A Silicon Migration Model Incorporating Anisotropic Surface Energy and Non-Uniform Diffusivity

Silicon migration is a process that can produce seamless, single-crystal silicon cavities in a single mask layer, greatly simplifying process flows for forming various cavity- and channel-based structures. However, controlling the dimensions of the final cavity and membrane thickness is complex and...

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Veröffentlicht in:Journal of microelectromechanical systems 2022-12, Vol.31 (6), p.943-950
Hauptverfasser: Wong, Han Xuan, Lee, Joshua En-Yuan
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creator Wong, Han Xuan
Lee, Joshua En-Yuan
description Silicon migration is a process that can produce seamless, single-crystal silicon cavities in a single mask layer, greatly simplifying process flows for forming various cavity- and channel-based structures. However, controlling the dimensions of the final cavity and membrane thickness is complex and difficult to predict. To address this challenge, we present an efficient and accurate method of simulating silicon migration, which advances the state of art in three ways. First, it accounts for anisotropic surface energy. Second, it uniquely models selective migration. Third, the method is implemented in Python, an open source and highly pervasive programming language. We validate the model using experimental results from the literature, and we show that incorporating anisotropy is critical for simulating high aspect ratio, high density etch hole arrays. We also find indications in the simulations of selective migration that anisotropy may be less significant for very large curvature (radius less than 100 nm) features. Lastly, we use this new model to predict the relationship between layout and annealing time for a given set of final objective cavity and membrane dimensions. [2022-0128]
doi_str_mv 10.1109/JMEMS.2022.3200007
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_JMEMS_2022_3200007</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>9868233</ieee_id><sourcerecordid>2742703016</sourcerecordid><originalsourceid>FETCH-LOGICAL-c225t-d2dc6ec2a55ba1eef2325abb2033def4e38b573dce075e768422f95a3aed012f3</originalsourceid><addsrcrecordid>eNo9kMFOwzAQRCMEEqXwA3CxxDnFXsdxcqxKgaIWDqVXIsdZV65aOzgJUv-ehCL2sqPVzI70ouiW0QljNH94Xc1X6wlQgAkH2o88i0YsT1hMmcjOe02FjCUT8jK6apodpSxJsnQUfU7J2u6t9o6s7Dao1g7KV7gnC6d9qP1wc1sydbbxbfC11WTdBaM0krnDsD0S5Sry5l28cdb4cCCP1piusd-2PV5HF0btG7z52-No8zT_mL3Ey_fnxWy6jDWAaOMKKp2iBiVEqRiiAQ5ClSVQzis0CfKsFJJXGqkUKNMsATC5UFxhRRkYPo7uT3_r4L86bNpi57vg-soCZAKScsrS3gUnlw6-aQKaog72oMKxYLQYOBa_HIuBY_HHsQ_dnUIWEf8DeZZmwDn_AWyBb-0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2742703016</pqid></control><display><type>article</type><title>A Silicon Migration Model Incorporating Anisotropic Surface Energy and Non-Uniform Diffusivity</title><source>IEEE Electronic Library (IEL)</source><creator>Wong, Han Xuan ; Lee, Joshua En-Yuan</creator><creatorcontrib>Wong, Han Xuan ; Lee, Joshua En-Yuan</creatorcontrib><description>Silicon migration is a process that can produce seamless, single-crystal silicon cavities in a single mask layer, greatly simplifying process flows for forming various cavity- and channel-based structures. However, controlling the dimensions of the final cavity and membrane thickness is complex and difficult to predict. To address this challenge, we present an efficient and accurate method of simulating silicon migration, which advances the state of art in three ways. First, it accounts for anisotropic surface energy. Second, it uniquely models selective migration. Third, the method is implemented in Python, an open source and highly pervasive programming language. We validate the model using experimental results from the literature, and we show that incorporating anisotropy is critical for simulating high aspect ratio, high density etch hole arrays. We also find indications in the simulations of selective migration that anisotropy may be less significant for very large curvature (radius less than 100 nm) features. Lastly, we use this new model to predict the relationship between layout and annealing time for a given set of final objective cavity and membrane dimensions. [2022-0128]</description><identifier>ISSN: 