A Survey of Electromagnetic Radiation Based Hardware Assurance and Reliability Monitoring Methods in Integrated Circuits

Electromagnetic (EM) radiation-based hardware assurance methods are gaining prominence due to their non-invasive nature of monitoring the chip activity and the potential for continuous monitoring of integrated circuits (ICs) during operation. This paper presents an in-depth survey on the existing EM...

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Veröffentlicht in:	IEEE access 2024, Vol.12, p.150623-150638
Hauptverfasser:	Vutukuru, Manoj Yasaswi, Emmert, John M., Jha, Rashmi
Format:	Artikel
Sprache:	eng
Schlagworte:	Aging Assurance Circuit reliability Component reliability Counterfeit counterfeit detection electromagnetic emissions Electromagnetic measurements Electromagnetic radiation Electromigration Hardware hardware Trojan detection Integrated circuit interconnections Integrated circuit reliability Integrated circuits Monitoring on-chip EM sensor Reliability Security side-channel analysis Structural reliability Surveys System-on-chip Temperature measurement
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