Trade-offs in cycle time management: hot lots
In manufacturing, higher priority is given to hot lots to reduce their cycle time. The impact of hot lots on the cycle time of other lots in the system is studied here. Object-oriented simulation experiments of a wafer fabrication model were run to investigate the above impact. The simulation result...
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on semiconductor manufacturing 1992-05, Vol.5 (2), p.101-106 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 106 |
|---|---|
| container_issue | 2 |
| container_start_page | 101 |
| container_title | IEEE transactions on semiconductor manufacturing |
| container_volume | 5 |
| creator | Ehteshami, B. Petrakian, R.G. Shabe, P.M. |
| description | In manufacturing, higher priority is given to hot lots to reduce their cycle time. The impact of hot lots on the cycle time of other lots in the system is studied here. Object-oriented simulation experiments of a wafer fabrication model were run to investigate the above impact. The simulation results showed that as the proportion of hot lots in the work-in progress increases, both the average cycle time and the corresponding standard deviation for all other lots increase dramatically. Thus, it is argued that hot lots induce either a deterioration in service level for regular lots or an increase in inventory costs. Sound management accounting would require that these costs be estimated, possibly using an approach outlined here.< > |
| doi_str_mv | 10.1109/66.136270 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_66_136270</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>136270</ieee_id><sourcerecordid>29763277</sourcerecordid><originalsourceid>FETCH-LOGICAL-c403t-d326254b0ffeafaa721d21037d89c79f47c4d096e973774f8c15f5ead558cf353</originalsourceid><addsrcrecordid>eNqF0DtLBDEQwPEgCp6nha3VFiJY5Jy8N3Zy-IIDm7MOMTvRlX2cyV5x396VPbS0muY3f4Yh5JzBgjGwN1ovmNDcwAGZMaVKyoVUh2QGpZVUKzDH5CTnTwAmpTUzQtfJV0j7GHNRd0XYhQaLoW6xaH3n37HFbrgtPvqhaPohn5Kj6JuMZ_s5J68P9-vlE129PD4v71Y0SBADrQTXXMk3iBF99N5wVnEGwlSlDcZGaYKswGq0RhgjYxmYigp9NR4colBiTq6m7ib1X1vMg2vrHLBpfIf9NjtujRbcmP9hqUtmLYzweoIh9TknjG6T6tannWPgfj7ntHbT50Z7uY_6HHwTk-9CnX8XlAIOSo_sYmI1Iv7lpsY3k5NzKA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>28681990</pqid></control><display><type>article</type><title>Trade-offs in cycle time management: hot lots</title><source>IEEE Electronic Library (IEL)</source><creator>Ehteshami, B. ; Petrakian, R.G. ; Shabe, P.M.</creator><creatorcontrib>Ehteshami, B. ; Petrakian, R.G. ; Shabe, P.M.</creatorcontrib><description>In manufacturing, higher priority is given to hot lots to reduce their cycle time. The impact of hot lots on the cycle time of other lots in the system is studied here. Object-oriented simulation experiments of a wafer fabrication model were run to investigate the above impact. The simulation results showed that as the proportion of hot lots in the work-in progress increases, both the average cycle time and the corresponding standard deviation for all other lots increase dramatically. Thus, it is argued that hot lots induce either a deterioration in service level for regular lots or an increase in inventory costs. Sound management accounting would require that these costs be estimated, possibly using an approach outlined here.< ></description><identifier>ISSN: 0894-6507</identifier><identifier>EISSN: 1558-2345</identifier><identifier>DOI: 10.1109/66.136270</identifier><identifier>CODEN: ITSMED</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Batch production systems ; Costs ; Design. Technologies. Operation analysis. Testing ; Electronics ; Exact sciences and technology ; Fabrication ; Integrated circuits ; Management accounting ; Manufacturing ; Object oriented modeling ; Production facilities ; Semiconductor device modeling ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Shape ; Workstations</subject><ispartof>IEEE transactions on semiconductor manufacturing, 1992-05, Vol.5 (2), p.101-106</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c403t-d326254b0ffeafaa721d21037d89c79f47c4d096e973774f8c15f5ead558cf353</citedby><cites>FETCH-LOGICAL-c403t-d326254b0ffeafaa721d21037d89c79f47c4d096e973774f8c15f5ead558cf353</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/136270$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/136270$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5502056$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Ehteshami, B.</creatorcontrib><creatorcontrib>Petrakian, R.G.</creatorcontrib><creatorcontrib>Shabe, P.M.</creatorcontrib><title>Trade-offs in cycle time management: hot lots</title><title>IEEE transactions on semiconductor manufacturing</title><addtitle>TSM</addtitle><description>In manufacturing, higher priority is given to hot lots to reduce their cycle time. The impact of hot lots on the cycle time of other lots in the system is studied here. Object-oriented simulation experiments of a wafer fabrication model were run to investigate the above impact. The simulation results showed that as the proportion of hot lots in the work-in progress increases, both the average cycle time and the corresponding standard deviation for all other lots increase dramatically. Thus, it is argued that hot lots induce either a deterioration in service level for regular lots or an increase in inventory costs. Sound management accounting would require that these costs be estimated, possibly using an approach outlined here.