1057-7157</identifier><identifier>EISSN: 1941-0158</identifier><identifier>DOI: 10.1109/JMEMS.2022.3200007</identifier><identifier>CODEN: JMIYET</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Anisotropic magnetoresistance ; Anisotropy ; Annealing ; cavities ; Chemicals ; High aspect ratio ; Holes ; level-set method ; Mathematical models ; Membranes ; Programming languages ; Silicon ; Silicon migration ; silicon-on-nothing ; Simulation ; Single crystals ; Smoothing methods ; Surface energy ; Surface treatment</subject><ispartof>Journal of microelectromechanical systems, 2022-12, Vol.31 (6), p.943-950</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c225t-d2dc6ec2a55ba1eef2325abb2033def4e38b573dce075e768422f95a3aed012f3</citedby><cites>FETCH-LOGICAL-c225t-d2dc6ec2a55ba1eef2325abb2033def4e38b573dce075e768422f95a3aed012f3</cites><orcidid>0000-0002-1741-1485 ; 0000-0003-2065-8435</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9868233$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,777,781,793,27905,27906,54739</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9868233$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Wong, Han Xuan</creatorcontrib><creatorcontrib>Lee, Joshua En-Yuan</creatorcontrib><title>A Silicon Migration Model Incorporating Anisotropic Surface Energy and Non-Uniform Diffusivity</title><title>Journal of microelectromechanical systems</title><addtitle>JMEMS</addtitle><description>Silicon migration is a process that can produce seamless, single-crystal silicon cavities in a single mask layer, greatly simplifying process flows for forming various cavity- and channel-based structures. However, controlling the dimensions of the final cavity and membrane thickness is complex and difficult to predict. To address this challenge, we present an efficient and accurate method of simulating silicon migration, which advances the state of art in three ways. First, it accounts for anisotropic surface energy. Second, it uniquely models selective migration. Third, the method is implemented in Python, an open source and highly pervasive programming language. We validate the model using experimental results from the literature, and we show that incorporating anisotropy is critical for simulating high aspect ratio, high density etch hole arrays. We also find indications in the simulations of selective migration that anisotropy may be less significant for very large curvature (radius less than 100 nm) features. Lastly, we use this new model to predict the relationship between layout and annealing time for a given set of final objective cavity and membrane dimensions. [2022-0128]</description><subject>Anisotropic magnetoresistance</subject><subject>Anisotropy</subject><subject>Annealing</subject><subject>cavities</subject><subject>Chemicals</subject><subject>High aspect ratio</subject><subject>Holes</subject><subject>level-set method</subject><subject>Mathematical models</subject><subject>Membranes</subject><subject>Programming languages</subject><subject>Silicon</subject><subject>Silicon migration</subject><subject>silicon-on-nothing</subject><subject>Simulation</subject><subject>Single crystals</subject><subject>Smoothing methods</subject><subject>Surface energy</subject><subject>Surface treatment</subject><issn>1057-7157</issn><issn>1941-0158</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kMFOwzAQRCMEEqXwA3CxxDnFXsdxcqxKgaIWDqVXIsdZV65aOzgJUv-ehCL2sqPVzI70ouiW0QljNH94Xc1X6wlQgAkH2o88i0YsT1hMmcjOe02FjCUT8jK6apodpSxJsnQUfU7J2u6t9o6s7Dao1g7KV7gnC6d9qP1wc1sydbbxbfC11WTdBaM0krnDsD0S5Sry5l28cdb4cCCP1piusd-2PV5HF0btG7z52-No8zT_mL3Ey_fnxWy6jDWAaOMKKp2iBiVEqRiiAQ5ClSVQzis0CfKsFJJXGqkUKNMsATC5UFxhRRkYPo7uT3_r4L86bNpi57vg-soCZAKScsrS3gUnlw6-aQKaog72oMKxYLQYOBa_HIuBY_HHsQ_dnUIWEf8DeZZmwDn_AWyBb-0</recordid><startdate>20221201</startdate><enddate>20221201</enddate><creator>Wong, Han Xuan</creator><creator>Lee, Joshua En-Yuan</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>7U5</scope><scope>8FD</scope><scope>FR3</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-1741-1485</orcidid><orcidid>https://orcid.org/0000-0003-2065-8435</orcidid></search><sort><creationdate>20221201</creationdate><title>A Silicon Migration Model Incorporating Anisotropic Surface Energy and Non-Uniform Diffusivity</title><author>Wong, Han