An empirical model of enhancement-induced defect activity in software

This study exploits the relationship between functional enhancement (FE) activity and defect distribution to produce a model for predicting FE induced defect activity. We achieve this in 2 steps: (1) apply canonical correlation analysis to model the relationship between a set of FE activity indicato...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on reliability 1995-12, Vol.44 (4), p.672-676
Hauptverfasser: Lanning, D.L., Khoshgoftaar, T.M.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!