Growth and decay of the electrooptic effect in thermally poled B/Ge codoped fiber
Using an in situ technique for measuring the induced electrooptic effect during poling, we have studied the growth and decay characteristics of thermally poled twin hole B/Ge codoped fiber devices. The decay characteristic measured at elevated temperatures were best fitted with a stretched exponenti...
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| Veröffentlicht in: | Journal of lightwave technology 1999-06, Vol.17 (6), p.1037-1041, Article 1037 |
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| container_end_page | 1041 |
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| container_issue | 6 |
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| container_title | Journal of lightwave technology |
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| creator | Janos, M. Wei Xu Danny Wong Inglis, H. Fleming, S. |
| description | Using an in situ technique for measuring the induced electrooptic effect during poling, we have studied the growth and decay characteristics of thermally poled twin hole B/Ge codoped fiber devices. The decay characteristic measured at elevated temperatures were best fitted with a stretched exponential function, indicating a distribution of relaxation times is present in this material. Using the Arrhenius relation, we calculate an activation energy for the stability of the electrooptic effect with this material and poling geometry in the range from 25 to 28 kJ/mol (0.28-0.31 eV), corresponding to a lifetime at 298 K of approximately 45 days. |
| doi_str_mv | 10.1109/50.769305 |
| format | Article |
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The decay characteristic measured at elevated temperatures were best fitted with a stretched exponential function, indicating a distribution of relaxation times is present in this material. Using the Arrhenius relation, we calculate an activation energy for the stability of the electrooptic effect with this material and poling geometry in the range from 25 to 28 kJ/mol (0.28-0.31 eV), corresponding to a lifetime at 298 K of approximately 45 days.</description><identifier>ISSN: 0733-8724</identifier><identifier>EISSN: 1558-2213</identifier><identifier>DOI: 10.1109/50.769305</identifier><identifier>CODEN: JLTEDG</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Australia ; Circuit properties ; Decay ; Deoxidizing ; Devices ; Electric, optical and optoelectronic circuits ; Electrodes ; Electronics ; Electrooptic effects ; Electrooptics ; Electrostatic measurements ; Exact sciences and technology ; Fibers ; Geometry ; Germanium ; Integrated optics. 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The decay characteristic measured at elevated temperatures were best fitted with a stretched exponential function, indicating a distribution of relaxation times is present in this material. Using the Arrhenius relation, we calculate an activation energy for the stability of the electrooptic effect with this material and poling geometry in the range from 25 to 28 kJ/mol (0.28-0.31 eV), corresponding to a lifetime at 298 K of approximately 45 days.</description><subject>Applied sciences</subject><subject>Australia</subject><subject>Circuit properties</subject><subject>Decay</subject><subject>Deoxidizing</subject><subject>Devices</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electrodes</subject><subject>Electronics</subject><subject>Electrooptic effects</subject><subject>Electrooptics</subject><subject>Electrostatic measurements</subject><subject>Exact sciences and technology</subject><subject>Fibers</subject><subject>Geometry</subject><subject>Germanium</subject><subject>Integrated optics. Optical fibers and wave guides</subject><subject>Mathematical analysis</subject><subject>Optical and optoelectronic circuits</subject><subject>Optical fiber devices</subject><subject>Optical fiber sensors</subject><subject>Optical fibers</subject><subject>Photonics</subject><subject>Stability</subject><subject>Testing</subject><issn>0733-8724</issn><issn>1558-2213</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqNkc9LHDEUx0Op0K320GtPOZSih3Hzc5I5VtFVWBDBnodM5gVTspNpEpH9743sYkGK9fR4fD_v8x48hL5Sckop6ZaSnKq240R-QAsqpW4Yo_wjWhDFeaMVE5_Q55x_E0KF0GqBblcpPpZ7bKYRj2DNFkeHyz1gCGBLinEu3mJwrnbYT89R2pgQtniOAUZ8tlwBtnGMc22cHyAdoQNnQoYv-3qIfl1e3J1fNeub1fX5z3VjBeGlMUoS0zI7ttII6kSnOiJGMg6uBWeoc3pkbJBC1kQN7SAHRogkFVNccS34Ifqx884p_nmAXPqNzxZCMBPEh9wzzSlVddd_wbaTQjFVweM3QdoqylQ96R0oYUzrTsuuoic71KaYcwLXz8lvTNpWqH_-WS9Jv_tZZb_vtSZbE1wyk_X574CWvBOsYstXSuuLKT5OJRkf_in-tpvwAPDi24dPBD2qjQ</recordid><startdate>19990601</startdate><enddate>19990601</enddate><creator>Janos, M.