Genetic algorithm-based characterization of the optical properties of flame-hydrolysis deposited silica waveguides

Genetic algorithms have been demonstrated to be a robust method for the calculation of the refractive-index profile of annealed germanium-doped flame-hydrolysis deposited (FHD) silica layers using measurements of the effective refractive indexes of the different modes of propagation. A nonuniform re...

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Veröffentlicht in:	Journal of lightwave technology 2004-12, Vol.22 (12), p.2801-2807
Hauptverfasser:	Garcia-Blanco, S., Alfaro-Cid, E., De La Rue, R.M., Aitchison, J.S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Annealing Applied sciences Circuit properties Density Deposition Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Flame-hydrolysis silica Genetic algorithms Genetics Integrated optics. Optical fibers and wave guides Mathematical analysis Nonuniform Optical and optoelectronic circuits Optical films Optical propagation Optical properties Optical refraction Optical variables control Optical waveguides Refractive index Robustness Rutherford backscattering spectroscopy (RBS) silica-on-silicon Silicon compounds Silicon dioxide Theoretical study. Circuits analysis and design waveguides
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Beschreibung
Zusammenfassung:	Genetic algorithms have been demonstrated to be a robust method for the calculation of the refractive-index profile of annealed germanium-doped flame-hydrolysis deposited (FHD) silica layers using measurements of the effective refractive indexes of the different modes of propagation. A nonuniform refractive-index profile in depth was obtained, which agrees well with the germanium concentration and density profiles measured for the films.
ISSN:	0733-8724 1558-2213
DOI:	10.1109/JLT.2004.834833