A Nonlinear Microresonator Refractive Index Sensor
We propose an ultrasensitive refractive index (RI) sensor based on the nonlinear index of refraction in a microring resonator coupled to waveguides in an add-drop configuration. The nonreciprocity caused by the difference between the nonlinear self-phase and cross-phase modulation leads to a bifurca...
Gespeichert in:
Veröffentlicht in: | Journal of lightwave technology 2015-10, Vol.33 (20), p.4360-4366 |
---|---|
Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 4366 |
---|---|
container_issue | 20 |
container_start_page | 4360 |
container_title | Journal of lightwave technology |
container_volume | 33 |
creator | Chao Wang Search, Christopher P. |
description | We propose an ultrasensitive refractive index (RI) sensor based on the nonlinear index of refraction in a microring resonator coupled to waveguides in an add-drop configuration. The nonreciprocity caused by the difference between the nonlinear self-phase and cross-phase modulation leads to a bifurcation of the optical intensities for two counterpropagating modes. The magnitude of the splitting depends sensitively on the resonance frequency of the resonator, and hence, the effective index of refraction. This nonlinear system is up to two orders of magnitude more sensitive to RI changes than the theoretical sensitivity of a linear microresonator RI sensor. We discuss potential material implementations of the microresonator and the detection limit for these materials. |
doi_str_mv | 10.1109/JLT.2015.2464105 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_JLT_2015_2464105</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>7177043</ieee_id><sourcerecordid>3807007501</sourcerecordid><originalsourceid>FETCH-LOGICAL-c291t-6565fdfc36a51f4db8a710ae645759655a35f0a28440d73dede99b727381872d3</originalsourceid><addsrcrecordid>eNo9kM9Lw0AQhRdRsFbvgpeA59SZ_ZFNjqVorUQFredlm52FlJqtu6nof29Ki6e5fO_N42PsGmGCCNXdU72ccEA14bKQCOqEjVCpMuccxSkbgRYiLzWX5-wipTUASlnqEePT7CV0m7YjG7PntokhUgqd7UPM3shH2_TtN2WLztFP9k5dCvGSnXm7SXR1vGP28XC_nD3m9et8MZvWecMr7PNCFco734jCKvTSrUqrESwVUmlVFUpZoTxYXkoJTgtHjqpqpbkWJQ5DnRiz20PvNoavHaXerMMudsNLgxq5kAJFNVBwoIbpKUXyZhvbTxt_DYLZmzGDGbM3Y45mhsjNIdIS0T-uUWuQQvwBDMpdKQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1712343139</pqid></control><display><type>article</type><title>A Nonlinear Microresonator Refractive Index Sensor</title><source>IEEE Xplore</source><creator>Chao Wang ; Search, Christopher P.</creator><creatorcontrib>Chao Wang ; Search, Christopher P.</creatorcontrib><description>We propose an ultrasensitive refractive index (RI) sensor based on the nonlinear index of refraction in a microring resonator coupled to waveguides in an add-drop configuration. The nonreciprocity caused by the difference between the nonlinear self-phase and cross-phase modulation leads to a bifurcation of the optical intensities for two counterpropagating modes. The magnitude of the splitting depends sensitively on the resonance frequency of the resonator, and hence, the effective index of refraction. This nonlinear system is up to two orders of magnitude more sensitive to RI changes than the theoretical sensitivity of a linear microresonator RI sensor. We discuss potential material implementations of the microresonator and the detection limit for these materials.</description><identifier>ISSN: 0733-8724</identifier><identifier>EISSN: 1558-2213</identifier><identifier>DOI: 10.1109/JLT.2015.2464105</identifier><identifier>CODEN: JLTEDG</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Bifurcation ; Indexes ; integrated optics ; Microcavities ; Nonlinear optics ; optical resonators ; Refractive index ; Sensitivity ; sensors</subject><ispartof>Journal of lightwave technology, 2015-10, Vol.33 (20), p.4360-4366</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Oct 15, 2015</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c291t-6565fdfc36a51f4db8a710ae645759655a35f0a28440d73dede99b727381872d3</citedby><cites>FETCH-LOGICAL-c291t-6565fdfc36a51f4db8a710ae645759655a35f0a28440d73dede99b727381872d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7177043$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7177043$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Chao Wang</creatorcontrib><creatorcontrib>Search, Christopher P.