Automated test case generation for programs specified by relational algebra queries

Black-box software testing requires test cases to be generated from specifications alone. However, it is impossible to automate the process completely for arbitrary specifications. Specifications are thus restricted to being written entirely in terms of relational algebra expressions. An automated t...

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Veröffentlicht in:IEEE transactions on software engineering 1990-03, Vol.16 (3), p.316-324
Hauptverfasser: Tsai, W.T., Volovik, D., Keefe, T.F.
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container_title IEEE transactions on software engineering
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creator Tsai, W.T.
Volovik, D.
Keefe, T.F.
description Black-box software testing requires test cases to be generated from specifications alone. However, it is impossible to automate the process completely for arbitrary specifications. Specifications are thus restricted to being written entirely in terms of relational algebra expressions. An automated test case generation method is developed for such specifications.< >
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_32_48939</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>48939</ieee_id><sourcerecordid>28522458</sourcerecordid><originalsourceid>FETCH-LOGICAL-c361t-5763a6c8549dfd061784885dbe3d6ed89c809d3d786c970eb4d94de85de6d48b3</originalsourceid><addsrcrecordid>eNqF0U1LwzAYB_AgCs4pePUWRMRLZ9I0aXIcwzcYeFDPIU2ejox2nUl72Lc3rmMHL56eQ37887wgdE3JjFKiHlk-K6Ri6gRNaCoZ4zk5RRNClMw4l-ocXcS4JoTwsuQT9DEf-q41PTjcQ-yxNRHwCjYQTO-7Da67gLehWwXTRhy3YH3tk612OECzJ6bBpllBFQz-HiB4iJforDZNhKtDnaKv56fPxWu2fH95W8yXmWWC9hkvBTPCSl4oVzsiaCkLKbmrgDkBTioriXLMlVJYVRKoCqcKB0mAcIWs2BTdj7mpwfR17HXro4WmMRvohqhzyfO84PJ_yIlgMucJ3v6B624IacSoqUrbY5yJhB5GZEMXY4Bab4NvTdhpSvTvDTTL9f4Gid4d8ky0pqmD2Vgfj14oSoQgid2MzAPA8XWM-AEWDo2O</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>195583536</pqid></control><display><type>article</type><title>Automated test case generation for programs specified by relational algebra queries</title><source>IEEE Electronic Library (IEL)</source><creator>Tsai, W.T. ; Volovik, D. ; Keefe, T.F.</creator><creatorcontrib>Tsai, W.T. ; Volovik, D. ; Keefe, T.F.</creatorcontrib><description>Black-box software testing requires test cases to be generated from specifications alone. However, it is impossible to automate the process completely for arbitrary specifications. Specifications are thus restricted to being written entirely in terms of relational algebra expressions. An automated test case generation method is developed for such specifications.&lt; &gt;</description><identifier>ISSN: 0098-5589</identifier><identifier>EISSN: 1939-3520</identifier><identifier>DOI: 10.1109/32.48939</identifier><identifier>CODEN: IESEDJ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Algebra ; Applied sciences ; Automatic generation control ; Automatic testing ; Automation ; Boolean ; Computer aided software engineering ; Computer programming ; Computer science ; Computer science; control theory; systems ; Data processing ; Exact sciences and technology ; Information retrieval ; Mathematical models ; Process design ; Programming ; Queries ; Software ; Software development ; Software engineering ; Software testing ; System testing ; Systems development ; Testing</subject><ispartof>IEEE transactions on software engineering, 1990-03, Vol.16 (3), p.316-324</ispartof><rights>1990 INIST-CNRS</rights><rights>Copyright Institute of Electrical and Electronics Engineers, Inc. (IEEE) Mar 1990</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c361t-5763a6c8549dfd061784885dbe3d6ed89c809d3d786c970eb4d94de85de6d48b3</citedby><cites>FETCH-LOGICAL-c361t-5763a6c8549dfd061784885dbe3d6ed89c809d3d786c970eb4d94de85de6d48b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/48939$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/48939$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=6910660$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Tsai, W.T.</creatorcontrib><creatorcontrib>Volovik, D.</creatorcontrib><creatorcontrib>Keefe, T.F.</creatorcontrib><title>Automated test case generation for programs specified by relational algebra queries</title><title>IEEE transactions on software engineering</title><addtitle>TSE</addtitle><description>Black-box software testing requires test cases to be generated from specifications alone. However, it is impossible to automate the process completely for arbitrary specifications. Specifications are thus restricted to being written entirely in terms of relational algebra expressions. An automated test case generation method is developed for such specifications.&lt; &gt;</description><subject>Algebra</subject><subject>Applied sciences</subject><subject>Automatic generation control</subject><subject>Automatic testing</subject><subject>Automation</subject><subject>Boolean</subject><subject>Computer aided software engineering</subject><subject>Computer programming</subject><subject>Computer science</subject><subject>Computer science; control theory; systems</subject><subject>Data processing</subject><subject>Exact sciences and technology</subject><subject>Information retrieval</subject><subject>Mathematical models</subject><subject>Process design</subject><subject>Programming</subject><subject>Queries</subject><subject>Software</subject><subject>Software development</subject><subject>Software engineering</subject><subject>Software testing</subject><subject>System testing</subject><subject>Systems development</subject><subject>Testing</subject><issn>0098-5589</issn><issn>1939-3520</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1990</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNqF0U1LwzAYB_AgCs4pePUWRMRLZ9I0aXIcwzcYeFDPIU2ejox2nUl72Lc3rmMHL56eQ37887wgdE3JjFKiHlk-K6Ri6gRNaCoZ4zk5RRNClMw4l-ocXcS4JoTwsuQT9DEf-q41PTjcQ-yxNRHwCjYQTO-7Da67gLehWwXTRhy3YH3tk612OECzJ6bBpllBFQz-HiB4iJforDZNhKtDnaKv56fPxWu2fH95W8yXmWWC9hkvBTPCSl4oVzsiaCkLKbmrgDkBTioriXLMlVJYVRKoCqcKB0mAcIWs2BTdj7mpwfR17HXro4WmMRvohqhzyfO84PJ_yIlgMucJ3v6B624IacSoqUrbY5yJhB5GZEMXY4Bab4NvTdhpSvTvDTTL9f4Gid4d8ky0pqmD2Vgfj14oSoQgid2MzAPA8XWM-AEWDo2O</recordid><startdate>19900301</startdate><enddate>19900301</enddate><creator>Tsai, W.T.