Thin-film power-density meter for millimeter wavelengths

A quasi-optical power density meter for millimeter and submillimeter wavelengths has been developed. The device is a 2-cm/sup 2/ thin-film bismuth bolometer deposited on a mylar membrane. The resistance responsivity is 150 Omega /W, and the time constant is 1 min. The meter is calibrated at DC. The...

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Veröffentlicht in:	IEEE transactions on antennas and propagation 1991-03, Vol.39 (3), p.425-428
Hauptverfasser:	Lee, K.A., Guo, Y., Stimson, P.A., Potter, K.A., Chiao, J.-C., Rutledge, D.B.
Format:	Artikel
Sprache:	eng
Schlagworte:	Antenna measurements Applied sciences Bolometers Density measurement Electrical resistance measurement Electronics Exact sciences and technology Instrumentation And Photography Millimeter wave devices Millimeter wave measurements Power measurement Testing, measurement, noise and reliability Thin film circuits Transistors Wavelength measurement
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