Local characterization of Y-Ba-Cu-O thin films

A high-resolution spatially resolved study of electrical inhomogeneities in high-T/sub c/ thin films by Laser Scanning Microscopy has been carried out. A laser beam was focused onto a submicrometer spot on the surface of the thin film microbridge resulting in an increase in its local temperature. Bo...

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Veröffentlicht in:	IEEE transactions on applied superconductivity 2001-03, Vol.11 (1), p.3226-3229
Hauptverfasser:	Shadrin, P.M., Korolev, K.A., Hughes, R.A., Nam, J.K., Preston, J.S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Beams (radiation) BOUNDARIES ELECTRICAL CONDUCTIVITY Focusing Grains Laser beams MICRO ORGANISMS Microorganisms Microscopy Orientation Position measurement Spatial resolution Surface emitting lasers Temperature THIN FILMS Transistors TWIN BOUNDARIES VOLTAGE Yttrium barium copper oxide YTTRIUM OXIDE
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