< ></description><subject>Applied sciences</subject><subject>Batch production systems</subject><subject>Costs</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fabrication</subject><subject>Integrated circuits</subject><subject>Management accounting</subject><subject>Manufacturing</subject><subject>Object oriented modeling</subject><subject>Production facilities</subject><subject>Semiconductor device modeling</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Shape</subject><subject>Workstations</subject><issn>0894-6507</issn><issn>1558-2345</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1992</creationdate><recordtype>article</recordtype><recordid>eNqF0DtLBDEQwPEgCp6nha3VFiJY5Jy8N3Zy-IIDm7MOMTvRlX2cyV5x396VPbS0muY3f4Yh5JzBgjGwN1ovmNDcwAGZMaVKyoVUh2QGpZVUKzDH5CTnTwAmpTUzQtfJV0j7GHNRd0XYhQaLoW6xaH3n37HFbrgtPvqhaPohn5Kj6JuMZ_s5J68P9-vlE129PD4v71Y0SBADrQTXXMk3iBF99N5wVnEGwlSlDcZGaYKswGq0RhgjYxmYigp9NR4colBiTq6m7ib1X1vMg2vrHLBpfIf9NjtujRbcmP9hqUtmLYzweoIh9TknjG6T6tannWPgfj7ntHbT50Z7uY_6HHwTk-9CnX8XlAIOSo_sYmI1Iv7lpsY3k5NzKA</recordid><startdate>19920501</startdate><enddate>19920501</enddate><creator>Ehteshami, B.</creator><creator>Petrakian, R.G.</creator><creator>Shabe, P.M.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>7TB</scope><scope>FR3</scope></search><sort><creationdate>19920501</creationdate><title>Trade-offs in cycle time management: hot lots</title><author>Ehteshami, B. ; Petrakian, R.G. ; Shabe, P.M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c403t-d326254b0ffeafaa721d21037d89c79f47c4d096e973774f8c15f5ead558cf353</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1992</creationdate><topic>Applied sciences</topic><topic>Batch production systems</topic><topic>Costs</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fabrication</topic><topic>Integrated circuits</topic><topic>Management accounting</topic><topic>Manufacturing</topic><topic>Object oriented modeling</topic><topic>Production facilities</topic><topic>Semiconductor device modeling</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Shape</topic><topic>Workstations</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ehteshami, B.</creatorcontrib><creatorcontrib>Petrakian, R.G.</creatorcontrib><creatorcontrib>Shabe, P.M.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on semiconductor manufacturing</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ehteshami, B.</au><au>Petrakian, R.G.</au><au>Shabe, P.M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Trade-offs in cycle time management: hot lots</atitle><jtitle>IEEE transactions on semiconductor manufacturing</jtitle><stitle>TSM</stitle><date>1992-05-01</date><risdate>1992</risdate><volume>5</volume><issue>2</issue><spage>101</spage><epage>106</epage><pages>101-106</pages><issn>0894-6507</issn><eissn>1558-2345</eissn><coden>ITSMED</coden><abstract>In manufacturing, higher priority is given to hot lots to reduce their cycle time. The impact of hot lots on the cycle time of other lots in the system is studied here. Object-oriented simulation experiments of a wafer fabrication model were run to investigate the above impact. The simulation results showed that as the proportion of hot lots in the work-in progress increases, both the average cycle time and the corresponding standard deviation for all other lots increase dramatically. Thus, it is argued that hot lots induce either a deterioration in service level for regular lots or an increase in inventory costs. Sound management accounting would require that these costs be estimated, possibly using an approach outlined here.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/66.136270</doi><tpages>6</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0894-6507 |
| ispartof | IEEE transactions on semiconductor manufacturing, 1992-05, Vol.5 (2), p.101-106 |
| issn | 0894-6507 1558-2345 |
| language | eng |
| recordid | cdi_crossref_primary_10_1109_66_136270 |
| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Batch production systems Costs Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Fabrication Integrated circuits Management accounting Manufacturing Object oriented modeling Production facilities Semiconductor device modeling Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Shape Workstations |
| title | Trade-offs in cycle time management: hot lots |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T00%3A51%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Trade-offs%20in%20cycle%20time%20management:%20hot%20lots&rft.jtitle=IEEE%20transactions%20on%20semiconductor%20manufacturing&rft.au=Ehteshami,%20B.&rft.date=1992-05-01&rft.volume=5&rft.issue=2&rft.spage=101&rft.epage=106&rft.pages=101-106&rft.issn=0894-6507&rft.eissn=1558-2345&rft.coden=ITSMED&rft_id=info:doi/10.1109/66.136270&rft_dat=%3Cproquest_RIE%3E29763277%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=28681990&rft_id=info:pmid/&rft_ieee_id=136270&rfr_iscdi=true |