</creatorcontrib><title>A Nonlinear Microresonator Refractive Index Sensor</title><title>Journal of lightwave technology</title><addtitle>JLT</addtitle><description>We propose an ultrasensitive refractive index (RI) sensor based on the nonlinear index of refraction in a microring resonator coupled to waveguides in an add-drop configuration. The nonreciprocity caused by the difference between the nonlinear self-phase and cross-phase modulation leads to a bifurcation of the optical intensities for two counterpropagating modes. The magnitude of the splitting depends sensitively on the resonance frequency of the resonator, and hence, the effective index of refraction. This nonlinear system is up to two orders of magnitude more sensitive to RI changes than the theoretical sensitivity of a linear microresonator RI sensor. We discuss potential material implementations of the microresonator and the detection limit for these materials.</description><subject>Bifurcation</subject><subject>Indexes</subject><subject>integrated optics</subject><subject>Microcavities</subject><subject>Nonlinear optics</subject><subject>optical resonators</subject><subject>Refractive index</subject><subject>Sensitivity</subject><subject>sensors</subject><issn>0733-8724</issn><issn>1558-2213</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM9Lw0AQhRdRsFbvgpeA59SZ_ZFNjqVorUQFredlm52FlJqtu6nof29Ki6e5fO_N42PsGmGCCNXdU72ccEA14bKQCOqEjVCpMuccxSkbgRYiLzWX5-wipTUASlnqEePT7CV0m7YjG7PntokhUgqd7UPM3shH2_TtN2WLztFP9k5dCvGSnXm7SXR1vGP28XC_nD3m9et8MZvWecMr7PNCFco734jCKvTSrUqrESwVUmlVFUpZoTxYXkoJTgtHjqpqpbkWJQ5DnRiz20PvNoavHaXerMMudsNLgxq5kAJFNVBwoIbpKUXyZhvbTxt_DYLZmzGDGbM3Y45mhsjNIdIS0T-uUWuQQvwBDMpdKQ</recordid><startdate>20151015</startdate><enddate>20151015</enddate><creator>Chao Wang</creator><creator>Search, Christopher P.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20151015</creationdate><title>A Nonlinear Microresonator Refractive Index Sensor</title><author>Chao Wang ; Search, Christopher P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c291t-6565fdfc36a51f4db8a710ae645759655a35f0a28440d73dede99b727381872d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Bifurcation</topic><topic>Indexes</topic><topic>integrated optics</topic><topic>Microcavities</topic><topic>Nonlinear optics</topic><topic>optical resonators</topic><topic>Refractive index</topic><topic>Sensitivity</topic><topic>sensors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chao Wang</creatorcontrib><creatorcontrib>Search, Christopher P.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Xplore</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of lightwave technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Chao Wang</au><au>Search, Christopher P.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Nonlinear Microresonator Refractive Index Sensor</atitle><jtitle>Journal of lightwave technology</jtitle><stitle>JLT</stitle><date>2015-10-15</date><risdate>2015</risdate><volume>33</volume><issue>20</issue><spage>4360</spage><epage>4366</epage><pages>4360-4366</pages><issn>0733-8724</issn><eissn>1558-2213</eissn><coden>JLTEDG</coden><abstract>We propose an ultrasensitive refractive index (RI) sensor based on the nonlinear index of refraction in a microring resonator coupled to waveguides in an add-drop configuration. The nonreciprocity caused by the difference between the nonlinear self-phase and cross-phase modulation leads to a bifurcation of the optical intensities for two counterpropagating modes. The magnitude of the splitting depends sensitively on the resonance frequency of the resonator, and hence, the effective index of refraction. This nonlinear system is up to two orders of magnitude more sensitive to RI changes than the theoretical sensitivity of a linear microresonator RI sensor. We discuss potential material implementations of the microresonator and the detection limit for these materials.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JLT.2015.2464105</doi><tpages>7</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 0733-8724 |
ispartof | Journal of lightwave technology, 2015-10, Vol.33 (20), p.4360-4366 |
issn | 0733-8724 1558-2213 |
language | eng |
recordid | cdi_crossref_primary_10_1109_JLT_2015_2464105 |
source | IEEE Xplore |
subjects | Bifurcation Indexes integrated optics Microcavities Nonlinear optics optical resonators Refractive index Sensitivity sensors |
title | A Nonlinear Microresonator Refractive Index Sensor |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T00%3A27%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Nonlinear%20Microresonator%20Refractive%20Index%20Sensor&rft.jtitle=Journal%20of%20lightwave%20technology&rft.au=Chao%20Wang&rft.date=2015-10-15&rft.volume=33&rft.issue=20&rft.spage=4360&rft.epage=4366&rft.pages=4360-4366&rft.issn=0733-8724&rft.eissn=1558-2213&rft.coden=JLTEDG&rft_id=info:doi/10.1109/JLT.2015.2464105&rft_dat=%3Cproquest_RIE%3E3807007501%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1712343139&rft_id=info:pmid/&rft_ieee_id=7177043&rfr_iscdi=true |