Xuan ; Lee, Joshua En-Yuan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c225t-d2dc6ec2a55ba1eef2325abb2033def4e38b573dce075e768422f95a3aed012f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Anisotropic magnetoresistance</topic><topic>Anisotropy</topic><topic>Annealing</topic><topic>cavities</topic><topic>Chemicals</topic><topic>High aspect ratio</topic><topic>Holes</topic><topic>level-set method</topic><topic>Mathematical models</topic><topic>Membranes</topic><topic>Programming languages</topic><topic>Silicon</topic><topic>Silicon migration</topic><topic>silicon-on-nothing</topic><topic>Simulation</topic><topic>Single crystals</topic><topic>Smoothing methods</topic><topic>Surface energy</topic><topic>Surface treatment</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wong, Han Xuan</creatorcontrib><creatorcontrib>Lee, Joshua En-Yuan</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of microelectromechanical systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Wong, Han Xuan</au><au>Lee, Joshua En-Yuan</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Silicon Migration Model Incorporating Anisotropic Surface Energy and Non-Uniform Diffusivity</atitle><jtitle>Journal of microelectromechanical systems</jtitle><stitle>JMEMS</stitle><date>2022-12-01</date><risdate>2022</risdate><volume>31</volume><issue>6</issue><spage>943</spage><epage>950</epage><pages>943-950</pages><issn>1057-7157</issn><eissn>1941-0158</eissn><coden>JMIYET</coden><abstract>Silicon migration is a process that can produce seamless, single-crystal silicon cavities in a single mask layer, greatly simplifying process flows for forming various cavity- and channel-based structures. However, controlling the dimensions of the final cavity and membrane thickness is complex and difficult to predict. To address this challenge, we present an efficient and accurate method of simulating silicon migration, which advances the state of art in three ways. First, it accounts for anisotropic surface energy. Second, it uniquely models selective migration. Third, the method is implemented in Python, an open source and highly pervasive programming language. We validate the model using experimental results from the literature, and we show that incorporating anisotropy is critical for simulating high aspect ratio, high density etch hole arrays. We also find indications in the simulations of selective migration that anisotropy may be less significant for very large curvature (radius less than 100 nm) features. Lastly, we use this new model to predict the relationship between layout and annealing time for a given set of final objective cavity and membrane dimensions. [2022-0128]</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JMEMS.2022.3200007</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0002-1741-1485</orcidid><orcidid>https://orcid.org/0000-0003-2065-8435</orcidid></addata></record>
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ispartof Journal of microelectromechanical systems, 2022-12, Vol.31 (6), p.943-950
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1941-0158
language eng
recordid cdi_crossref_primary_10_1109_JMEMS_2022_3200007
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subjects Anisotropic magnetoresistance
Anisotropy
Annealing
cavities
Chemicals
High aspect ratio
Holes
level-set method
Mathematical models
Membranes
Programming languages
Silicon
Silicon migration
silicon-on-nothing
Simulation
Single crystals
Smoothing methods
Surface energy
Surface treatment
title A Silicon Migration Model Incorporating Anisotropic Surface Energy and Non-Uniform Diffusivity
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-19T13%3A47%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Silicon%20Migration%20Model%20Incorporating%20Anisotropic%20Surface%20Energy%20and%20Non-Uniform%20Diffusivity&rft.jtitle=Journal%20of%20microelectromechanical%20systems&rft.au=Wong,%20Han%20Xuan&rft.date=2022-12-01&rft.volume=31&rft.issue=6&rft.spage=943&rft.epage=950&rft.pages=943-950&rft.issn=1057-7157&rft.eissn=1941-0158&rft.coden=JMIYET&rft_id=info:doi/10.1109/JMEMS.2022.3200007&rft_dat=%3Cproquest_RIE%3E2742703016%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2742703016&rft_id=info:pmid/&rft_ieee_id=9868233&rfr_iscdi=true