurement Magnetic fields Magnetic resonance imaging near-field scanning Probes Spatial resolution Standing waves Transmission line measurements Wave measurement |
title | Influence Analysis of Asymmetric Correction Method on the Key Characteristics of the Electromagnetic Dual Probing System |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T20%3A37%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Influence%20Analysis%20of%20Asymmetric%20Correction%20Method%20on%20the%20Key%20Characteristics%20of%20the%20Electromagnetic%20Dual%20Probing%20System&rft.jtitle=IEEE%20sensors%20journal&rft.au=Chen,%20Yinghui&rft.date=2024-03-15&rft.volume=24&rft.issue=6&rft.spage=8361&rft.epage=8370&rft.pages=8361-8370&rft.issn=1530-437X&rft.eissn=1558-1748&rft.coden=ISJEAZ&rft_id=info:doi/10.1109/JSEN.2024.3357215&rft_dat=%3Cproquest_RIE%3E2956384122%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2956384122&rft_id=info:pmid/&rft_ieee_id=10416164&rfr_iscdi=true |