</creator><creator>Volovik, D.</creator><creator>Keefe, T.F.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>IEEE Computer Society</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7WY</scope><scope>7WZ</scope><scope>7X7</scope><scope>7XB</scope><scope>87Z</scope><scope>88E</scope><scope>88F</scope><scope>88I</scope><scope>88K</scope><scope>8AL</scope><scope>8FE</scope><scope>8FG</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>8FL</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FRNLG</scope><scope>FYUFA</scope><scope>F~G</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K60</scope><scope>K6~</scope><scope>K7-</scope><scope>K9.</scope><scope>L.-</scope><scope>L6V</scope><scope>M0C</scope><scope>M0N</scope><scope>M0S</scope><scope>M1P</scope><scope>M1Q</scope><scope>M2O</scope><scope>M2P</scope><scope>M2T</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>7SC</scope><scope>8FD</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>19900301</creationdate><title>Automated test case generation for programs specified by relational algebra queries</title><author>Tsai, W.T. ; Volovik, D. ; Keefe, T.F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c361t-5763a6c8549dfd061784885dbe3d6ed89c809d3d786c970eb4d94de85de6d48b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1990</creationdate><topic>Algebra</topic><topic>Applied sciences</topic><topic>Automatic generation control</topic><topic>Automatic testing</topic><topic>Automation</topic><topic>Boolean</topic><topic>Computer aided software engineering</topic><topic>Computer programming</topic><topic>Computer science</topic><topic>Computer science; control theory; systems</topic><topic>Data processing</topic><topic>Exact sciences and technology</topic><topic>Information retrieval</topic><topic>Mathematical models</topic><topic>Process design</topic><topic>Programming</topic><topic>Queries</topic><topic>Software</topic><topic>Software development</topic><topic>Software engineering</topic><topic>Software testing</topic><topic>System testing</topic><topic>Systems development</topic><topic>Testing</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tsai, W.T.</creatorcontrib><creatorcontrib>Volovik, D.</creatorcontrib><creatorcontrib>Keefe, T.F.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Access via ABI/INFORM (ProQuest)</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>Health &amp; Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Global (Alumni Edition)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Military Database (Alumni Edition)</collection><collection>Science Database (Alumni Edition)</collection><collection>Telecommunications (Alumni Edition)</collection><collection>Computing Database (Alumni Edition)</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Business Premium Collection (Alumni)</collection><collection>Health Research Premium Collection</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>Computer Science Database</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ProQuest Engineering Collection</collection><collection>ABI/INFORM Global</collection><collection>Computing Database</collection><collection>Health &amp; Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Military Database</collection><collection>Research Library</collection><collection>Science Database</collection><collection>Telecommunications Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest One Business</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>Computer and Information Systems Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>IEEE transactions on software engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tsai, W.T.</au><au>Volovik, D.</au><au>Keefe, T.F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Automated test case generation for programs specified by relational algebra queries</atitle><jtitle>IEEE transactions on software engineering</jtitle><stitle>TSE</stitle><date>1990-03-01</date><risdate>1990</risdate><volume>16</volume><issue>3</issue><spage>316</spage><epage>324</epage><pages>316-324</pages><issn>0098-5589</issn><eissn>1939-3520</eissn><coden>IESEDJ</coden><abstract>Black-box software testing requires test cases to be generated from specifications alone. However, it is impossible to automate the process completely for arbitrary specifications. Specifications are thus restricted to being written entirely in terms of relational algebra expressions. An automated test case generation method is developed for such specifications.&lt; &gt;</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/32.48939</doi><tpages>9</tpages></addata></record>
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identifier ISSN: 0098-5589
ispartof IEEE transactions on software engineering, 1990-03, Vol.16 (3), p.316-324
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1939-3520
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recordid cdi_crossref_primary_10_1109_32_48939
source IEEE Electronic Library (IEL)
subjects Algebra
Applied sciences
Automatic generation control
Automatic testing
Automation
Boolean
Computer aided software engineering
Computer programming
Computer science
Computer science
control theory
systems
Data processing
Exact sciences and technology
Information retrieval
Mathematical models
Process design
Programming
Queries
Software
Software development
Software engineering
Software testing
System testing
Systems development
Testing
title Automated test case generation for programs specified by relational algebra queries
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T09%3A53%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Automated%20test%20case%20generation%20for%20programs%20specified%20by%20relational%20algebra%20queries&rft.jtitle=IEEE%20transactions%20on%20software%20engineering&rft.au=Tsai,%20W.T.&rft.date=1990-03-01&rft.volume=16&rft.issue=3&rft.spage=316&rft.epage=324&rft.pages=316-324&rft.issn=0098-5589&rft.eissn=1939-3520&rft.coden=IESEDJ&rft_id=info:doi/10.1109/32.48939&rft_dat=%3Cproquest_RIE%3E28522458%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=195583536&rft_id=info:pmid/&rft_ieee_id=48939&rfr_iscdi=true