Non-linear microwave response of HTS thin films: a comparison of intermodulation and conventional measurements
The non-linear microwave response of HTS thin films is a crucial issue for applications of the cuprates in future communications technologies. We report comparisons of nonlinear characterisation measurements made by two different techniques. The first involves two-tone intermodulation measurements,...
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| Veröffentlicht in: | IEEE transactions on applied superconductivity 2001-03, Vol.11 (1), p.3411-3414 |
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| container_title | IEEE transactions on applied superconductivity |
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| creator | Ling Hao Gallop, J. Purnell, A. Cohen, L. Thiess, S. |
| description | The non-linear microwave response of HTS thin films is a crucial issue for applications of the cuprates in future communications technologies. We report comparisons of nonlinear characterisation measurements made by two different techniques. The first involves two-tone intermodulation measurements, for which the HTS thin films are incorporated into a high Q resonant structure and two spectrally pure tones are injected within the resonator bandwidth. The second consists of a conventional high power steady-state parallel-plate resonator measurement of the non-linear response of Z/sub s/(H/sub rf/). Two very different HTS thin film samples are examined and simple physical models, involving grain boundary effects or film heating, are used to relate the intermodulation and power dependent impedance results to properties of the HTS thin film. |
| doi_str_mv | 10.1109/77.919795 |
| format | Article |
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We report comparisons of nonlinear characterisation measurements made by two different techniques. The first involves two-tone intermodulation measurements, for which the HTS thin films are incorporated into a high Q resonant structure and two spectrally pure tones are injected within the resonator bandwidth. The second consists of a conventional high power steady-state parallel-plate resonator measurement of the non-linear response of Z/sub s/(H/sub rf/). 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(IEEE) 2001</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c395t-d4b3e35e43ff530ac0043ea375ea16c9857321fda53e055d8ccf682e83ea32c83</citedby><cites>FETCH-LOGICAL-c395t-d4b3e35e43ff530ac0043ea375ea16c9857321fda53e055d8ccf682e83ea32c83</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/919795$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,792,23909,23910,25118,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/919795$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=961635$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Ling Hao</creatorcontrib><creatorcontrib>Gallop, J.</creatorcontrib><creatorcontrib>Purnell, A.</creatorcontrib><creatorcontrib>Cohen, L.</creatorcontrib><creatorcontrib>Thiess, S.</creatorcontrib><title>Non-linear microwave response of HTS thin films: a comparison of intermodulation and conventional measurements</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>The non-linear microwave response of HTS thin films is a crucial issue for applications of the cuprates in future communications technologies. We report comparisons of nonlinear characterisation measurements made by two different techniques. The first involves two-tone intermodulation measurements, for which the HTS thin films are incorporated into a high Q resonant structure and two spectrally pure tones are injected within the resonator bandwidth. The second consists of a conventional high power steady-state parallel-plate resonator measurement of the non-linear response of Z/sub s/(H/sub rf/). Two very different HTS thin film samples are examined and simple physical models, involving grain boundary effects or film heating, are used to relate the intermodulation and power dependent impedance results to properties of the HTS thin film.</description><subject>Bandwidth</subject><subject>BOUNDARIES</subject><subject>Communications technology</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>COPPER OXIDE</subject><subject>Electromagnetic heating</subject><subject>Exact sciences and technology</subject><subject>GRAIN BOUNDARIES</subject><subject>High temperature superconductors</subject><subject>High-tc films</subject><subject>Intermodulation</subject><subject>MEASUREMENT</subject><subject>MICROWAVES</subject><subject>Nonlinearity</subject><subject>Physics</subject><subject>Power measurement</subject><subject>Q measurement</subject><subject>Resonance</subject><subject>Resonators</subject><subject>SPECTRA</subject><subject>Steady-state</subject><subject>Superconducting films and low-dimensional structures</subject><subject>SUPERCONDUCTIVITY</subject><subject>THIN FILMS</subject><subject>Transistors</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqN0U1rFjEQAOBFFKytB6-eQguVHrbmc5N4k6K2UPRgPS9jdoIpu8nbZLfFf98sWxR6KD0lmXkyAzNN847RU8ao_aj1qWVWW_Wi2WNKmZYrpl7WO1WsNZyL182bUq4pZdJItdfE7ym2Y4gImUzB5XQHt0gyll2KBUny5PzqJ5n_hEh8GKfyiQBxadpBDiXFNR_ijHlKwzLCHGoI4lBFvMW4PmEkE0JZMk41UA6aVx7Ggm8fzv3m19cvV2fn7eWPbxdnny9bJ6ya20H-FigUSuG9EhQcpVIgCK0QWOesUVpw5gdQAqlSg3HOd4ajWRF3Ruw3H7a6u5xuFixzP4XicBwhYlpKb5nsJGOaV3n8pORGci3oM2BnhOF27X34CF6nJddJ1LZWaKo1kxWdbKiOvJSMvt_lMEH-2zPar5vste63TVZ79FAQioPRZ4gulH8fbMc6sar3mwqI-D-5lbgHbwylpQ</recordid><startdate>20010301</startdate><enddate>20010301</enddate><creator>Ling Hao</creator><creator>Gallop, J.</creator><creator>Purnell, A.</creator><creator>Cohen, L.</creator><creator>Thiess, S.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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We report comparisons of nonlinear characterisation measurements made by two different techniques. The first involves two-tone intermodulation measurements, for which the HTS thin films are incorporated into a high Q resonant structure and two spectrally pure tones are injected within the resonator bandwidth. The second consists of a conventional high power steady-state parallel-plate resonator measurement of the non-linear response of Z/sub s/(H/sub rf/). Two very different HTS thin film samples are examined and simple physical models, involving grain boundary effects or film heating, are used to relate the intermodulation and power dependent impedance results to properties of the HTS thin film.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/77.919795</doi><tpages>4</tpages></addata></record> |
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| subjects | Bandwidth BOUNDARIES Communications technology Condensed matter: electronic structure, electrical, magnetic, and optical properties COPPER OXIDE Electromagnetic heating Exact sciences and technology GRAIN BOUNDARIES High temperature superconductors High-tc films Intermodulation MEASUREMENT MICROWAVES Nonlinearity Physics Power measurement Q measurement Resonance Resonators SPECTRA Steady-state Superconducting films and low-dimensional structures SUPERCONDUCTIVITY THIN FILMS Transistors |
| title | Non-linear microwave response of HTS thin films: a comparison of intermodulation and conventional measurements |
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