Low-Dissipation Silicon Tuning Fork Gyroscopes for Rate and Whole Angle Measurements

We report a new family of ultra high- Q silicon microelectromechanical systems (MEMS) tuning fork gyroscopes demonstrating angular rate and, for the first time, rate integrating (whole angle) operation. The novel mechanical architecture maximizes the Q-factor and minimizes frequency and damping mism...

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Veröffentlicht in:IEEE sensors journal 2011-11, Vol.11 (11), p.2763-2770
Hauptverfasser: Trusov, A. A., Prikhodko, I. P., Zotov, S. A., Shkel, A. M.
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container_end_page 2770
container_issue 11
container_start_page 2763
container_title IEEE sensors journal
container_volume 11
creator Trusov, A. A.
Prikhodko, I. P.
Zotov, S. A.
Shkel, A. M.
description We report a new family of ultra high- Q silicon microelectromechanical systems (MEMS) tuning fork gyroscopes demonstrating angular rate and, for the first time, rate integrating (whole angle) operation. The novel mechanical architecture maximizes the Q-factor and minimizes frequency and damping mismatches. We demonstrated the vacuum packaged SOI dual and quadruple mass gyroscopes with Q-factors of 0.64 and 0.86 million at 2 kHz operational frequency, respectively. Due to the stiffness and damping symmetry, the quadruple mass gyroscope was instrumented to measure the angle of rotation directly, eliminating the bandwidth and dynamic range limitations of conventional MEMS vibratory rate gyroscopes. The technology may enable silicon micromachined devices for inertial guidance applications previously limited to precision-machined quartz hemispherical resonator gyroscopes.
doi_str_mv 10.1109/JSEN.2011.2160338
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subjects Damping
Dynamic range
Energy dissipation
Frequency measurement
Gyroscopes
Microelectromechanical systems
microelectromechanical systems (MEMS) gyroscope
Micromachining
Micromechanics
Q factor
quality factor
rate integrating
Sensors
Silicon
Temperature measurement
Tuning fork gyroscopes
vacuum packaging
Vibrations
whole angle
title Low-Dissipation Silicon Tuning Fork Gyroscopes for Rate and Whole Angle Measurements
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