Subsurface structure and laser damage threshold
The laser-induced surface damage threshold of fused silica is discussed with respect to the near but below the surface zone of microcracks, strain, and dislocations. This subsurface zone was varied in thickness throughout a set of matched samples by means of interrupted controlled grinding followed...
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| Veröffentlicht in: | IEEE journal of quantum electronics 1977-05, Vol.13 (5), p.363-364 |
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| container_end_page | 364 |
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| container_issue | 5 |
| container_start_page | 363 |
| container_title | IEEE journal of quantum electronics |
| container_volume | 13 |
| creator | House, R. Bettis, J. Guenther, A. |
| description | The laser-induced surface damage threshold of fused silica is discussed with respect to the near but below the surface zone of microcracks, strain, and dislocations. This subsurface zone was varied in thickness throughout a set of matched samples by means of interrupted controlled grinding followed by optical polishing. Laser damage testing was performed using a TEM 00 beam having a wavelength of 1.06 μm, a pulsewidth of 40.5 ns, and a spot size of 147 μm. The experimentally measured breakdown electric fields were corrected using the technique of roughness normalization and plotted versus the thickness of the subsurface zone. Analysis of the data leads to the conclusion that laser-induced surface damage is dominated by the superficial polish layer and that the effect of the disturbed subsurface zone is essentially negligible. |
| doi_str_mv | 10.1109/JQE.1977.1069341 |
| format | Article |
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This subsurface zone was varied in thickness throughout a set of matched samples by means of interrupted controlled grinding followed by optical polishing. Laser damage testing was performed using a TEM 00 beam having a wavelength of 1.06 μm, a pulsewidth of 40.5 ns, and a spot size of 147 μm. The experimentally measured breakdown electric fields were corrected using the technique of roughness normalization and plotted versus the thickness of the subsurface zone. 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This subsurface zone was varied in thickness throughout a set of matched samples by means of interrupted controlled grinding followed by optical polishing. Laser damage testing was performed using a TEM 00 beam having a wavelength of 1.06 μm, a pulsewidth of 40.5 ns, and a spot size of 147 μm. The experimentally measured breakdown electric fields were corrected using the technique of roughness normalization and plotted versus the thickness of the subsurface zone. Analysis of the data leads to the conclusion that laser-induced surface damage is dominated by the superficial polish layer and that the effect of the disturbed subsurface zone is essentially negligible.</description><subject>Capacitive sensors</subject><subject>Laser beams</subject><subject>Optical control</subject><subject>Optical pulses</subject><subject>Optical surface waves</subject><subject>Performance evaluation</subject><subject>Silicon compounds</subject><subject>Surface emitting lasers</subject><subject>Testing</subject><subject>Thickness control</subject><issn>0018-9197</issn><issn>1558-1713</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1977</creationdate><recordtype>article</recordtype><recordid>eNqFkD1PwzAQQC0EEqWwI7FkYkvr81fsEVXlS5UQAmbLsc-0KG2KnQz8e1KlAxvT6XTv3fAIuQY6A6Bm_vy6nIGpqhlQZbiAEzIBKXUJFfBTMqEUdGkG4Jxc5Pw1rEJoOiHzt77OfYrOY5G71PuuT1i4XSgalzEVwW3dJxbdOmFet024JGfRNRmvjnNKPu6X74vHcvXy8LS4W5WeM96V2oCnwqFCDswZhTTICJWAwDjWMQgZqFJKK80YjUxWKJTGmkc_KB6BT8nt-Hef2u8ec2e3m-yxadwO2z5bpmXFpRL_g8xIACUHkI6gT23OCaPdp83WpR8L1B4S2iGhPSS0x4SDcjMqG0T8g4_XX2Ima-g</recordid><startdate>19770501</startdate><enddate>19770501</enddate><creator>House, R.</creator><creator>Bettis, J.</creator><creator>Guenther, A.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7SP</scope><scope>7U5</scope></search><sort><creationdate>19770501</creationdate><title>Subsurface structure and laser damage threshold</title><author>House, R. ; Bettis, J. ; Guenther, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c323t-891c04ae6e312a96e0d5f1741d23ebfd45d0666868220f257e468eb3fce6ece13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1977</creationdate><topic>Capacitive sensors</topic><topic>Laser beams</topic><topic>Optical control</topic><topic>Optical pulses</topic><topic>Optical surface waves</topic><topic>Performance evaluation</topic><topic>Silicon compounds</topic><topic>Surface emitting lasers</topic><topic>Testing</topic><topic>Thickness control</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>House, R.</creatorcontrib><creatorcontrib>Bettis, J.</creatorcontrib><creatorcontrib>Guenther, A.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><jtitle>IEEE journal of quantum electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>House, R.</au><au>Bettis, J.</au><au>Guenther, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Subsurface structure and laser damage threshold</atitle><jtitle>IEEE journal of quantum electronics</jtitle><stitle>JQE</stitle><date>1977-05-01</date><risdate>1977</risdate><volume>13</volume><issue>5</issue><spage>363</spage><epage>364</epage><pages>363-364</pages><issn>0018-9197</issn><eissn>1558-1713</eissn><coden>IEJQA7</coden><abstract>The laser-induced surface damage threshold of fused silica is discussed with respect to the near but below the surface zone of microcracks, strain, and dislocations. This subsurface zone was varied in thickness throughout a set of matched samples by means of interrupted controlled grinding followed by optical polishing. Laser damage testing was performed using a TEM 00 beam having a wavelength of 1.06 μm, a pulsewidth of 40.5 ns, and a spot size of 147 μm. The experimentally measured breakdown electric fields were corrected using the technique of roughness normalization and plotted versus the thickness of the subsurface zone. Analysis of the data leads to the conclusion that laser-induced surface damage is dominated by the superficial polish layer and that the effect of the disturbed subsurface zone is essentially negligible.</abstract><pub>IEEE</pub><doi>10.1109/JQE.1977.1069341</doi><tpages>2</tpages></addata></record> |
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| identifier | ISSN: 0018-9197 |
| ispartof | IEEE journal of quantum electronics, 1977-05, Vol.13 (5), p.363-364 |
| issn | 0018-9197 1558-1713 |
| language | eng |
| recordid | cdi_crossref_primary_10_1109_JQE_1977_1069341 |
| source | IEEE Electronic Library (IEL) |
| subjects | Capacitive sensors Laser beams Optical control Optical pulses Optical surface waves Performance evaluation Silicon compounds Surface emitting lasers Testing Thickness control |
| title | Subsurface structure and laser damage threshold |
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