</creator><creator>Wei Xu</creator><creator>Danny Wong</creator><creator>Inglis, H.</creator><creator>Fleming, S.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19990601</creationdate><title>Growth and decay of the electrooptic effect in thermally poled B/Ge codoped fiber</title><author>Janos, M. ; Wei Xu ; Danny Wong ; Inglis, H. ; Fleming, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c403t-a750a62cd65a41f497904d0dbf6efa1ff8d22b5454977b6b5b200509797373843</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1999</creationdate><topic>Applied sciences</topic><topic>Australia</topic><topic>Circuit properties</topic><topic>Decay</topic><topic>Deoxidizing</topic><topic>Devices</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electrodes</topic><topic>Electronics</topic><topic>Electrooptic effects</topic><topic>Electrooptics</topic><topic>Electrostatic measurements</topic><topic>Exact sciences and technology</topic><topic>Fibers</topic><topic>Geometry</topic><topic>Germanium</topic><topic>Integrated optics. Optical fibers and wave guides</topic><topic>Mathematical analysis</topic><topic>Optical and optoelectronic circuits</topic><topic>Optical fiber devices</topic><topic>Optical fiber sensors</topic><topic>Optical fibers</topic><topic>Photonics</topic><topic>Stability</topic><topic>Testing</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Janos, M.</creatorcontrib><creatorcontrib>Wei Xu</creatorcontrib><creatorcontrib>Danny Wong</creatorcontrib><creatorcontrib>Inglis, H.</creatorcontrib><creatorcontrib>Fleming, S.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of lightwave technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Janos, M.</au><au>Wei Xu</au><au>Danny Wong</au><au>Inglis, H.</au><au>Fleming, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Growth and decay of the electrooptic effect in thermally poled B/Ge codoped fiber</atitle><jtitle>Journal of lightwave technology</jtitle><stitle>JLT</stitle><date>1999-06-01</date><risdate>1999</risdate><volume>17</volume><issue>6</issue><spage>1037</spage><epage>1041</epage><pages>1037-1041</pages><artnum>1037</artnum><issn>0733-8724</issn><eissn>1558-2213</eissn><coden>JLTEDG</coden><abstract>Using an in situ technique for measuring the induced electrooptic effect during poling, we have studied the growth and decay characteristics of thermally poled twin hole B/Ge codoped fiber devices. The decay characteristic measured at elevated temperatures were best fitted with a stretched exponential function, indicating a distribution of relaxation times is present in this material. Using the Arrhenius relation, we calculate an activation energy for the stability of the electrooptic effect with this material and poling geometry in the range from 25 to 28 kJ/mol (0.28-0.31 eV), corresponding to a lifetime at 298 K of approximately 45 days.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/50.769305</doi><tpages>5</tpages></addata></record> |
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| identifier | ISSN: 0733-8724 |
| ispartof | Journal of lightwave technology, 1999-06, Vol.17 (6), p.1037-1041, Article 1037 |
| issn | 0733-8724 1558-2213 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Australia Circuit properties Decay Deoxidizing Devices Electric, optical and optoelectronic circuits Electrodes Electronics Electrooptic effects Electrooptics Electrostatic measurements Exact sciences and technology Fibers Geometry Germanium Integrated optics. Optical fibers and wave guides Mathematical analysis Optical and optoelectronic circuits Optical fiber devices Optical fiber sensors Optical fibers Photonics Stability Testing |
| title | Growth and decay of the electrooptic effect in thermally poled B/Ge codoped fiber |
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