A Gaussian Polar Model for Error Rates of Differential Phase Detection Impaired by Linear, Nonlinear, and Laser Phase Noises

A Gaussian Polar Model for Error Rates of Differential Phase Detection Impaired by Linear, Nonlinear, and Laser Phase Noises

We develop a simple analytic gaussian model, predicting BER performance of optical DPSK receivers with high accuracy in the wake of all three phase noise sources impairing differential phase detection: linear phase noise (ASE-induced), nonlinear phase noise (the Gordon-Mollenauer effect), and laser...

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Veröffentlicht in:Journal of lightwave technology 2009-11, Vol.27 (21), p.4650-4659
Hauptverfasser: Atzmon, Y., Nazarathy, M.
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Bit error rate
Bit error rate (BER)
Circuit properties
differential phase shift keying (DPSK)
Electric, optical and optoelectronic circuits
Electronics
Error analysis
Exact sciences and technology
Gaussian
gaussian noise
Information, signal and communications theory
Integrated optics. Optical fibers and wave guides
laser linewidth
Laser modes
Laser noise
Lasers
Mathematical analysis
Mathematical models
Modulation, demodulation
Noise
Nonlinear optics
Nonlinearity
Optical and optoelectronic circuits
optical fiber communication
Optical fiber communications
optical filtering
Optical receivers
Optical telecommunications
Performance analysis
Phase detection
Phase noise
Predictive models
Q-factor
self-phase modulation
Signal and communications theory
Telecommunications
Telecommunications and information theory
Three phase
Wakes
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Beschreibung
Zusammenfassung:We develop a simple analytic gaussian model, predicting BER performance of optical DPSK receivers with high accuracy in the wake of all three phase noise sources impairing differential phase detection: linear phase noise (ASE-induced), nonlinear phase noise (the Gordon-Mollenauer effect), and laser phase noise Brownian fluctuations. We validate our analytical Q-factor based formulas using known analytical cases and importance-sampling based Monte-Carlo simulations.
ISSN:0733-8724
1558-2213
DOI:10.1109/JLT.2009.2026461