Hot-carrier memory effect in an Al/SiN/SiO 2 /Si MNOS diode due to electrical stress

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Veröffentlicht in:	IEEE electron device letters 1985-09, Vol.6 (9), p.448-449
Hauptverfasser:	Chang, C.Y., Tzeng, F.C., Chen, C.T., Mao, Y.W.
Format:	Artikel
Sprache:	eng
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doi_str_mv	10.1109/EDL.1985.26188
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title	Hot-carrier memory effect in an Al/SiN/SiO 2 /Si MNOS diode due to electrical stress
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